CROSS-REFERENCE TO RELATED APPLICATION 
       [0001]    This application is a divisional application of, and claims the priority benefit of, U.S. application Ser. No. 10810,436 filed on Mar. 25, 2004. The entirety of the above-mentioned patent application is hereby incorporated by reference herein and made a part of this specification. 
     
    
     BACKGROUND OF THE INVENTION 
       [0002]    1. Field of the Invention 
         [0003]    This invention generally relates to a chip package and a process thereof, and more particularly to a chip package having a rigid cover on the active surface of the chip and a process thereof. 
         [0004]    2. Description of Related Art 
         [0005]    In the semiconductor industry, integrated circuit (IC) manufacturing includes 3 steps—design, process, and packaging. Chips are manufactured by the steps of making wafer, designing the circuit, making the mask, sawing the wafer and so on. Each chip is electrically connected to the external circuit via the bond pads on the chip. Then the insulating material is optionally used to package the chip. The purposes of packaging are to protect the chip from moisture, heat and noise, and to provide the electrical connection between the chip and the external circuit such as printed circuit board (PCB) or other carriers. 
         [0006]    As the IC packaging technology advances, the package is getting smaller. Among the IC packaging types, chip scale package (CSP) is one of the package technologies that the length of the package is smaller than 1.2 times of the length of the chip inside the package, or (the chip area/package area) is smaller than 80% while the pitch of the pins of the package is smaller than 1 mm. Based on the material and the structures, CSP includes rigid interposer type, flex interposer type, custom lead frame type, wafer level type and so on. 
         [0007]    Unlike the packaging technology for single chip, the wafer level package focuses on packaging wafer in order to simplify the chip packaging process. Hence, after the integrated circuits have been manufactured on the wafer, the whole wafer can be packaged. Then the wafer sawing can be performed to form a plurality of chips from the wafer. 
       SUMMARY OF THE INVENTION 
       [0008]    An object of the present invention is to provide a chip package having a better structural strength, thermal conductive efficiency, and anti-electromagnetic interference ability. 
         [0009]    The present invention provides a chip package, comprising a chip and a rigid cover. The chip has a plurality of bond pads formed thereon. The rigid cover is located on the chip and has a plurality of openings formed therein, wherein the openings expose the bond pads on the chip respectively. 
         [0010]    In a preferred embodiment, the chip package further comprises an adhesive layer disposed between the chip and the rigid cover, wherein the rigid cover is adhered to the chip via the adhesive layer. 
         [0011]    In a preferred embodiment, the chip package further comprises a plurality of contacts electrically connected to the bond pads respectively. 
         [0012]    In a preferred embodiment, the contacts include conductive bumps. 
         [0013]    In a preferred embodiment, the contacts are connected to the PCB. 
         [0014]    In a preferred embodiment, the heights of the contacts relative to a top surface of the chip are larger than the height of the rigid cover to the top surface. 
         [0015]    In a preferred embodiment, the chip includes a redistribution layer on the chip to form the bond pads. 
         [0016]    In a preferred embodiment, the material of the rigid cover includes a conducting material, an insulating material, or a transparent material. 
         [0017]    In a preferred embodiment, the bond pads are disposed on the chip as an array. 
         [0018]    In a preferred embodiment, the bond pads are disposed in an interior region of the chip. 
         [0019]    According to the chip package and the process thereof, a rigid cover is disposed on the active surface of the chip to protect the active surface of the chip and enhance the structural strength of the chip package. Further, if the material of the rigid cover is a thermal conductive material such as Cu or Al alloy, the heat-spread ability of the chip package can be enhanced. If the rigid cover is made of an electrical conductive material and electrically connected to the ground of the chip package, the electromagnetic interference (EMI) to the chip package can be reduced. It should be noted that the chip packaging process could form a plurality of the terminal pads on the backside of the chip so that the chip package can be connected to the PCB or substrate via these terminal pads. 
         [0020]    The above is a brief description of some deficiencies in the prior art and advantages of the present invention. Other features, advantages and embodiments of the invention will be apparent to those skilled in the art from the following description, accompanying drawings and appended claims. 
