CROSS-REFERENCE TO RELATED APPLICATIONS 
     This application claims the benefit of U.S. Provisional Application No. 60/633,101, titled “Vertical Cavity Surface Emitting Laser with Integrated Electrostatic Discharge Protection” filed Dec. 3, 2004, which is incorporated herein by reference. 
    
    
     BACKGROUND OF THE INVENTION 
     1. The Field of the Invention 
     The invention generally relates to electrostatic discharge (ESD) protection for vertical cavity surface emitting lasers (VCSELs). More specifically, the invention relates to electrostatic discharge protection using integrated protective devices. 
     2. Description of the Related Art 
     Semiconductor devices have in recent times become nearly ubiquitous in their use. For example, semiconductor device are found in computer systems, televisions, radios, lighting control, amplifiers, etc. One particular area that semiconductors have found use is in light generating devices such as light emitting diodes (LEDs) and semiconductor lasers. One type of semiconductor laser is the vertical cavity surface emitting laser (VCSEL). VCSELs are formed on a semiconductor substrate by stacking a bottom distributed Bragg reflector (DBR) mirror on the substrate, an active region, including a pn diode junction, on the bottom DBR mirror and a top DBR mirror on the active region. Appropriate metal contacts are also formed on the VCSEL to provide contacts for applying appropriate bias and signal voltages. 
     One challenge that presents itself in semiconductor device use is the prevalence of electrostatic discharges (ESDs). ESDs result when static electricity builds up on one object and discharges into a second object at a different voltage potential. Static voltage potential differentials can be very high voltages, in the thousands of volts. ESDs through semiconductor junctions result in high peak current outputs that can damage or destroy the semiconductor devices. The rate of current rise can also cause current to pass through a semiconductor device in a normally non-conducting region, such as through oxide regions. This is due, in the oxide region case, to the capacitive nature of the oxide region and the alternating current like behavior of rising currents. Once current has passed through these non-conducting regions, the non-conducting regions may become at least partially conducting even for DC currents, creating a region where it becomes likely that the semiconductor will fail. 
     Several models exist for describing ESDs, including namely human, machine and charged device models. Each of these models is used to illustrate different impedances that may exist in the sources of an ESD. These three models are illustrated in  FIGS. 1A ,  1 B, and  1 C which illustrate the human, machine and charged devices models respectively. 
     Referring now to  FIG. 1A , the human ESD model is illustrated.  FIG. 1A  illustrates a direct current (DC) power source  102 . At a time t 1 , a switch  104  is closed to charge a capacitor  106 . This models a static charge build-up. In actual practice, a charge may build up on an object when objects, especially when the objects are made of plastic or rubber materials, are rubbed against each other. When one object has more positively or negatively charged particles than another, there is a voltage between the two objects. With static charge build-up, this voltage may vary from zero to very high voltages in the thousands of volts or more. At a time t 2 , the switch  104  opens leaving a static charge on the capacitor  106 . 
     In the human ESD model shown in  FIG. 1A , various impedances are modeled. For example,  FIG. 1A  illustrates a resistor  108  which models the natural electrical resistance of the human body to current flow. In DC circuits, the resistor  108  provides a constant impedance to the DC current. A typical value for resistance of the human body is about 1500Ω. The human body model further includes an inductor  110 . The inductor  110  represents inductances that exist in a discharge path such as through the leads of an object that is an electronic component, or through other electrical paths. Inductance impedes DC current flow according to an exponential relationship varying over time. As time increases from when a DC voltage is first applied to the inductor, the impedance from the inductor decreases. Illustratively, in the human model, at time t 3 , the charge built up on the capacitor  106  is discharged through a component  112  through the resistor  108  and the inductor  110  by closing a switch  114 . The impedance of the resistor  108  and inductor  110  provides some protection to the component  112 . However, depending on the type of component  112 , the voltages and currents developed through the component  112  may cause irreparable harm. 
     A case more severe than the human discharge model shown in  FIG. 1A  is the machine discharge model shown in  FIG. 1B . This model is similar to the human discharge model except that the resistor  108  of  FIG. 1A  is absent. This model represents an object with a charge build-up coming in direct contact with an object, such as a metal plane or other surface with a different charge. The charge build up discharges through the component  112  through the inductor  110  which represents inductances that exist in a discharge path such as through the leads of an electronic component or through other electrical paths. In the machine discharge model, the inductor  110  limits some of the severity of the discharge into the component  112 . 
