BACKGROUND OF THE INVENTION 
       [0001]    The present invention relates to testing of data packet signal transceivers, and in particular, to systems and methods for parallel testing of multiple such devices. 
         [0002]    Many consumer electronics products, particularly, hand-held devices, use various wireless signal technologies, both for connectivity as well as communications purposes. Because such wireless devices transmit and receive electromagnetic waves, and because two or more wireless devices have the potential of interfering with the operations of one another by virtue of their signal frequencies and power spectral densities, these devices and their wireless technologies subscribe to various wireless signal technology standard specifications. 
         [0003]    When designing and manufacturing such devices, manufacturers take extraordinary care to ensure that such devices will meet or exceed the prescribed standard-based specifications for each wireless technology used by such devices. Furthermore, once these devices are in mass production, they are tested to ensure that manufacturing defects will not cause improper operation, including their adherence to the included wireless technology standard-based specifications. 
         [0004]    As part of such manufacturing test, current wireless device test systems employ a subsystem for analyzing signals received from a device, e.g., a vector signal analyzer (VSA), as well as a subsystem for generating signals to be received by the device, e.g., a vector signal generator (VSG). The analyses performed by a VSA and the signals generated by a VSG are usually programmable, so as to allow each subsystem to be used for testing devices in accordance with a variety of wireless technology standards, including those with differing frequency ranges, bandwidths and modulation characteristics. 
         [0005]    Wireless device manufacturers are under constant pressure to keep manufacturing and testing costs down in order to preserve profit margins facing constant reduction pressures due to competition and consumer expectations of new and additional features at no more, or even lower, costs than previous models. Accordingly, systems and techniques for performing manufacturing tests of devices using the various wireless technologies are designed to test using less time and less testing hardware. For example, in addition to reducing handling and set-up times, some test systems are designed to test multiple devices under test (DUTs) concurrently (often referred to as “parallel testing”). 
         [0006]    As with single-DUT testing, a tester must determine that a device is ready to receive or send test signals. With parallel testing, establishing readiness of a DUT can be far more complicated and time consuming. For example, if a tester sends a set of identical readiness packets to multiple DUTs, it is often the case that one or more of the DUTs may not receive it, i.e., the DUT is not yet ready. Ideally, one would wish to halt sending readiness packets to the DUTs that did acknowledge receipt, while continuing to send readiness packets to those DUTs who have not yet acknowledged receipt, until all DUTs have indicated their readiness. However, halting the sending of packets to some DUTs while continuing to send them to others raises the possibility of packet leakage, i.e., reception of data packets by DUTs not intended to receive such data packets. 
         [0007]    Accordingly, it would be desirable to have a test system and method for establishing readiness of multiple DUTs for parallel testing while requiring a minimal time interval for establishing readiness of all DUTs, and not having those DUTs responding as ready more quickly also receiving unintended tests signals. 
       SUMMARY 
       [0008]    In accordance with the presently claimed invention, a system and method are provided for facilitating testing of multiple data packet signal transceivers involving data-packet-signal replication and one or more status signals indicating successful and unsuccessful receptions of confirmation signals. Based upon the one or more status signals, one or more control signals cause the replicated data packet signals to be distributed to the devices under test (DUTs) such that, following successful and unsuccessful receptions of confirmation signals, corresponding replicated data packet signals are caused to fail to conform in part or to conform, respectively, with a predetermined data packet signal standard. 
         [0009]    In accordance with one exemplary embodiment of the presently claimed invention, circuitry for facilitating testing of multiple data packet signal transceivers includes: signal routing circuitry responsive to an incoming data packet signal and one or more control signals by providing a plurality of outgoing data packet signals for a plurality of data packet signal transceivers, wherein each one of the plurality of outgoing data packet signals corresponds to the incoming data packet signal and includes one or more sequential data packets with a data packet signal characteristic; confirmation signal detection circuitry responsive to successful and unsuccessful receptions of respective ones of a plurality of confirmation signals from the plurality of data packet signal transceivers by providing one or more status signals indicative of the successful and unsuccessful confirmation signal receptions, wherein each one of the plurality of confirmation signals is indicative of a successful reception of a valid data packet by a respective one of the plurality of data packet signal transceivers; and control circuitry coupled to the signal routing circuitry and the confirmation signal detection circuitry, and responsive to the one or more status signals by providing the one or more control signals, wherein: following a successful reception of one of the plurality of confirmation signals from a respective one of the plurality of data packet signal transceivers, the signal routing circuitry, in accordance with the one or more control signals, provides a corresponding one of the plurality of outgoing data packet signals with the data packet signal characteristic such that the corresponding one of the plurality of outgoing data packet signals fails to conform in part with a predetermined data packet signal standard; and following an unsuccessful reception of one of the plurality of confirmation signals from a respective one of the plurality of data packet signal transceivers, the signal routing circuitry, in accordance with the one or more control signals, provides a corresponding one of the plurality of outgoing data packet signals with the data packet signal characteristic such that the corresponding one of the plurality of outgoing data packet signals conforms with the predetermined data packet signal standard. 