     
    
     
       BRIEF DESCRIPTION OF THE DRAWINGS 
         [0021]      FIG. 1A  is a top view of the first chip package in accordance with the first embodiment of the present invention. 
           [0022]      FIG. 1B  is a cross-sectional view of the first chip package of  FIG. 1A  along I-I′ line. 
           [0023]      FIG. 1C  is a cross-sectional view of the first chip package of  FIG. 1A  connected to a printed circuit board. 
           [0024]      FIG. 2A  is a top view of the second chip package in accordance with the first embodiment of the present invention. 
           [0025]      FIG. 2B  is a cross-sectional view of the second chip package of  FIG. 2A  along II-II′ line. 
           [0026]      FIG. 2C  is a cross-sectional view of the second chip package of  FIG. 2A  connected to a printed circuit board. 
           [0027]      FIGS. 3A-3F  show top views of the progression steps of the chip packaging process in accordance with the second embodiment of the present invention. 
           [0028]      FIGS. 4A-4F  show cross-sectional views of the chip packaging process of  FIGS. 3A-3F  along III-III′ line. 
           [0029]      FIG. 5  is a cross-sectional view of the chip package of  FIG. 3F  connected to a printed circuit board. 
           [0030]      FIG. 6  is a cross-sectional view of another chip package connected to a printed circuit board in accordance with a second embodiment of the present invention. 
       
    
    
     DESCRIPTION OF THE PREFERRED EMBODIMENTS 
       [0031]      FIG. 1A  is a top view of the first chip package in accordance with the first embodiment of the present invention.  FIG. 1B  is a cross-sectional view of the first chip package of  FIG. 1A  along I-I′ line. Referring to  FIGS. 1A and 1B , the chip package  100  includes a chip  110 , a rigid cover  120 , and an adhesive layer  130 . The chip  110  is one of a plurality of unsawed chips of the wafer (not shown). The chip  110  has a rectangular shape having an active surface  112  and a plurality of bond pads  114 . The bond pads  114  are disposed on the circumference of the active surface  112 . The periphery of the rigid cover  120  is adhered to the active surface  112  via the adhesive layer  130 . The bond pads  114  are disposed outside the periphery of the rigid cover  120 . 
         [0032]      FIG. 1C  is a cross-sectional view of the first chip package of  FIG. 1A  connected to a printed circuit board. Referring to  FIGS. 1A ,  1 B, and  1 C, a plurality of contacts  116  such as conductive bumps are disposed on the bond pads respectively. The heights of the contacts  116  relative to the active surface  112  are larger than the height of the rigid cover  120  relative to the active surface  112  so that the chip package  100  can be connected to the PCB  140  via the contacts  116 . The PCB  140  has a plurality of contact pads  142 . The bond pads  114  of the chip package  100  are electrically connected to the contact pads  142  of the PCB  140  via the contacts  116 . Further, one can control the heights of the contacts  116  relative to the active surface  112  or the height of the rigid cover  120  relative to the active surface  112  to optionally make the rigid cover  120  contact or not contact the PCB  140 . For thermal dissipation or electric characteristic consideration, the cover  120  can be structurally or electrically connected to the PCB  140 . In  FIGS. 1A-1C , the bond pads  114  are not limited to be disposed around the circumference of the active surface  112 . The bond pads can also be disposed on one side or two sides (adjacent or opposite) of the active surface. 
         [0033]      FIG. 2A  is a top view of the second chip package in accordance with the first embodiment of the present invention.  FIG. 2B  is a cross-sectional view of the second chip package of  FIG. 2A  along II-II′ line. Referring to  FIGS. 2A and 2B , the chip  210  of the second chip package  200  has a plurality of bond pads  214  disposed as an area array on the active surface  212 . The active surface  212  of the chip  210  has a redistribution layer (not shown), which can rearrange the bond pads  214  around the circumference of the active surface  212  with an area array. Further, the rigid cover  220  is adhered to the active surface  212  via the adhesive layer  230 . The rigid cover  220  has a plurality of openings  222  corresponding to the bond pads  214  and exposing the bond pads  214 . 
