One essential goal of the design process of an electronic product is to create a robust and reliable design that meets the demands from field operation. Typical measurement values, the number of failures per operation time and their distribution are evaluated. By the use of accelerated aging tests together with numerical simulations, it is possible to get access to these quantities and to predict the lifetime of a product for different load cases.
We support our customers during each step in order to avoid over-engineering, increase power density and enhance the competitiveness of your products.
Development of lifetime estimation strategies (experimental and theoretical).
Statistical methods according to industrial standards and guidelines.
Numerical and analytical modeling of physical degradation mechanisms.
Objectives: Electronic systems, subsystems and components (e.g. converter, power modules, semiconductors, capacitors, inductors, etc.).