relatively sensitive and accurate. However, it requires existence of allowed and forbidden transitions of similar energies and thus is only applicable to specific systems, e.g., Xe bubbles in aluminum. Use in confocal geometry Scanning confocal electron energy loss microscopy (SCEELM) is a new analytical microscopy tool that enables a double corrected transmission electron microscope to achieve sub-10 nm depth resolution in depth sectioning imaging of nanomaterials. It was previously termed as energy filtered scanning confocal electron microscopy due to the lack to full spectrum acquisition capability (only a small energy window on the order of 5 eV can be used at a time). SCEELM takes advantages of the newly developed chromatic aberration corrector which allows electrons of more than 100 eV of energy spread to be focused to roughly the same focal plane. It has been demonstrated that a simultaneous acquisition of the zero loss, low-loss, and core loss signals up to 400 eV in the confocal geometry with depth discrimination capability. See also Energy filtered transmission electron microscopy Magic angle (EELS) Transmission electron microscopy Scanning transmission electron microscopy References Further reading External links A Database of EELS fine structure fingerprints at Cornell A database of EELS and X-Ray excitation spectra Cornell Spectrum Imager, an EELS Analysis open-source plugin for ImageJ HyperSpy, a hyperspectral data analysis Python toolbox especially well suited for EELS data analysis EELSMODEL, software to quantify Electron Energy Loss (EELS) spectra by using model fitting Electron spectroscopy Scientific techniques