Nanotechnology can be divided into two branches. The first being molecular nanotechnology which involves bottom up manufacturing and the second is engineering nanotechnology which involve the development and processing of materials and systems at nanoscale. The measurement and manufacturing tools and techniques required for the two branches are slightly different. Furthermore, Nanometrology requirements are different for the industry and research institutions. Nanometrology of research has progressed faster than that for industry mainly because implementing nanometrology for industry is difficult. In research oriented nanometrology resolution is important whereas in industrial nanometrology accuracy is given precedence over resolution. Further, due to economic reasons it is important to have low time costs in industrial nanometrology, whereas it is not important for research nanometrology. The various measurement techniques available today require a controlled environment like in vacuum, vibration and noise free environment. Also, in industrial nanometrology requires that the measurements be more quantitative with minimum number of parameters. Standards International standards Metrology standards are objects or ideas that are designated as being authoritative for some accepted reason. Whatever value they possess is useful for comparison to unknowns for the purpose of establishing or confirming an assigned value based on the standard. The execution of measurement comparisons for the purpose of establishing the relationship between a standard and some other measuring device is calibration. The ideal standard is independently reproducible without uncertainty. The worldwide market for products with nanotechnology applications is projected to be at least a couple of hundred billion dollars in the near future. Until recently, there almost no established internationally accepted standards for nanotechnology related field. The International Organization for Standardization TC-229 Technical Committee on Nanotechnology recently published few standards for terminology, characterization of nanomaterials and nanoparticles using measurement tools like AFM, SEM, Interferometers, optoacoustic tools, gas adsorption methods etc. Certain standards for standardization of measurements for electrical properties have been published by the International Electrotechnical Commission. Some important standards which are yet to be established are standards for measuring thickness of thin films or layers, characterization of surface features, standards for force measurement at nanoscale, standards for characterization of critical dimensions of nanoparticles and nanostructures and also Standards for measurement for physical properties like conductivity, elasticity etc. National standards Because of the importance of nanotechnology in the future, countries around the world have programmes to establish national standards for nanometrology and nanotechnology. These programmes are run by the national standard agencies