     Yet an even more severe case is the charged device discharge model illustrated in  FIG. 1C . In this model, there is neither a resistor nor an inductor to protect the component  112 . Thus lower voltage may cause severe damage to the component  112  when an electrostatic discharge discharges through the component  112 . 
     Exposure to ESDs is one very common cause of VCSEL failure. Further, the smaller an aperture of emission in the VCSEL, the lower the amount of ESD voltage a VCSEL can withstand. As an example, a VCSEL with a aperture diameter of about 5 microns may be damaged when ESD levels are on the order of about 100V using the human ESD model. Smaller apertures are often used in single mode VCSELs. Thus single mode VCSELs may be more susceptible to ESDs than other types of VCSELs 
     To protect devices from electrostatic discharge, external components may be used to limit the amount of current through a component or to provide an alternate path for the discharge. However, using external components significantly increases the total size of packaging needed. This may be less desirable when there is a need or advantage to having smaller component packaging. Therefore, what would be new and useful is electrostatic discharge protection that can be implemented without significantly increasing the size of components. 
     BRIEF SUMMARY OF THE INVENTION 
     One embodiment includes a semiconductor device constructed as a monolithic structure. The monolithic structure includes; a vertical cavity surface emitting laser (VCSEL); and a protection diode coupled to the VCSEL. The protection diode cathode is electrically coupled to the VCSEL anode and the protection diode anode is electrically coupled to the VCSEL cathode. This construction provides electrostatic discharge (ESD) protection to the VCSEL. 
     Another embodiment includes a method of manufacturing a semiconductor device. The method includes forming a monolithic structure. Forming the monolithic structure includes forming a vertical cavity surface emitting laser (VCSEL). The method further includes forming a protection diode coupled to the VCSEL. The protection diode cathode is electrically coupled to the VCSEL anode. The protection diode anode is electrically coupled to the VCSEL cathode so as to provide electrostatic discharge (ESD) protection to the VCSEL. 
     Another embodiment includes a semiconductor device. The semiconductor device is formed as a monolithic structure. The monolithic structure includes a vertical cavity surface emitting laser (VCSEL). The monolithic structure further includes a photodiode connected to the VCSEL. The photodiode is located in the vertical axis with the VCSEL. The monolithic structure further includes a protection diode removed from the vertical axis. The protection diode is connected to the VCSEL. The protection diode cathode is electrically connected to the VCSEL anode and the protection diode anode is electrically connected to the VCSEL cathode so as to provide electrostatic discharge (ESD) protection to the VCSEL. 
     Advantageously, the embodiments described above provide ESD protection to VCSEL devices by using monolithically formed protection diodes. By forming the protection diodes monolithically with the VCSELs, cost can be reduced as the need for additional external components to provide ESD protection is obviated. Additionally, by including the protection diode monolithically with the VCSEL, package size may be reduced in some embodiments as compared to applications where external protection diodes are used. 
     These and other advantages and features of the present invention will become more fully apparent from the following description and appended claims, or may be learned by the practice of the invention as set forth hereinafter. 
    
    
     
       BRIEF DESCRIPTION OF THE SEVERAL VIEWS OF THE DRAWINGS 
       In order that the manner in which the above-recited and other advantages and features of the invention are obtained, a more particular description of the invention briefly described above will be rendered by reference to specific embodiments thereof which are illustrated in the appended drawings. Understanding that these drawings depict only typical embodiments of the invention and are not therefore to be considered limiting of its scope, the invention will be described and explained with additional specificity and detail through the use of the accompanying drawings in which: 
         FIG. 1A  illustrates a human discharge model; 
         FIG. 1B  illustrates a machine discharge model; 
         FIG. 1C  illustrates a charged device discharge model; 
         FIG. 2  illustrates one embodiment of a monolithic structure that includes electrostatic discharge (ESD) protection; and 
         FIG. 3  illustrates another embodiment of a monolithic structure that includes electrostatic discharge (ESD) protection. 
     
    
    
     DETAILED DESCRIPTION OF THE INVENTION 
     One exemplary embodiment includes a monolithic structure that includes ESD protection. The ESD protection may be provided by a Zener diode. The Zener diode may be included as a pn junction formed, in one embodiment, monolithically above or below the VCSEL. Alternatively, in another embodiment, the Zener diode is formed in a layers formed monolithically near the VCSEL layers, but the Zener diode is formed in a region not directly above or below the VCSEL. This second exemplary embodiment allows for characteristics of the Zener diode to be controlled by controlling the physical shape of the Zener diode. 
