spectrum is stored along with the spatial coordination where the measurement took place. Then, a new region is selected and analyzed by moving the sample or the ionization beam. These steps are repeated until the entire sample has been scanned. By coupling all individual mass spectra, a distribution map of intensities as a function of x and y locations can be plotted. As a result, reconstructed molecular images of the sample are obtained. Microscope In this technique, a 2D position-sensitive detector is used to measure the spatial origin of the ions generated at the sample surface by the ion optics of the instruments. The resolution of the spatial information will depend on the magnification of the microscope, the quality of the ions optics and the sensitivity of the detector. A new region still needs to be scanned, but the number of positions drastically reduces. The limitation of this mode is the finite depth of vision present with all microscopes. Ion source dependence The ionization techniques available for MSI are suited to different applications. Some of the criteria for choosing the ionization method are the sample preparation requirement and the parameters of the measurement, as resolution, mass range and sensitivity. Based on that, the most common used ionization method are MALDI, SIMS AND DESI which are described below. Still, other minor techniques used are laser ablation electrospray ionization (LAESI), laser-ablation-inductively coupled plasma (LA-ICP) and nanospray desorption electrospray ionization (nano-DESI). SIMS imaging Secondary ion mass spectrometry (SIMS) is used to analyze solid surfaces and thin films by sputtering the surface with a focused primary ion beam and collecting and analyzing ejected secondary ions. There are many different sources for a primary ion beam. However, the primary ion beam must contain ions that are at the higher end of the energy scale. Some common sources are: Cs+, O2+, O, Ar+ and Ga+. SIMS imaging is performed in a manner similar to electron microscopy; the primary ion beam is emitted across the sample while secondary mass spectra are recorded. SIMS proves to be advantageous in providing the highest image resolution but only over small area of samples. More, this technique is widely regarded as one of the most sensitive forms of mass spectrometry as it can detect elements in concentrations as small as 1012-1016 atoms per cubic centimeter. Multiplexed ion beam imaging (MIBI) is a SIMS method that uses metal isotope labeled antibodies to