trip the device from a pass into a fail condition, or from a fail into a pass condition. Applications LADA is useful for confirming or disproving an existing theory for the cause of failure. It may be used to confirm suspected transistor leakage or bus noise. It has also found wide use in localizing process defects as the LADA effect easily modulates transistor characteristics in the same path as the process defect. LADA has been used to analyze failures in domino logic, state elements in memories and leakage. References Semiconductor analysis