         [0010]    In accordance with another exemplary embodiment of the presently claimed invention, a method of facilitating testing of multiple data packet signal transceivers includes: receiving an incoming data packet signal and one or more control signals and in response thereto providing a plurality of outgoing data packet signals for a plurality of data packet signal transceivers, wherein each one of the plurality of outgoing data packet signals corresponds to the incoming data packet signal and includes one or more sequential data packets with a data packet signal characteristic; responding to successful and unsuccessful receptions of respective ones of a plurality of confirmation signals from the plurality of data packet signal transceivers by providing one or more status signals indicative of the successful and unsuccessful confirmation signal receptions, wherein each one of the plurality of confirmation signals is indicative of a successful reception of a valid data packet by a respective one of the plurality of data packet signal transceivers; and responding to the one or more status signals by providing the one or more control signals, wherein: following a successful reception of one of the plurality of confirmation signals from a respective one of the plurality of data packet signal transceivers, in accordance with the one or more control signals, providing a corresponding one of the plurality of outgoing data packet signals with the data packet signal characteristic such that the corresponding one of the plurality of outgoing data packet signals fails to conform in part with a predetermined data packet signal standard; and following an unsuccessful reception of one of the plurality of confirmation signals from a respective one of the plurality of data packet signal transceivers, in accordance with the one or more control signals, providing a corresponding one of the plurality of outgoing data packet signals with the data packet signal characteristic such that the corresponding one of the plurality of outgoing data packet signals conforms with the predetermined data packet signal standard. 
     
    
     
       BRIEF DESCRIPTION OF THE DRAWINGS 
         [0011]      FIG. 1  depicts a conventional test environment for testing multiple DUTs in parallel. 
           [0012]      FIG. 2  depicts a testing environment for testing multiple DUTs in parallel in accordance with an exemplary embodiment of the presently claimed invention. 
           [0013]      FIG. 3  depicts operation of the testing environment of  FIG. 2  in accordance with an exemplary embodiment of the presently claimed invention. 
           [0014]      FIG. 4  depicts an alternative embodiment of the signal characteristic control circuitry of  FIG. 2 . 
           [0015]      FIG. 5  depicts an alternative embodiment of the signal characteristic control circuitry of  FIG. 2 . 
           [0016]      FIG. 6  depicts circuitry for conveying test signals to and confirmation signals from the DUTs in accordance with an exemplary embodiment of the presently claimed invention. 
       
    
    
     DETAILED DESCRIPTION 
       [0017]    The following detailed description of the invention makes use of exemplary embodiments which should not be read as limiting the scope of the claimed invention. Furthermore, the term “signal” or “signals” refers to electromagnetic or optical signals which may be conveyed using conductive or wireless signal paths. Structures depicted in the description and drawings, as is well known in the art, may be implemented using a variety of components and techniques, and the individual functions of such structures are well known in the art. The descriptive term for such structures should not be construed as limiting its implementation to any particular circuit(s) or component type(s). 
         [0018]    Further, throughout the present disclosure, absent a clear indication to the contrary from the context, it will be understood that individual circuit elements as described may be singular or plural in number. For example, the terms “circuit” and “circuitry” may include either a single component or a plurality of components, which are either active and/or passive and are connected or otherwise coupled together (e.g., as one or more integrated circuit chips) to provide the described function. Additionally, the term “signal” may refer to one or more currents, one or more voltages, or a data signal. Within the drawings, like or related elements will have like or related alpha, numeric or alphanumeric designators. Further, while the present invention has been discussed in the context of implementations using discrete electronic circuitry (preferably in the form of one or more integrated circuit chips), the functions of any part of such circuitry may alternatively be implemented using one or more appropriately programmed processors, depending upon the signal frequencies or data rates to be processed. Moreover, to the extent that the figures illustrate diagrams of the functional blocks of various embodiments, the functional blocks are not necessarily indicative of the division between hardware circuitry. 
