Mesuro has launched a new test solution that provides the industry substantial benefits in approaches to device characterization test. The new offering utilizes an ‘envelope load pull technique’, along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide extremely rapid test scenarios to be run on the device under test.
The new Rapid Load Pull product can replace traditional passive tuning networks within load pull test systems, offering the customer significant improvements in speed of test. The way in which the Rapid Load Pull solution fits into the test environment allows for the existing measurement hardware to be re-used within the improved test station. The system can be supplied as a turnkey project to include, the NI portion with Mesuro Software/Coupler/Amplifier, etc or can be customer assembled, providing a cost-effective way of improving throughput on a test station. The system is currently available covering frequency ranges up to 4.4 GHz.