mainly reflects the electronic unoccupied states. EXAFS, resulting from the interference in the single scattering process of the photoelectron scattered by surrounding atoms, provides information on the local structure. Information on the geometry of the local structure is provided by the analysis of the multiple scattering peaks in the XANES spectra. The XAFS acronym has been later introduced to indicate the sum of the XANES and EXAFS spectra. See also SEXAFS EXAFS XANES References External links M. Newville, Fundamentals of XAFS S. Bare, XANES measurements and interpretation B. Ravel, A practical introduction to multiple scattering X-ray absorption spectroscopy fr:Spectrométrie d'absorption it:EXAFS