         [0019]    As discussed in more detail below, test systems and methods in accordance with exemplary embodiments of the presently claimed invention advantageously coordinate testing of multiple DUTs using selective data packet corruption. For example, rather than attempting to interrupt delivery of data packets to one or more DUTs while waiting for other DUTs to acknowledge readiness, selective data packet corruption is used where a DUT has indicated readiness while continuing to send non-corrupted data packets to those that have not yet acknowledged readiness. 
         [0020]    An advantage to using selective data packet corruption is that the DUTs that have indicated readiness to proceed with testing will continue to receive subsequent data packets, but will not respond to them, instead rejecting them as being corrupted. Accordingly, rather than sitting idle, waiting for the other DUTs to indicate readiness, and being exposed to the possibility of receiving a “leaked” data packet, these DUTs that have indicated readiness will be immune to leaked data packets while rejecting corrupted ones that are sent to and received by them. 
         [0021]    One way of purposely corrupting a data packet is to simply lower its power level at some point during the data packet sequence, thereby ensuring that it will not be received intact by the corresponding DUT. This can be done using virtually any mechanism for signal level control, e.g., signal attenuators or switches, that can be applied to a signal before it arrives at its intended DUT. Further, where a test system has multiple VSGs with each VSG being used for testing a designated DUT, each VSG can be programmed to corrupt the data packet is sending. However, such a multiple VSG configuration will come at a higher system cost than one having a single VSG, as discussed below. 
         [0022]    Typically, when receiving a data packet signal, a DUT establishes its signal reception gain at the beginning of the data packet or data packet sequence. Accordingly, reducing the signal power within a single data packet (or within a data packet sequence) results in an abrupt power reduction that causes the DUT to lose the data and reject the data packet or data packet sequence. If the power of the entire data packet or data packet sequence were reduced, the DUT may, erroneously, receive a non-corrupted packet from an adjacent channel being used by and intended for routing a data packet to an adjacent DUT. Therefore, by having good signal power at the beginning of the data packet, the DUT will lock on to the higher signal power of the intended data packet signal and then, when its signal power is subsequently reduced, such data packet will be rejected and not decoded for purposes of testing. 
         [0023]    As a result, a system testing multiple, e.g., four, DUTs might begin an initialization synchronization process (SYNC) by sending a set of four identical data packets to four DUTs while taking note of which DUTs return a confirmation signal, e.g., an acknowledgement signal (ACK) for DUTs communicating in accordance with an IEEE 802.11x standard, or a null signal for DUTs communicating in accordance with a time-division-duplex (TDD) signal standard such as Bluetooth. When the test system next sends another set of four data packets, those data packets intended for DUTs that have confirmed reception of the previous data packet are purposely corrupted during their transmission, whereas those data packets intended for DUTs not yet having confirmed reception of the previous data packets will be sent without being corrupted. Generally, this would be done only during the SYNC process. For example, if a particular test called for 100 data packets to be used, such data packets would be sent or received only after the SYNC process has occurred using the selective data packet corruption technique. 
         [0024]    This SYNC process will repeat until all DUTs have confirmed data packet reception, following which, one or more uncorrupted data packets are sent by the test system to the DUTs with the expectation that all DUTs will now respond to confirm readiness for testing, thereby confirming that all DUTs are now ready to proceed with the desired receive (RX) and/or transmit (TX) tests. 
         [0025]    In those cases where one or more of the DUTs has a manufacturing defect that prevents it from confirming its readiness, the SYNC process can be made to continue for some number of additional data packets, and in the absence of confirmation from one or more DUTs, the test system would consider those DUTs as having failed. This number of additional data packets to be sent would be part of a timeout safeguard procedure. 
         [0026]    Such selective data packet corruption advantageously facilitates synchronization of multiple DUTs during parallel testing. For example, in the case of many test sequences, the DUTs will typically need to send or receive (e.g., as part of TX or RX test sequences) a specified number of data packets. Accordingly, sending or receiving test data packets before all DUTs have confirmed reception of a SYNC data packet makes parallel test execution difficult, since each DUT will need a different number of test data packets following final synchronization of all DUTs. Further, it is often desirable to have the different DUTs execute the same test at the same time as to prevent uncontrolled signal coupling between DUTs. By corrupting data packets to specific DUTs until all DUTs have confirmed reception of a SYNC data packet, one can keep the remaining part of the test sequence fully synchronized among the different DUTs, thus having a controlled test execution with known behavior. 
