voltages are normally about 2 V for the erased state, and around 4.5 V for the programmed state. Comparison with Floating-Gate structure Generally SONOS is very similar to traditional FG (floating gate) type memory cell, but hypothetically offers higher quality storage. This is due to the smooth homogeneity of the Si3N4 film compared with polycrystalline film which has tiny irregularities. Flash requires the construction of a very high-performance insulating barrier on the gate leads of its transistors, often requiring as many as nine different steps, whereas the oxide layering in SONOS can be more easily produced on existing lines and more easily combined with CMOS logic. Additionally, traditional flash is less tolerant of oxide defects because a single shorting defect will discharge the entire polysilicon floating gate. The nitride in the SONOS structure is non-conductive, so a short only disturbs a localized patch of charge. Even with the introduction of new insulator technologies this has a definite "lower limit" around 7 to 12 nm, which means it is difficult for flash devices to scale smaller than about 45 nm linewidths. But, Intel-Micron group have realized 16 nm planar flash memory with traditional FG technology. SONOS, on the other hand, requires a very thin layer of insulator in order to work, making the gate area smaller than flash. This allows SONOS to scale to smaller linewidth, with recent examples being produced on 40 nm fabs and claims that it will scale to 20 nm. The linewidth is directly related to the overall storage of the resulting device, and indirectly related to the cost; in theory, SONOS' better scalability will result in higher capacity devices at lower costs. Additionally, the voltage needed to bias the gate during writing is much smaller than in traditional flash. In order to write flash, a high voltage is first built up in a separate circuit known as a charge pump, which increases the input voltage to between 9 V to 20 V. This process takes some time, meaning that writing to a flash cell is much slower than reading, often between 100 and 1000 times slower. The pulse of high power also degrades the cells slightly, meaning that flash devices can only be written to between 10,000 and 100,000 times, depending on the type. SONOS devices require much lower write voltages, typically 5–8 V, and do not degrade in the same way. SONOS does suffer from