resonance imaging MS – Mass spectrometry MS/MS – Tandem mass spectrometry MSGE – Mechanically stimulated gas emission Mössbauer spectroscopy MTA – Microthermal analysis N NAA – Neutron activation analysis ND – Neutron diffraction NDP – Neutron depth profiling NEXAFS – Near edge X-ray absorption fine structure NIS – Nuclear inelastic scattering/absorption NMR – Nuclear magnetic resonance spectroscopy NOESY – Nuclear Overhauser effect spectroscopy NRA – Nuclear reaction analysis NSOM – Near-field optical microscopy O OBIC – Optical beam induced current ODNMR – Optically detected magnetic resonance, see ESR or EPR OES – Optical emission spectroscopy Osmometry P PAS – Positron annihilation spectroscopy Photoacoustic spectroscopy PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography PAX – Photoemission of adsorbed xenon PC or PCS – Photocurrent spectroscopy Phase contrast microscopy PhD – Photoelectron diffraction PD – Photodesorption PDEIS – Potentiodynamic electrochemical impedance spectroscopy PDS – Photothermal deflection spectroscopy PED – Photoelectron diffraction PEELS – parallel electron energy loss spectroscopy PEEM – Photoemission electron microscopy (or photoelectron emission microscopy) PES – Photoelectron spectroscopy PINEM – photon-induced near-field electron microscopy PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis PIXE – Particle (or proton) induced X-ray spectroscopy PL – Photoluminescence Porosimetry Powder diffraction PTMS – Photothermal microspectroscopy PTS – Photothermal spectroscopy Q QENS – Quasielastic neutron scattering QCM-D – Quartz crystal microbalance with dissipation monitoring R Raman spectroscopy RAXRS – Resonant anomalous X-ray scattering RBS – Rutherford backscattering spectrometry REM – Reflection electron microscopy RDS – Reflectance difference spectroscopy RHEED – Reflection high energy electron diffraction RIMS – Resonance ionization mass spectrometry RIXS – Resonant inelastic X-ray scattering RR spectroscopy – Resonance Raman spectroscopy S SAD – Selected area diffraction SAED – Selected area electron diffraction SAM – Scanning Auger microscopy SANS – Small angle neutron scattering SAXS – Small angle X-ray scattering SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation SCEM – Scanning confocal electron microscopy SE – Spectroscopic ellipsometry SEC – Size exclusion chromatography SEIRA – Surface enhanced infrared absorption spectroscopy SEM – Scanning electron microscopy SERS – Surface enhanced Raman spectroscopy SERRS – Surface enhanced resonance Raman spectroscopy SESANS – Spin Echo Small Angle Neutron Scattering SEXAFS – Surface extended X-ray absorption fine structure SICM – Scanning ion-conductance microscopy SIL – Solid immersion lens SIM – Solid immersion mirror SIMS – Secondary ion mass spectrometry SNMS – Sputtered neutral species mass spectrometry SNOM