text: * Books (chronological order):
  ** Tanner, Brian: X-ray diffraction topography. Pergamon Press (1976)..
  ** Authier, André and Lagomarsino, Stefano and Tanner, Brian K.  (editors): X-Ray and Neutron Dynamical Diffraction – Theory and Applications. Plenum Press / Kluwer Academic Publishers (1996). .
  ** Bowen, Keith and Tanner, Brian: High Resolution X-Ray Diffractometry and Topography. Taylor and Francis (1998). .
  ** Authier, André: Dynamical theory of X-ray diffraction. IUCr monographs on crystallography, no. 11. Oxford University Press (1st edition 2001/ 2nd edition 2003). .
  * Reviews
  ** Lang, A. R.: Techniques and interpretation in X-ray topography. In: Diffraction and Imaging Techniques in Materials Science (edited by Amelinckx S., Gevers R. and Van Landuyt J.) 2nd ed. rev. (1978), pp 623–714. Amsterdam: North Holland.
  ** Klapper, Helmut: X-ray topography of organic crystals. In: Crystals: Growth, Properties and Applications, vol. 13 (1991), pp 109–162. Berlin-Heidelberg: Springer.
  ** Lang, A. R.: Topography. In: International Tables for Crystallography, Vol. C (1992), Section 2.7, p. 113. Kluwer, Dordrecht.
  ** Tuomi, T: Synchrotron X-ray topography of electronic materials. Journal of Synchrotron Radiation (2002) 9, 174-178.
  ** Baruchel, J. and Härtwig, J. and Pernot-Rejmánková, P.: Present state and perspectives of synchrotron radiation diffraction imaging. Journal of Synchrotron Radiation (2002) 9, 107-114.
  * Selected original articles (chronological order):
  ** X-ray topography
  *** T. Tuomi, K. Naukkarinen, E. Laurila, P. Rabe: Rapid high resolution X-ray topography with synchrotron radiation. Acta Polytechnica Scandinavica, Ph. Incl. Nucleonics Series No. 100, (1973), 1-8.
  ** Special applications:
  ** Instrumentation and beamlines for topography: