data from both X-ray and neutron sources as they have different scattering properties and provide complementary data. Pair distribution function analysis can be performed on diffraction data to determine the probability of finding a pair of atoms separated by a certain distance. Another type of analysis that is done with diffraction data of amorphous materials is radial distribution function analysis, which measures the number of atoms found at varying radial distances away from an arbitrary reference atom. From these techniques, the local order of an amorphous material can be elucidated. X-ray absorption fine-structure spectroscopy X-ray absorption fine-structure spectroscopy is an atomic scale probe making it useful for studying materials lacking in long range order. Spectra obtained using this method provide information on the oxidation state, coordination number, and species surrounding the atom in question as well as the distances at which they are found. Atomic electron tomography The atomic electron tomography technique is performed in transmission electron microscopes capable of reaching sub-Angstrom resolution. A collection of 2D images taken at numerous different tilt angles is acquired from the sample in question, and then used to reconstruct a 3D image. After image acquisition, a significant amount of processing must be done to correct for issues such as drift, noise, and scan distortion. High quality analysis and processing using atomic electron tomography results in a 3D reconstruction of an amorphous material detailing the atomic positions of the different species that are present. Fluctuation electron microscopy Fluctuation electron microscopy is another transmission electron microscopy based technique that is sensitive to the medium range order of amorphous materials. Structural fluctuations arising from different forms of medium range order can be detected with this method. Fluctuation electron microscopy experiments can be done in conventional or scanning transmission electron microscope mode. Computational techniques Simulation and modeling techniques are often combined with experimental methods to characterize structures of amorphous materials. Commonly used computational techniques include density functional theory, molecular dynamics, and reverse Monte Carlo. Uses and observations Amorphous thin films Amorphous phases are important constituents of thin films. Thin films are solid layers of a few nanometres to tens of micrometres thickness that are deposited onto a substrate. So-called structure zone models were developed to describe the microstructure of thin films as a function of the homologous temperature (Th), which is the ratio of deposition temperature to melting temperature. According to these models, a necessary condition for