can be accomplished without destroying the sample. The most common gamma-ray detector is a semiconductor germanium detector which allow for a greater energy resolution than alpha-particle spectroscopy, however gamma spectroscopy only has an efficiency of a few percent. Gamma spectroscopy is a less sensitive method due to low detector efficiency and high background. However, gamma spectroscopy has the advantage of having less time-consuming sample procedures and portable detectors for field use. Mass Spectrometry Mass spec techniques are essential in nuclear forensics analysis. Mass spec can provide elemental and isotopic information. Mass spec also requires less sample mass relative to counting techniques. For nuclear forensic purposes it is essential that the mass spectrometry offers excellent resolution in order to distinguish between similar analytes, e.g. 235U and 236U. Ideally, mass spec should offer excellent resolution/mass abundance, low backgrounds, and proper instrumental function. Thermal Ionization MS In thermal ionization mass spectrometry, small quantities of highly purified analyte are deposited onto a clean metal filament. Rhenium or tungsten are typically used. The sample is heated in a vacuum of the ion source by applying a current to the filaments. A portion of the analyte will be ionized by the filament and then are directed down the flight tube and separated based on mass to charge ratios. Major disadvantages include time-consuming sample preparation and inefficient analyte ionization. Multi-Collector Inductively Coupled Plasma-Mass Spectrometry This is a frequently used technique in nuclear forensics. In this technique a purified sample is nebulized in a spray chamber and then aspirated into a plasma. The high temperature of the plasma leads to sample dissociation and high efficiency of ionization of the analyte. The ions then enter the mass spectrometer where they are discriminated based on mass based on a double focusing system. Ions of various masses are detected simultaneously by a bank of detectors similar to those used in the thermal ionization mass spec. MC-ICP-MS has a more rapid analysis because it does not require lengthy filament preparation. For high quality, however, there is a requirement for extensive sample cleanup. Argon plasma is also less stable and requires relatively expensive equipment as well as skilled operators. Secondary-Ion MS SIMS is a micro-analytical technique valuable for three-dimensional analysis of a materials elemental composition and isotopic ratios. This method can be utilized in characterization of bulk materials with a detection limit in the low parts per billion (10−9 or ng/g) range. Particles