     Referring now to  FIG. 2 , an illustrative example of one embodiment is shown.  FIG. 2  illustrates an epitaxial view of a monolithic structure  200  that includes a VCSEL  202  and protective diode  204 . The VCSEL  202  and protective diode  204  are formed on a substrate  206 . In the example shown, the VCSEL  202  includes a top mirror  208  which in this example is a p type mirror. The VCSEL  202  further includes and an n type bottom mirror  210 . The top and bottom mirrors  208 ,  210  are distributed Bragg reflector (DBR) mirrors. DBR mirrors are formed from alternating layers of higher and lower index of refraction materials causing refraction so as to create highly reflective surfaces. The DBR mirrors  208 ,  210  form the laser cavity of the VCSEL  202 . Photons are produced in an active region  212 . Photons produced in the active region may be reflected in the cavity formed by the DBR mirrors  208 ,  210 . 
     In the example shown in  FIG. 2 , a protective diode  204  is formed axially in the vertical axis with the VCSEL  202 . The vertical axis, as used herein refers to the axis running substantially perpendicular to the DBR mirror layers. While the VCSEL  202  may be rotated in various orientations so that different axis are vertical, for convenience and consistency with common descriptions of VCSELs, the above definition of vertical axis will be used herein. 
     The protective diode  204  shown in  FIG. 2  includes a heavily doped p layer  214  and a heavily doped n layer  216 . In one embodiment, the heavily doped n layer may be doped on the order of 10 18  to 10 19  atoms/cm 3 . An example of a monolithic structure including a diode formed below a VCSEL is described in U.S. patent application Ser. No. 10/877,915 titled Light Emitting Device With an Integrated Monitor Photodiode, which is incorporated herein in its entirety. 
     As is illustrated in  FIG. 2 , various interconnections are made so as to create an appropriate circuit topology for protecting the VCSEL  202 . The embodiment shown in  FIG. 2  is a two terminal device meaning that two leads  218 ,  220  are externally accessible for providing bias and signal voltages to the VCSEL  202 . A first lead  218  is connected to the VCSEL  202  anode through a metal deposition contact  222  formed on or near the p type DBR mirror  208 . A second lead  218  is connected to the VCSEL  202  cathode and the protection diode  204  anode through a metal deposition contact  224  which forms a common connection at the n type DBR mirror  210  of the VCSEL and the p+ layer  214  of the protection diode  204 . 
     A common connection  226  is shown between the cathode of the protection diode  204  and the anode of the VCSEL  202 . This common connection may be accomplished in several different ways. For example, metal depositions may be used in the fabrication process to form the common connection  226 . Alternatively, wire bonding may be used to connect a metal deposition  228  formed on the under side of the substrate  206  to the metal deposition contact  222  formed on or near the p type DBR mirror  208 . In yet another embodiment, the device shown in  FIG. 2 , while shown as a two terminal device, may be a three terminal device with a lead connected to the metal deposition  228  formed on the underside of the substrate. In the latter example, the common connection  226  between the protection diode  204  anode and the VCSEL  202  cathode may be formed using an external jumper. 
     Various advantages may be realized by implementing the common connection  226  in the different fashions illustrated above. For example, when the common connection  226  is made internally, such as when metal depositions or wire bonds are used, the device shown in  FIG. 2  may be constructed as a two terminal ESD protected VCSEL. Using two terminals allows for smaller packaging and reduced construction cost as compared to devices with more terminals. In contrast, when the device shown in  FIG. 2  is constructed as a three terminal device, various other advantages are available. For example the external common connection  226  may be removed after the component is installed or at other times when there is a lower risk of ESD damage. This would allow the protection diode  204  to be used as an integrated monitor photodiode such as the integrated monitor photodiode illustrated in the U.S. patent application Ser. No. 10/877,915, titled Light Emitting Device With an Integrated Monitor Photodiode previously cited herein. 
     While in the example shown in  FIG. 2 , the protection diode  204  is illustrated as being formed axially in the vertical axis directly below the VCSEL  202 , other configurations may also be implemented. In particular,  FIG. 3  illustrates an example when the protection diode  204  is formed in a region not directly under the VCSEL  202  in the vertical axis. By forming the protection diode  204  in a region removed from the VCSEL  202  there is more flexibility in controlling characteristics of the protection diode  204 . For example, characteristics of the protection diode  204  can be controlled by controlling the size and shape of the protection diode  204 . In the embodiment illustrated in  FIG. 3 , an n+ layer  216  and a p+ layer  214  are formed on a substrate  206 . A VCSEL  202  is formed on the p+ layer  214 . As a part of forming the protection diode  204 , an isolation barrier  230  is formed or implanted in the n+ layer  216  and the p+ layer  214 . The isolation barrier  230  is used to define the edges, and thus the size of the protection diode  204 . 
