surface, which can then be used to display an image. Another commonly used instrument is the scanning electron microscopy (SEM) which apart from measuring the shape and size of the particles and topography of the surface can be used to determine the composition of elements and compounds the sample is composed of. In SEM the specimen surface is scanned with a high energy electron beam. The electrons in the beam interact with atoms in the specimen and interactions are detected using detectors. The interactions produced are back scattering of electrons, transmission of electrons, secondary electrons etc. To remove high angle electrons magnetics lenses are used. The instruments mentioned above produce realistic pictures of the surface are excellent measuring tools for research. Industrial applications of nanotechnology require the measurements to be produced need to be more quantitative. The requirement in industrial nanometrology is for higher accuracy than resolution as compared to research nanometrology. Nano coordinate measuring machine A coordinate measuring machine (CMM) that works at the nanoscale would have a smaller frame than the CMM used for macroscale objects. This is so because it may provide the necessary stiffness and stability to achieve nanoscale uncertainties in x,y and z directions. The probes for such a machine need to be small to enable a 3-D measurement of nanometre features from the sides and from inside like nanoholes. Also for accuracy laser interferometers need to be used. NIST has developed a surface measuring instrument, called the Molecular Measuring Machine. This instrument is basically an STM. The x- and y-axes are read out by laser interferometers. The molecules on the surface area can be identified individually and at the same time the distance between any two molecules can be determined. For measuring with molecular resolution, the measuring times become very large for even a very small surface area. Ilmenau Machine is another nanomeasuring machine developed by researchers at the Ilmenau University of Technology. The components of a nano CMM include nanoprobes, control hardware, 3D-nanopositioning platform, and instruments with high resolution and accuracy for linear and angular measurement. List of some of the measurement techniques Traceability In metrology at macro scale achieving traceability is quite easy and artefacts like scales, laser interferometers, step gauges, and straight edges are used. At nanoscale a crystalline highly oriented pyrolytic graphite (HOPG), mica or silicon surface is considered suitable used as calibration artefact for achieving traceability. But it is