as small as a few hundreds of nanometers can be detected. Ion production in this technique is dependent on the bombardment of solid samples with a focused beam of primary ions. The sputtered, secondary ions are directed onto the mass spectrometry system to be measured. The secondary ions are a result of kinetic energy transfer from the primary ions. These primary ions penetrate into the solid sample to some depth. This method can be used to detect any element, however the sputtering process is highly matrix dependent and ion yields vary. This method is especially useful, because it can be fully automated to find uranium particles in a sample of many million particles in a matter of hours. Particles of interest can then be imaged and further analyzed with very high isotopic precision. Additional Nuclear Forensic Methods Numerous additional approaches may be employed in the interrogation of seized nuclear material. In contrast to previously mentioned analysis techniques, these approaches have received relatively low attention in recent years in terms of novel advancement, and, typically, require greater quantities of sample. Scanning electron microscope The scanning electron microscope can provide images of an object's surface at high magnification with a resolution on the order of nanometers. A focused beam of energetic electrons is scanned over the sample and electrons that a backscattered or emitted from the sample surface are detected. Images are constructed via measuring the fluctuations of electrons from the sample beam scanning position. This data is useful in determining what process may have been employed in the materials production and to distinguish between materials of differing origins. Measurement of backscattered electrons elucidate the average atomic number of the area being scanned. The emitted, or secondary electrons provide topological information. This is a relatively straight forward technique, however samples must be amenable to being under a vacuum and may require pre-treatment. X-Ray Fluorescence X-ray fluorescence offers rapid and non-destructive determination of the elemental composition of a nuclear material based on the detection of characteristic X-rays. Direct sample irradiation allows for minimal sample preparation and portable instrumentation for field deployment. The detection limit is 10 ppm. This is well above mass spectrometry. This technique tends to be hindered by matrix affects, which must be corrected for. Neutron Activation Analysis Neutron activation analysis is a powerful non-destructive method of analyzing elements of mid to high atomic number. This method combines excitation by nuclear