the symmetry class of the given defect. Application of LDLTS to MOS capacitors needs device polarization voltages in a range where the Fermi level extrapolated from semiconductor to the semiconductor-oxide interface intersects this interface within the semiconductor bandgap range. The electronic interface states present at this interface can trap carriers similarly to defects described above. If their occupancy with electrons or holes is disturbed by a small voltage pulse then the device capacitance recovers after the pulse to its initial value as the interface states start to emit carriers. This recovery process can be analyzed with the LDLTS method for different device polarization voltages. Such a procedure allows to obtain the energy state distribution of the interface electronic states at the semiconductor-oxide (or dielectric) interfaces. Constant-capacitance DLTS In general, the analysis of the capacitance transients in the DLTS measurements assumes that the concentration of investigated traps is much smaller than the material doping concentration. In cases when this assumption is not fulfilled then the constant capacitance DLTS (CCDLTS) method is used for more accurate determination of the trap concentration. When the defects recharge and their concentration is high then the width of the device space region varies making the analysis of the capacitance transient inaccurate. The additional electronic circuitry maintaining the total device capacitance constant by varying the device bias voltage helps to keep the depletion region width constant. As a result, the varying device voltage reflects the defect recharge process. An analysis of the CCDLTS system using feedback theory was provided by Lau and Lam in 1982. I-DLTS and PITS There is an important shortcoming for DLTS: it cannot be used for insulating materials. (Note: an insulator can be considered as a very large bandgap semiconductor.) For insulating materials it is difficult or impossible to produce a device having a space region for which width could be changed by the external voltage bias and thus the capacitance measurement-based DLTS methods cannot be applied for the defect analysis. Basing on experiences of the thermally stimulated current (TSC) spectroscopy, the current transients are analyzed with the DLTS methods (I-DLTS), where the light pulses are used for the defect occupancy disturbance. This method in the literature is sometimes called the Photoinduced Transient Spectroscopy (PITS). I-DLTS or PITS are also used for studying defects in the i-region of a p-i-n diode. See also Carrier generation and recombination Bandgap Effective mass Schottky diode Frenkel