BACKGROUND OF THE INVENTION 
     1. Field of the Invention 
     The present invention relates generally to electronic circuits and, more particularly, to an improved sense amplifier. 
     2. Related Art 
     Sense amplifiers are widely used in many types of applications to detect and amplify signals. For example, sense amplifiers are used to detect signals generated by memory cells or by an array of logic gates, such as to produce the logical OR result (i.e., sum of products term) at the output terminals of a logical AND array. FIG. 3 illustrates an exemplary conventional sense amplifier  300 . 
     One drawback of conventional sense amplifiers is their sensitivity to the semiconductor process variation referred to as threshold voltage mismatch (Vt mismatch). If the threshold voltage mismatch becomes excessive, the sense amplifier will not function properly (e.g., circuit failure) and can produce an erroneous output signal. 
     Another drawback of conventional sense amplifiers is the high source current that flows through the sense amplifier under certain conditions (e.g., as the source voltage increases). The high source current results in numerous problems, such as high substrate current, poor latch-up, and hot carrier injection issues for one or more components of the sense amplifier. If the sense amplifier is biased to limit this undesirable high current flow, the switching speed of the sense amplifier is degraded. 
     As a result, there is a need for a sense amplifier that is more tolerant to threshold voltage mismatch without requiring excessive source current or resulting in a severe degradation in speed. 
     BRIEF SUMMARY OF THE INVENTION 
     The present invention provides a sense amplifier that mitigates the affect of threshold voltage mismatch while limiting the amount of source current through the sense amplifier. 
     In accordance with one embodiment, a sense amplifier circuit includes input terminals and a pair of inverting buffers coupled to the input terminals and having output terminals. A resistive element is coupled between the output terminals. One or more gain stages follow the inverting buffer pair and condition and amplify the output signal on one of the output terminals to provide an output signal of the sense amplifier. A circuit is coupled to a gain stage to limit the amount of current flowing through it. 
     In accordance with another embodiment, a method of mitigating threshold voltage mismatch in a sense amplifier includes providing a sense amplifier having a first and a second input terminal coupled to a pair of inverting buffers providing a first and a second output terminal. The sense amplifier further includes a first amplifier coupled to the second output terminal and adapted to provide an output signal of the sense amplifier through a second amplifier. The method further includes coupling a resistive element having a first and second end across the first and second output terminal, with the first end coupled to the first output terminal and the second end coupled to the second output terminal. The method may further include coupling a circuit to the first amplifier to limit the amount of current flowing through the first amplifier. 
    
    
     A more complete understanding of the present invention will be afforded to those skilled in the art, as well as a realization of additional advantages thereof, by a consideration of the following detailed description of one or more embodiments. Reference will be made to the appended sheets of drawings that will first be described briefly. 
     BRIEF DESCRIPTION OF THE DRAWINGS 
     FIG. 1 is a schematic diagram illustrating a sense amplifier in accordance with an embodiment of the present invention. 
     FIG. 2 is a block diagram illustrating an exemplary application of a sense amplifier in accordance with an embodiment of the present invention. 
     FIG. 3 is a schematic diagram illustrating a conventional sense amplifier. 
    
    
     The various exemplary embodiments of the present invention and their advantages are best understood by referring to the detailed description that follows. It should be understood that exemplary embodiments are described herein, but that these embodiments are not limiting and that numerous modifications and variations are possible in accordance with the principles of the present invention. In the drawings, like reference numerals are used to identify like elements illustrated in one or more of the figures. 
     DETAILED DESCRIPTION OF THE INVENTION 
     FIG. 1 is a schematic diagram illustrating sense amplifier  100  in accordance with an embodiment of the present invention and FIG. 2 is a block diagram  200  illustrating an exemplary application of a sense amplifier  100  in accordance with an embodiment of the present invention. Block diagram  200  (FIG. 2) shows a number of input lines  202 ,  204 ,  206 , and  208  that connect respectively to gate terminals of transistors  210 ,  212 ,  214 , and  216 . Input lines  202  through  208  may represent, for example, output terminals from an array of logic gates, such as an array of AND gates, or lines from input/output pins or a global routing pool. Transistors  210  through  216  function as switches to connect terminal “pt” (product term)  102  to terminal “ptg” (product term ground)  134  if a logic “high” signal level is supplied by the corresponding input line  202  through  208 . 