         [0034]      FIG. 2C  is a cross-sectional view of the second chip package of  FIG. 2A  connected to a printed circuit board. A plurality of contacts  216  is disposed on the bond pads  214  respectively. The heights of the contacts  216  relative to the active surface  212  is larger than the height of the rigid cover  220  relative to the active surface  212  so that the chip package  200  can be connected to the PCB  240  via the contacts  116 . The PCB  240  has a plurality of contact pads  242 . The bond pads  214  of the chip package  200  are electrically connected to the contact pads  242  of the PCB  240  via the contacts  216 . 
         [0035]    In the above first and second chip packages, the rigid covers completely cover the wafers. A plurality of contacts such as conductive bumps, is disposed on the bond pads respectively. Then the wafer is sawed to obtain independent chip packages. It should be noted that although the contacts can be formed before sawing the wafer, one may also choose to form the contacts on the contact pads of the PCB. Then the chip package can be connected to the PCB via these contacts. 
         [0036]    The second embodiment uses a plurality of connecting lines to extend the bond pads to the backside of the chip and to form the terminal pads on the backside of the chip. 
         [0037]      FIGS. 3A-3F  show top views of the progression steps of the chip packaging process in accordance with the second embodiment of the present invention.  FIGS. 4A-4F  show the cross-sectional views of the chip packaging process of  FIGS. 3A-3F  along III-III′ line. Referring to  FIGS. 3A and 4A , a wafer  302  is provided. The wafer  302  has an active surface  312  and a backside  316  corresponding to the active surface  312 . The wafer  302  has a first chip area  310   a  and a second chip area  310   b  adjacent to the first chip area  310   a.  The wafer  302  has a plurality of first and second bond pads  314   a  and  314   b  on the active surface  312  in the first and second chip areas  310   a  and  310   b  respectively. 
         [0038]    Referring to  FIGS. 3B and 4B , a plurality of through holes  318  are formed on the wafer  302 . The through holes  318  are through the wafer  302  by laser drilling or mechanical drilling and connect the active surface  312  and the backside  316 . The through holes  318  are arranged between the first chip area  310   a  and the second chip area  310   b.    
         [0039]    Referring to  FIGS. 3C and 4C , a plurality of first and second connecting lines  322   a  and  322   b  are formed on the wafer  302  by electroplating. Each of the first connecting lines  322   a  has a first end through one of the through holes  318  electrically connected to one of the first bond pads  314   a.  Each of the first connecting lines  322   a  has a second end extended to the backside  306  of the first chip area  310   a  to form one first terminal pad  324   a  on the backside  306  of the first chip area  310   a.  Each of the second connecting lines  322   b  has a first end through one of the through holes  318  electrically connected to one of the second bond pads  314   b.  Each of the second connecting lines  322   b  has a second end extended to the backside  306  of the second chip area  310   b  to form one second terminal pad  324   b  on the backside  306  of the second chip area  310   b.  It should be noted that because the first and second connecting lines  322   a  and  322   b  are formed on the wafer  302  by electroplating, portions of the first connecting lines  322   a  in the through holes  318  may be connected to portions of the second connecting lines  322   b  in the through holes  318  respectively. 
         [0040]    Referring to  FIGS. 3D and 4D , a first rigid cover  320   a  and a second rigid cover  320   b  are disposed on the active surface  312  of the first chip area  310   a  and the active surface  312  of the second chip area  310   b  via the adhesive layers  330  respectively. For thermal dissipation or electric characteristic consideration, the first and second rigid covers  320   a  and  320   b  can be a conducting material, an insulating material, and a transparent material. Further, the chip packaging process can be a wafer level packaging process. Hence, the first and second rigid covers  320   a  and  320   b  can be a single structure. That is, the first and second rigid covers  320   a  and  320   b  can be structurally connected via a connecting bar  320   c  or other connecting structures. Therefore, only a single action is required to dispose the first and second rigid covers  320   a  and  320   b  on the active surface  312 . 