         [0027]    In the following discussion, exemplary embodiments are presented in which the confirmation signal is in the form of an acknowledgement (ACK) signal such as that used by data packet transceivers communicating in accordance with an IEEE 802.11x standard. However, as will be readily apparent to one of ordinary skill in the art, the principles and techniques for using data packet corruption in accordance with the presently claimed invention can also be practiced using data packet transceivers communicating in accordance with other types of signals, including, without limitation, a TDD signal standard such as Bluetooth for which a confirmation signal is in the form of a null data packet. Accordingly, an ACK signal is to be considered merely one example of a confirmation signal suitable for use in practicing the presently claimed invention. 
         [0028]    Referring to  FIG. 1 , a conventional testing environment includes a test system, or “tester”, and, in the case of parallel testing, multiple DUTs  105 ,  106 ,  107 ,  108 . Typically, the tester includes multiple VSG subsystems  101 ,  102 ,  103 ,  104 , each of which provides a respective set of test signals  111 ,  112 ,  113 ,  114  (typically over wired, or cabled, electrical connections, even for wireless DUTs, so as to maintain adequate control over test conditions for each DUT  105 ,  106 ,  107 ,  108 ). Having a VSG dedicated to each DUT ensures synchronized testing of each DUT, but does not realize the lower subsystem costs of the presently claimed invention. 
         [0029]    Referring to  FIG. 2 , a testing environment in accordance with an exemplary embodiment of the presently claimed invention includes a test signal control subsystem  202  for which a tester  201  having only a single VSG subsystem  101  is required for providing a common, or shared, set of test signals  111 . The test signal control subsystem  202  includes a signal divider (e.g., signal power divider or splitter)  210 , signal level control circuits  212   a,    212   b,    212   c,    212   d,  acknowledgement signal (ACK) detection circuits  214   a,    214   b,    214   c,    214   d,  and a controller  208 , all interconnected substantially as shown. 
         [0030]    The test signal control subsystem  202  performs signal routing by first splitting the incoming data packet signal  111  to provide multiple replica data packet signals  211   a,    211   b,    211   c,    211   d,  each of which is a replica of the incoming data packet signal  111  and is switched or attenuated by a respective one of the switching or attenuation circuits  212   a,    212   b,    212   c,    212   d,  in accordance with one or more control signals  209  from the controller  208 . The resulting switched or attenuated data packet signals  203 ,  204 ,  205 ,  206  are conveyed to the DUTs  105 ,  106 ,  107 ,  108 . Following successful reception of these test signals  203 ,  204 ,  205 ,  206 , each DUT  105 ,  106 ,  107 ,  108  transmits, in return, an acknowledgement signal (ACK)  215   a,    215   b,    215   c,    215   d.  (As will be readily appreciated by one of ordinary skill in the art, and as discussed in more detail below, the respective signal paths for the test signals  203 ,  204 ,  205 ,  206  and ACK signals  215   a,    215   b,    215   c,    215   d  are shared, e.g., a single wired signal path is used to convey a test signal  203 / 204 / 205 / 206  to a DUT  105 / 106 / 107 / 108  and also convey the ACK signal  215   a/b/c/d  from such DUT  105 / 106 / 107 / 108 .) The ACK signal detection circuits  214   a,    214   b,    214   c,    214   d,  following successful reception of an ACK signal  215   a,    215   b,    215   c,    215   d,  provides a corresponding status signal  217   a,    217   b,    217   c,    217   d  to the controller  208 . Hence, each status signal  217   a,    217   b,    217   c,    217   d  is indicative of the successful or unsuccessful reception of a corresponding ACK signal  215   a,    215   b,    215   c,    215   d.    
         [0031]    As discussed above, following successful reception of an ACK signal  215 , as indicated by the corresponding status signal  217 , the controller  208  provides the control signals  209  with appropriate control states such that the corresponding DUT test signal is appropriately corrupted. On the other hand, following unsuccessful reception of an ACK signal  215  from a DUT, as indicated by the status signals  217 , the controller  208  provides the control signals  209  with appropriate control signal states such that uncorrupted data packets continue to be transmitted until all acknowledgement signals have been received. 
         [0032]    The controller  208  can also provide one or more additional control or status signals  209   e  to the tester  201 , e.g., for initiating or controlling subsequent operations of the VSG  101  for testing the DUTs  105 ,  106 ,  107 ,  108  after they have indicated their readiness to proceed. 
