interference contrast imaging, bright field imaging makes particular use of the wave nature of the electron to generate vertical diffraction contrast, making steps on the surface visible. Dark field imaging In dark field imaging (also termed diffraction contrast imaging) researchers choose a desired diffraction spot and use a contrast aperture to pass only those electrons that contribute to that particular spot. In the image planes after the contrast aperture it is then possible to observe where the electrons originate from in real space. This technique allows scientists to study on which areas of a specimen a structure with a certain lattice vector (periodicity) exists. Spectroscopy Both (micro-)diffraction as well as bright field and dark field imaging can be performed as a function of the electron landing energy, measuring a diffraction pattern or an image for a range of energies. This way of measuring (often called LEEM-IV) yields spectra for each diffraction spot or sample position. In its simplest form, this spectrum gives a `fingerprint' of the surface, enabling the identification of different surface structures. A particular application of bright field spectroscopy is the counting of the exact number of layers in layered materials such as (few layer) graphene, hexagonal boron nitride and some transition metal dichalcogenides. Photoemission electron microscopy (PEEM) In photoemission electron microscopy (PEEM), upon exposure to electromagnetic radiation (photons), secondary electrons are excited from the surface and imaged. PEEM was first developed in the early 1930s, using ultraviolet (UV) light to induce photoemission of (secondary) electrons. However, since then, this technique has made many advances, the most important of which was the pairing of PEEM with a synchrotron light source, providing tunable, linear polarized, left and right circularized radiation in the soft x-ray range. Such application allows scientist to retrieve topographical, elemental, chemical, and magnetic contrast of surfaces. LEEM instruments are often equipped with light sources to perform PEEM imaging. This helps in system alignment and enables collection LEEM, PEEM and ARPES data of a single sample in a single instrument. Mirror electron microscopy (MEM) In mirror electron microscopy, electrons are slowed in the retarding field of the condenser lens to the limit of the instrument and thus, only allowed to interact with the “near-surface” region of the sample. It is very complicated to understand the exact contrast variations come from, but the important things to point out here are that height variations at the surface of the