         [0041]    Referring to  FIGS. 3E and 4E , the wafer  302  is sawed along an area between the first and second chip areas  310   a  and  310   b  by mechanical or laser sawing. The portions of the first connecting lines  322   a  in the through holes  318  and the portions of the second connecting lines  322   b  in the through holes  318  are also sawed. Hence, the lateral side of the chip  310  has a plurality of concave surfaces  318   a  (i.e., a half of the through holes  318 ). The portions of the first connecting lines  322   a  in the through holes  318  and the portions of the second connecting lines  322   b  in the through holes  318  are disposed on the concave surfaces  318   a  to electrically connect the bond pads  314  and the terminal pads  324 . Further, when the first and second rigid covers  320   a  and  320   b  is a single structure, the connecting bars  320   c  will be sawed to separate the first and second rigid covers  320   a  and  320   b.    
         [0042]    Referring to  FIGS. 3F and 4F , the first chip area  310   a  and the second chip area  310   b  are separated from the wafer  302  by mechanical or laser sawing. Hence, the first chip area  310   a  and the first rigid cover  32   a  become a first chip package  300   a,  the second chip area  310   b  and the second rigid cover  320   b  become a second chip package  300   b.    
         [0043]      FIG. 5  is a cross-sectional view of the chip package of  FIG. 3F  connected to a printed circuit board. The chip package  300  includes a chip  310 , a rigid cover  320 , and an adhesive layer  330 . The chip  300  has a rectangular shape and an active surface  312  and a plurality of bond pads  314 . The bond pads  314  are disposed on the circumference of the active surface  312 . A plurality of connecting lines  322  extend the bond pads  314  to the backside  316  of the chip  310  to form a plurality of the terminal pads  324 . The terminal pads  324  can be connected to the contact pads  342  of the PCB  340  via a pre-solder, ACP or ACF (not shown). 
         [0044]      FIG. 6  is the cross-sectional view of another chip package connected to a printed circuit board in accordance with the second embodiment of the present invention. Compared to  FIG. 5 , the chip  310  of the second chip package  300  has a plurality of terminal pads  324  disposed as an area array on backside  316  of the chip  310 . These terminal pads  324  can be connected to the contact pads  342  of the PCB  340  via the contacts  350  such as conductive bumps. 
         [0045]    The second embodiment uses a plurality of connecting lines to extend the bond pads to the backside of the chip and to form the terminal pads on the backside of the chip. Hence, when the chip is connected to the PCB, the active surface of the chip can be exposed. When the rigid cover is a transparent material, the chip package in the second embodiment can be applied in optical-electronic devices such as CMOS image sensor (CIS) and solar cell, or bio-chip. 
         [0046]    In brief, the chip package and the process thereof dispose a rigid cover on the active surface of the chip to protect the active surface of the chip and enhance the structural strength of the chip package. Further, if the material of the rigid cover is a thermally conductive material such as Cu or Al alloy, the heat-spread ability of the chip package can be enhanced. If the rigid cover is made of an electrical conductive material and electrically connected to the ground of the chip package, the electromagnetic interference (EMI) to the chip package can be reduced. If the rigid cover is a transparent material, the chip package can be applied in optic-electric or bio devices. In addition, the chip packaging process can form a plurality of the terminal pads on the backside of the chip so that the chip package can be connected to the PCB or substrate via these terminal pads. 
         [0047]    The above description provides a full and complete description of the preferred embodiments of the present invention. Various modifications, alternate construction, and equivalent may be made by those skilled in the art without changing the scope or spirit of the invention. Accordingly, the above description and illustrations should not be construed as limiting the scope of the invention which is defined by the following claims.
The chip package and the process thereof are disclosed. The chip package comprises a chip and a rigid cover. The chip has a plurality of bond pads formed thereon. The rigid cover is located on the chip and has a plurality of openings formed therein, wherein the openings expose the bond pads on the chip respectively.