high pressures up to 7000 Pa, as reported in 1979. In the following years, Danilatos, working independently, reported a series of works on the design and construction of an environmental or atmospheric scanning electron microscope (ASEM) capable of working at any pressure from vacuum up to one atmosphere. These early works involved the optimization of the differential pumping system together with backscattered electron (BSE) detectors until 1983, when he invented the use of the environmental gas itself as a detection medium. The decade of 1980 closed with the publication of two major works comprehensively dealing with the foundations of ESEM and the theory of the gaseous detection device (GDD). Furthermore, in 1988, the first commercial ESEM was exhibited in New Orleans by ElectroScan Corporation, a venture capital company wishing to commercialize the Danilatos ESEM. The company placed an emphasis on the secondary electron (SE) mode of the GDD and secured the monopoly of the commercial ESEM with a series of additional key patents. Philips and FEI companies succeeded ElectroScan in providing commercial ESEM instruments. With the expiration of key patents and assistance by Danilatos, new commercial instruments have been recently added to the market by LEO (succeeded by Carl Zeiss SMT). Further improvements have been reported to date from work on the original experimental prototype ESEM in Sydney and from numerous other workers using the commercial ESEM in a wide variety of applications worldwide. An early comprehensive bibliography was compiled in 1993 by Danilatos, whilst a more recent survey can be found in a Ph.D. Thesis by Morgan (2005). Microscope An ESEM employs a scanned electron beam and electromagnetic lenses to focus and direct the beam on the specimen surface in an identical way as a conventional SEM. A very small focused electron spot (probe) is scanned in a raster form over a small specimen area. The beam electrons interact with the specimen surface layer and produce various signals (information) that are collected with appropriate detectors. The output of these detectors modulates, via appropriate electronics, the screen of a monitor to form an image that corresponds to the small raster and information, pixel by pixel, emanating from the specimen surface. Beyond these common principles, the ESEM deviates substantially from an SEM in several respects, all of which are important in the correct design and operation of the instrument. The outline below highlights these requirements and how the system works. Differential