that of dithiol SAMs to avoid problems due to oxidation or photoinduced processes, which can affect terminal groups and lead to disorder and multilayer formation. In this case appropriate choice of solvents, their degassing by inert gasses and preparation in the absence of light is crucial and allows formation of "standing up" SAMs with free –SH groups. Self-assembled monolayers can also be adsorbed from the vapor phase. In some cases when obtaining an ordered assembly is difficult or when different density phases need to be obtained substitutional self-assembly is used. Here one first forms the SAM of a given type of molecules, which give rise to ordered assembly and then a second assembly phase is performed (e.g. by immersion into a different solution). This method has also been used to give information on relative binding strengths of SAMs with different head groups and more generally on self-assembly characteristics. Characterization The thicknesses of SAMs can be measured using ellipsometry and X-ray photoelectron spectroscopy (XPS), which also give information on interfacial properties. The order in the SAM and orientation of molecules can be probed by Near Edge Xray Absorption Fine Structure (NEXAFS) and Fourier Transform Infrared Spectroscopy in Reflection Absorption Infrared Spectroscopy (RAIRS) studies. Numerous other spectroscopic techniques are used such as Second-harmonic generation (SHG), Sum-frequency generation (SFG), Surface-enhanced Raman scattering (SERS), as well as High-resolution electron energy loss spectroscopy (HREELS). The structures of SAMs are commonly determined using scanning probe microscopy techniques such as atomic force microscopy (AFM) and scanning tunneling microscopy (STM). STM has been able to help understand the mechanisms of SAM formation as well as determine the important structural features that lend SAMs their integrity as surface-stable entities. In particular STM can image the shape, spatial distribution, terminal groups and their packing structure. AFM offers an equally powerful tool without the requirement of the SAM being conducting or semi-conducting. AFM has been used to determine chemical functionality, conductance, magnetic properties, surface charge, and frictional forces of SAMs. The scanning vibrating electrode technique (SVET) is a further scanning probe microscopy which has been used to characterize SAMs, with defect free SAMs showing homogeneous activity in SVET. More recently, however, diffractive methods have also been used. The structure can be used to characterize the kinetics and defects found on the monolayer surface. These techniques have also shown physical differences between SAMs with planar substrates and nanoparticle substrates. An alternative characterisation