The RAM II is the first dual channel FT-Raman module that can be coupled to the VERTEX FT-IR research spectrometer series. Utilizing the input and output port of a VERTEX 70, VERTEX 80 or the related vacuum versions VERTEX 70v und VERTERX 80v the RAM II provides the ideal FT-Raman measurement device. The intuitive, easy-to-use OPUS software controls all data collection and manipulation functions for the system and allows automated switching between FT-Raman and FT-IR measurements.
The FT-Raman module RAM II is the culmination of Bruker’s long term experience in FT-Raman spectroscopy with advanced 24-bit detector electronics and high quality optics. The coupling of the RAM II module with the Bruker VERTEX FT-IR research spectrometer provides superb stability and throughput required for demanding emission experiments which is the case for FT-Raman spectroscopy.
For ultimate flexibility, the RAM II can accommodate a second laser and detection system, automated polarization accessory, and two-fiber optic coupling ports. Additional features include switching to 90° scattering geometry, and defocusing optics which are necessary for colored samples to avoid overheating by the laser beam. A motorized sample stage for sample position optimization, and a white light source to correct the spectra for instrument responses are included in the standard configuration of the RAM II. Additional sampling accessories, such as automatic sample changers, low and high temperature stages are optional. The FT-Raman microscope RamanScopeIII and the unique feature of the combination possibility with the Bruker dispersive Raman microscope Senterra expands Raman spectroscopy to samples in the µm size range. Even a dedicated configuration is available to use the RAM II module for photo luminescence (PL) application e.g. in the area of semiconductor quality control and material research.
50 cm-1 (Stokes shift). In combination with e.g. the VERTEX 70 FT-IR spectrometer the RAM II module provides highest sensitivity and stability. The approved Nd:YAG laser source (1064 nm) for sample excitation is fully software controlled. The system can be equipped with either or both room-temperature InGaAs detector and a proprietary high-sensitivity Ge detector. High throughput optics and Bruker’s unique liquid nitrogen cooled Germanium diode detector offers ultra-low signal detection with minimal noise assuring excellent sensitivity. The long hold time of the refrigerant provides hassle free operation for an entire week.