     To provide ESD protection using the protection diode  204 , the anode of the protection diode  204  is connected to the cathode of the VCSEL  202  by using a common connection  226  to connect the metal deposition  206  formed on the underside of the substrate to the metal deposition  222  formed on the top of the VCSEL  202 . The cathode of the protection diode  204  is connected to the anode of the VCSEL through a common connection  236 , which connects the metal deposition  238  formed on the p type layer  214  of the protection diode  204  to the metal deposition  224  which is electrically connected to the bottom of the VCSEL  204 . 
     A reverse biased ESD traveling in a reverse bias direction  234 , on the VCSEL  202  will pass through the protection diode  204 . This is because in the reverse bias direction  234 , the path through the forward biased protection diode  204  is an easier path to travel. This provides reverse bias ESD protection to the VCSEL  204 . Reverse bias ESDs are among the most harmful ESDs to VCSEL junctions. 
     In many embodiments, it is beneficial to tailor the protection diode  204  to optimize it for use in protecting the VCSEL  202  from forward biased ESDs. For example, the VCSEL  202  may be designed such that it has a voltage drop of 1.5 volts and an in-line impedance of about 20 to 200Ω. When the protection diode  204  is fabricated using a design similar to one used for an integrated photodiode, such as those illustrated in U.S. patent application Ser. No. 10/877,915 titled Light Emitting Device With an Integrated Monitor Photodiode previously cited herein, the protection diode  204  may have a reverse bias breakdown voltage, a voltage where current flows somewhat freely in the reverse bias direction shown as direction  232 , of around 30V. Thus, while the protection diode  204  may provide some protection from forward biased ESDs onto the VCSEL  202 , damage may still result to the VCSEL  202  because current is not significantly sourced away from the VCSEL  202  below 30V. 
     One way of optimizing the protection diode  204  for better protection of the VCSEL is by increasing the doping in the n type layer such that it is heavily doped. Such doping may be for example in the range of 10 18  to several times 10 19  atoms per cm 3 . Higher doping in the n type layer correlates directly to lower breakdown voltages in the protection diode  204 . In one embodiment, it may be desirable to design a protection diode with a breakdown voltage of about 3V, and a series resistance of about 20Ω or less. The protection diode  204 , in this example, functions as a Zener diode. 
     While the protection diode  204  has been optimized for use in protecting the VCSEL  202 , it may also be used as a monitor photodiode when the need for ESD protection has been reduced or abated. As described above, a three terminal device may include ESD protection functionality and photodiode monitoring functionality depending on the interconnection (or non-interconnection) of the terminals. 
     While not explicitly shown here, other embodiments of the invention may also be implemented. For example, by using a semi-insulating layer and appropriate interconnections, a structure may be implemented that includes a VCSEL, a protection diode, and a photodiode. The VCSEL in this embodiment may be implemented in a fashion as shown in  FIGS. 2 and 3 . The protection diode may be implemented in a location similar to the location shown for the protection diode in  FIG. 3 . The photodiode may be implemented in a location similar to where the protection diode is shown in  FIG. 2 . As mentioned previously, to implement this embodiment, the epitaxial structure would be similar to those shown in  FIGS. 2 and 3  except that a semi-insulating layer may be used below the n type layer  216 . Additionally, the metal deposition  228  may include discontinuities to separate the photodiode and protection diode. Also, various other interconnections, whether formed by wire-bonding, metal depositions, or otherwise may be needed to appropriately interconnect the diodes to provide the VCSEL protection and photodiode functionality. 
     Additionally, while the VCSELs shown in the drawings herein are shown as mesa structure VCSELs, other types of VCSELs may be implemented. For example, proton implant VCSELs, oxide VCSELs and the like may be protected using the techniques illustrated herein. 
     The present invention may be embodied in other specific forms without departing from its spirit or essential characteristics. The described embodiments are to be considered in all respects only as illustrative and not restrictive. The scope of the invention is, therefore, indicated by the appended claims rather than by the foregoing description. All changes that come within the meaning and range of equivalency of the claims are to be embraced within their scope.
An electrostatic discharge (ESD) protected semiconductor device. The semiconductor device is formed as a monolithic structure. The monolithic structure includes a vertical cavity surface emitting laser (VCSEL) and a protection diode. The protection diode cathode is electrically coupled to the VCSEL anode and the protection diode anode is electrically coupled to the VCSEL cathode so as to provide ESD protection to the VCSEL.