         [0033]    Referring to  FIG. 3 , this process of selectively sending corrupted test data packet signals can be better understood. As discussed above, the tester  201  provides a sequence of test data packet signals  111 , e.g., data packets P 1 , P 2 , P 3  and P 4 . As also discussed above, the test signal control subsystem  202  replicates these data packets P 1 , P 2 , P 3 , P 4 , e.g., during corresponding time intervals T 1 , T 3 , T 5  and T 7  for purposes of this example. During the first time interval T 1 , the first data packet P 1  is transmitted in uncorrupted from, e.g., at full test signal power. These uncorrupted signals  203 ,  204 ,  205 ,  206  are conveyed to their respective DUTs  105 ,  106 ,  107 ,  108 . During time interval T 2 , the first DUT  105  responds with its ACK signal  215   a,  while the remaining DUTs  106 ,  107 ,  108  do not. Accordingly, during the next test signal transmission interval T 3 , a second data packet P 2  replica  203  is sent in corrupted form to the first DUT  105  while the remaining second data packet P 2  replicas  204 ,  205 ,  206  are sent in uncorrupted form to the remaining DUTs  106 ,  107 ,  108 . 
         [0034]    As depicted in  FIG. 3 , the beginning of the second data packet P 2  replica  203  to be sent in corrupted form retains a signal power level comparable to the other second data packet replicas  204 ,  205 ,  206  to be sent in uncorrupted form. Later, sometime during the transmission interval of the second data packet replicas  203 ,  204 ,  205 ,  206 , the power level of the second data packet P 2  replica  203  to be sent in corrupted form is changed, e.g., reduced. This delay in the power level change ensures that the automatic gain control (AGC) of the corresponding DUT  105  will have first settled based upon the initial higher signal power level. As a result, the DUT  105  will not be capable of accurately receiving the portion of the signal  203  now having a changed (e.g., lower) power level. Accordingly, the signal  203  will be deemed corrupted. 
         [0035]    During the next time interval T 4 , the second and fourth DUTs  106 ,  108  respond with their respective ACK signals  215   b,    215   d.  Accordingly, during the next time interval T 5 , a third data packet P 3  replica  205  is transmitted in uncorrupted form to the third DUT  107 , while the remaining third data packet P 3  replicas  203 ,  204 ,  206  are transmitted in corrupted form to the first, second and fourth DUTs  105 ,  106 ,  108 , since they have previously acknowledged readiness by responding with their ACK signals  215   a,    215   b,    215   d  during time intervals T 2  and T 4 . Finally, during time interval T 6 , the third, and last, DUT  107  responds with its ACK signal  215   c.  Hence, all DUTs  105 ,  106 ,  107 ,  108  have now responded with their respective ACK signals  215   a,    215   b,    215   c,    215   d,  thereby indicating readiness for initiation of the test sequence. Accordingly, during the next time interval T 7 , the tester  201  transmits one or more test initiation data packets P 4 , to which all DUTs  105 ,  106 ,  107 ,  108 , having previously indicated readiness for testing, respond with their respective reply signals  215   a,    215   b,    215   c,    215   d  during time interval T 8  confirming readiness for testing. 
         [0036]    For example, this last readiness step can ensure that all DUTs  105 ,  106 ,  107 ,  108  are ready for a packet error rate (PER) test, where the tester  201  will send a predefined number of data packets  111  and analyze the number of acknowledgement signals  215  received in return from each DUT  105 ,  106 ,  107 ,  108  to determine the respective PER for each DUT  105 ,  106 ,  107 ,  108 . As is well known in the art, a PER test is a common wireless transceiver RX specification and test, and can serve as a readiness step for other tests to be done fully in parallel, such as a TX test where all DUTs  105 ,  106 ,  107 ,  108  have signified their respective readiness and the DUTs  105 ,  106 ,  107 ,  108  begin transmitting predefined sequences of TX tests data packets. 
         [0037]    Referring to  FIG. 4 , as discussed above, an alternative embodiment  212   aa  of the switching or attenuation circuitry  212  can include a variable attenuator that, in contrast to switching the DUT test signal  203  on and off, can, instead, impart sufficient attenuation to the signal so as to sufficiently corrupt the signal in accordance with the discussion above. 
         [0038]    Referring to  FIG. 5 , in accordance with another alternative embodiment, instead of switching or attenuation circuitry, signal mixing circuitry  212   ab  can be used. In this embodiment, corruption of the DUT signal  203  can be achieved by altering the frequency of the replica test signal  211  a by mixing it with another radio frequency (RF) signal  221  from a local RF source  220  controlled by the control signal  209   a  from the controller  208  ( FIG. 2 ). 