     In operation, sense amplifier  100  and transistors  210 - 216  function as a logical OR gate by producing a logic “high” output signal at terminal  132  if one or more of input lines  202  through  208  provide a logic “high” input signal. Otherwise, a logic “low” output signal is provided at terminal  132 . If terminal  102  is connected to terminal  134  by one or more of transistors  210  through  216 , current will flow from terminal  102  to terminal  134 , resulting in greater equalization of the voltages across terminals  102  and  134 . 
     Referring to FIG. 1, sense amplifier  100  includes terminal  102 , a terminal  134 , a terminal “ptgref” (product term ground reference)  136 , a terminal “ccref” (circuit current reference)  144 , and a terminal “senout” (sense amplifier output)  132 . Terminal  102  is coupled to gate terminals of p-type transistors  112  and  116  and n-type transistors  114  and  118 . A supply voltage Vcc is coupled to source terminals of transistors  112  and  116 , whose drain terminals are coupled to drain terminals of transistors  114  and  118 , whose source terminals are coupled to terminal  134 . 
     Transistors  112  and  114  function as an inverting buffer and produce an output signal at a node “fb” (feedback)  110 , while transistors  116  and  118  also function as an inverting buffer and produce an output signal at a node “d 0 ”  120 . In order for sense amplifier  100  to function properly, the voltage levels at node  110  and node  120  should be approximately equal. However, due to differences in the threshold voltage between the buffer pair formed by transistors  112  and  114  and transistors  116  and  118 , the voltage levels at node  110  and node  120  may differ enough to cause sense amplifier  100  to not function properly. To compensate for a potential voltage difference between the inverters at node  110  and node  120 , a resistor  140  is coupled between node  110  and node  120 . Resistor  140 , for example, is a high resistance poly-silicon resistor that mitigates the voltage difference between node  110  and node  120  caused by threshold voltage mismatch between the inverters. 
     Transistors  112  and  114  provide an output signal through node  110 , which is received by gate terminals of transistors  106  and  108 . Transistor  106  is an n-type transistor whose drain terminal is coupled to supply voltage Vcc and whose source terminal is coupled to terminal  102  and to source terminal of transistor  108 , a p-type transistor, whose drain terminal is coupled to ground. Transistors  106  and  108  receive the output signal from transistors  112  and  114  and provide a feedback signal on terminal  102  to maintain transistors  112 ,  114 ,  116 , and  118  near their switch point and biased for maximum switching speed. 
     A p-type transistor  104  further biases sense amplifier  100  by providing a current source at terminal- 102 . The source terminal of transistor  104  is coupled to source voltage Vcc, while the gate terminal is coupled to terminal  134  and the drain terminal is coupled to terminal  102 . An n-type transistor  138 , whose gate terminal is coupled to terminal  136 , drain terminal is coupled to terminal  134 , and source terminal is coupled to ground, functions as a current source to limit the amount of current flowing from terminal  102  and transistors  114  and  118  to terminal  134 . A reference voltage is applied to the gate terminal of transistor  138  to bias transistor  138 . 
     Node  120  is coupled to gate terminals of a p-type transistor  122  and an n-type transistor  124 , which form an inverting buffer and provide an output signal at node “d 1 ”  126  that is coupled to the drain terminals of transistors  122  and  124 . Node  126  is also coupled to the gate terminals of a p-type transistor  128 and an n-type transistor  130 , which form another inverting buffer and provide an output signal at terminal  132  that is coupled to the drain terminals of transistors  128  and  130 . Supply voltage Vcc is coupled to the source terminals of transistors  122  and  128 , with the source terminal of transistor  130  coupled to ground. Transistor  124  has its source terminal coupled to a current limiting circuit  142 . Transistors  122  and  124  and transistors  128  and  130  form inverter gain stages to ultimately provide a logic “low” or logic “high” signal at terminal  132  depending upon the signal level at node  120 . 
     Current limiting circuit  142  limits the amount of current that flows through the buffer formed by transistors  122  and  124 . Current limiting circuit  142  includes p-type transistors  146  and  156 , whose source terminals are coupled to supply voltage Vcc and whose drain terminals are coupled together. Terminal  144  is coupled to the gate terminal of transistor  146 , while the output terminal of inverting buffer  158 , whose input terminal is coupled to terminal  132 , is coupled to the gate terminal of transistor  156 . A reference voltage is applied to terminal  144  to bias transistor  146 . 
