description related to the kinematic solution (using the Bragg condition) is very powerful and useful for orientation and texture analysis, it only describes the geometry of the crystalline lattice and ignores many physical processes involved within the diffracting material. To adequately describe finer features within the electron beam scattering pattern (EBSP), one must use a many beam dynamical model (e.g. the variation in band intensities in an experimental pattern does not fit the kinematic solution related to the structure factor). EBSD Detectors Experimentally EBSD is conducted using a SEM equipped with an EBSD detector containing at least a phosphor screen, compact lens and low light CCD camera. Commercially available EBSD systems typically come with one of two different CCD cameras: for fast measurements the CCD chip has a native resolution of 640×480 pixels; for slower, and more sensitive measurements, the CCD chip resolution can go up to 1600×1200 pixels. The biggest advantage of the high-resolution detectors is their higher sensitivity and therefore the information within each diffraction pattern can be analysed in more detail. For texture and orientation measurements, the diffraction patterns are binned in order to reduce their size and reduce computational times. Modern CCD-based EBSD systems can index patterns at up to 1800 patterns / second. This enables very rapid and rich microstructural maps to be generated. Recently, CMOS detectors have also been used in the design of EBSD systems. The new CMOS-based systems permit pattern indexing faster than CCD-based predecessors. Modern CMOS-based EBSD detectors are capable of indexing patterns up to 3000 patterns / second. Indexing Often, the first step in the EBSD process after pattern collection is indexing. This allows for identification of the crystal orientation at the single volume of the sample from where the pattern was collected. With EBSD software, pattern bands are typically detected via a mathematical routine using a modified Hough transform, in which every pixel in Hough space denotes a unique line/band in the EBSP. The Hough transform is used to enable band detection, which are difficult to locate by computer in the original EBSP. Once the band locations have been detected it is possible to relate these locations to the underlying crystal orientation, as angles between bands represent angles between lattice planes. Thus when the position / angles between three bands are known an orientation solution can be determined. In highly symmetric materials, typically more than three bands are used