         [0039]    Based upon this discussion, it should be readily appreciated by those skilled in this art that signal corruption can be achieved in other forms as well. For example, other forms of signal corruption can include a signal level increase and invalid signal modulation. In the case of a signal level increase, the signal switching or attenuation circuitry  212  ( FIG. 2 ) can be replaced with signal amplification circuitry that increases the magnitude of the signal intended to be corrupted above a level at which the target DUT can properly receive it. In the case of invalid signal modulation, the signal modulation technique can be altered to one that is not included in the particular signal standard being tested. Similarly, other data packet bit rates can be used. 
         [0040]    Hence, it can be seen that signal corruption can be achieved by altering virtually any data packet signal characteristic including signal power, signal frequency and signal modulation. 
         [0041]    Referring to  FIG. 6  (and with reference to  FIG. 2 ), in accordance with exemplary embodiments of the presently claimed invention, the wired signal paths for testing the DUTs  105 ,  106 ,  107 ,  108  are typically in the form of a single wired connection for each DUT  105 ,  106 ,  107 ,  108 . For example, for the first DUT  105 , the test signal  203  and ACK signal  215   a  are conveyed via a shared, or common, wired signal path  252   a.  (Similarly, the test signals  204 ,  205 ,  206  to and ACT signals  215   b,    215   c,    215   d  from the remaining DUTs  106 ,  107 ,  108  are conveyed via respective shared wired signal paths  252   b,    252   c,    252   d. ) Each of the signals  213   a,    213   b,    213   c,    213   d  from the switching or attenuation circuits  212   a,    212   b,    212   c,    212   d  is conveyed via a respective wired signal path  254   a,    254   b,    254   c,    254   d  to additional signal routing circuitry  250   a,    250   b,    250   c,    250   d  (discussed in more detail below) to be conveyed over the wired DUT signal paths  252   a,    252   b,    252   c,    252   d  as the respective test signals  203 ,  204 ,  205 ,  206 . The responsive ACK signals  215   a,    215   b,    215   c,    215   d  are conveyed in return via the wired DUT signal paths  252   a,    252   b,    252   c,    252   d  to the routing circuitry  250   a,    250   b,    250   c,    250   d  for conveyance via a respective output signal path  256   a,    256   b,    256   c,    256   d  to the ACK signal detection circuits  214   a,    214   b,    214   c,    214   d.    
         [0042]    This additional signal routing circuitry  250   a,    250   b,    250   c,    250   d  can be implemented in a variety of forms, in accordance with techniques well known in the art. For example, such routing circuitry  250   a/b/c/d  can be implemented as a 1:2 signal divider, or splitter, in which case the responsive ACK signals  215   a/b/c/d  is divided and provided via the corresponding output signal path  256   a/b/c/d,  albeit as a lower powered version  251   a/b/c/d  of the original ACK signal. Alternatively, such routing circuitry  250   a/b/c/d  can be implemented as a signal coupler providing a coupled version of the responsive ACK  215   a/b/c/d  at the corresponding output signal port  256   a/b/c/d.  Further alternatively, such routing circuitry  250   a/b/c/d  can be implemented as a signal switch controlled in accordance with a control signal (not shown) such that during transmission of the test signal  111  by the VSG  101  corresponding signal paths  254   a/b/c/d  and  252   a/b/c/d  are connected, while during the time intervals in which the DUTs  105 ,  106 ,  107 ,  108  are expected to respond corresponding signal paths  252   a/b/c/d  and  256   a/b/c/d  are connected. 
         [0043]    Various other modifications and alterations in the structure and method of operation of this invention will be apparent to those skilled in the art without departing from the scope and the spirit of the invention. Although the invention has been described in connection with specific preferred embodiments, it should be understood that the invention as claimed should not be unduly limited to such specific embodiments. It is intended that the following claims define the scope of the present invention and that structures and methods within the scope of these claims and their equivalents be covered thereby.
System and method for facilitating testing of multiple data packet signal transceivers involving data-packet-signal replication and one or more status signals indicating successful and unsuccessful receptions of confirmation signals. Based upon the one or more status signals, one or more control signals cause the replicated data packet signals to be distributed to the devices under test (DUTs) such that, following successful and unsuccessful receptions of confirmation signals, corresponding replicated data packet signals are caused to fail to conform in part or to conform, respectively, with a predetermined data packet signal standard.