     An n-type transistor  148  has its drain terminal coupled to the drain terminal of transistor  146 , its gate terminal coupled to the output terminal of inverter  158 , and its source terminal coupled to the drain terminal of an n-type transistor  150 . Transistor  150  has its gate terminal coupled to node  120  and its source terminal coupled to the drain terminal of an n-type transistor  152  and to the source terminal of transistor  124 . Transistor  152  has its source terminal coupled to ground and its gate terminal coupled to the drain terminal of transistor  156 . A capacitor  154  is coupled across the drain and gate terminals of transistor  152  to assist in the switching of the inverting buffer formed by transistors  122  and  124 . 
     In operation, sense amplifier  100  functions as a differential amplifier and detects a signal applied across terminal  102  and terminal  134  that results in current flowing from terminal  102  and/or through transistors  112 - 118  towards terminal  134 . If the voltage across node  102  and  134  is large, sense amplifier  100  provides a logic “low” signal level at terminal  132 . Otherwise, sense amplifier  100  provides a logic “high” signal level at terminal  132 . 
     Current limiting circuit  142  monitors and limits the current flowing through the buffer formed by transistors  122  and  124  by monitoring the gate-to-source voltage (Vgs) of transistor  124 . For example, when the voltage across nodes  102  and  134  is large (resulting in a logic “low” signal level at terminal  132 ), excessive current may begin to flow through transistor  124  due to the voltage level at node  120  increasing towards supply voltage Vcc. Because transistor  150  shares the same gate-to-source voltage as transistor  124 , current limiting circuit  142  detects the increase in the amount of current flowing through transistor  124  (i.e., increasing voltage level at node  120 ). As the amount of current increases in transistor  124 , the amount of current through transistor  150  will also increase. As this occurs, transistor  150  draws a larger current from transistor  146 , which acts as a current reference device and is controlled by an input reference signal at terminal  144 . Consequently, as transistor  150  draws more current than transistor  146  is biased to supply, the gate-to-source voltage of transistor  152  will then decrease, which increases the resistance of transistor  152  and limits the amount of current that is allowed to flow through transistor  124 . 
     Current limiting circuit  142  improves the speed of sense amplifier  100  by permitting the voltage level at node  120  to be biased higher without resulting in excessive current flow through transistors  122  and  124 , even during undesirable processing, temperature, or voltage conditions. The higher bias voltage improves the speed of sense amplifier  100 . Current limiting circuit  142  is not required when the voltage across terminals  102  and  134  is small (resulting in a logic “high” signal level at terminal  132 ). Therefore, inverting buffer  158  functions to effectively turn off the current limiting function of current limiting circuit  142 , while also applying supply voltage Vcc to the gate terminal of transistor  152  (by switching on transistor  156 ), which switches on transistor  152  to provide minimum resistance and a stable low voltage level (i.e., Vss or ground voltage level) at node  126  through transistor  124 . 
     It should be understood that a sense amplifier in accordance with the principles of the present invention is not limited to the embodiment illustrated in FIG.  1 . For example, in accordance with an embodiment of the present invention, a sense amplifier may include resistor  140 , but not include current limiting circuit  142 , with the source terminal of transistor  124  coupled to ground. Alternatively, a sense amplifier may include current limiting circuit  142 , but not include resistor  140 . 
     Embodiments described above illustrate but do not limit the invention. It should also be understood that numerous modifications and variations are possible in accordance with the principles of the present invention. Accordingly, the scope of the invention is defined only by the following claims.
A sense amplifier is provided that mitigates the effect of threshold voltage mismatch within the sense amplifier. The sense amplifier has an inverter pair coupled to the input terminals, with a resistive element coupled across output terminals of the inverter pair. Inverter gain stages following the inverter pair are coupled to a current limiting circuit to monitor and limit the current flowing through the inverter gain stage immediately following the inverter pair. The current limiting circuit allows the sense amplifier to be biased such that speed is improved while limiting power dissipation to acceptable levels, even under undesirable process, temperature, and power supply variations.