to first order similar to those of bend contours, i.e. electrons which enter a crystalline surface under diffracting conditions tend to channel (penetrate deeper into the specimen without losing energy) and thus kick up fewer electrons near the entry surface for detection. Hence bands form, depending on beam/lattice orientation, with the now-familiar Kikuchi line geometry. The first scanning electron microscope (SEM) image was an image of electron channeling contrast in silicon steel. However, practical uses for the technique are limited because only a thin layer of abrasion damage or amorphous coating is generally adequate to obscure the contrast. If the specimen had to be given a conductive coating before examination to prevent charging, this too could obscure the contrast. On cleaved surfaces, and surfaces self-assembled on the atomic scale, electron channeling patterns are likely to see growing application with modern microscopes in the years ahead. See also Electron diffraction Electron backscatter diffraction (EBSD) References External links Calculate patterns with WebEMApS at UIUC. Some interactive 3D maps at UM Saint Louis. Calculate Kikuchi map or patterns with free software PTCLab . Diffraction Electron microscopy