text: In case of measuring the hydration rim using the depth profiling ability of the secondary ion mass spectrometry technique, the sample is mounted on a holder without any preparation or cutting. This method of measurement is non-destructive.
  There are two general SIMS modes: static mode and dynamic mode, depending on the primary ion current density, and three different types of mass spectrometers: magnetic sector, quadrupole and time-of-flight (TOF).
  Any mass-spectrometer can work in static mode (very low ion current, a top mono-atomic layer analysis), and dynamic mode (a high ion current density, in-depth analysis).
  Although relatively infrequent the use of SIMS on obsidian surface investigations has produced great progress in OHD dating. SIMS in general refers to four instrumental categories according to their operation; static, dynamic, quadrupole, and time-of-flight, TOF. In essence it is a technique with a large resolution on a plethora of chemical elements and molecular structures in an essentially non destructive manner. An approach to OHD with a completely new rationale suggests that refinement of the technique is possible in a manner which improves both its accuracy and precision and potentially expands the utility by generating reliable chronological data. Anovitz et al. presented a model which relied solely on compositionally-dependent diffusion, following numerical solutions (finite difference (FD), or finite element) elaborating on the H+ profile acquired by SIMS. A test of the model followed using results from Mount 65, Chalco in Mexico by Riciputi et al. This technique used numerical calculation to model the formation of the entire diffusion profile as a function of time and fitted the derived curve to the hydrogen profile. The FD equations are based on a number of assumptions about the behavior of water as it diffused into the glass and characteristic points of the SIMS H+ diffusion profile.
  In Rhodes, Greece, under the direction and invention of Ioannis Liritzis,
  the dating approach is based on modeling the S-like hydrogen profile by SIMS, following Fick's diffusion law, and an understanding of the surface saturation layer (see Figure). In fact, the saturation layer on the surface forms up to a certain depth depending on factors that include the kinetics of the diffusion mechanism for the water molecules, the specific chemical structure of obsidian, as well as the external conditions affecting diffusion (temperature, relative humidity, and pressure). Together these factors result in the formation of an approximately constant, boundary concentration value, in the external surface layer. Using the end product of diffusion, a phenomenological model has been developed, based on certain initial and boundary conditions and appropriate physicochemical mechanisms, that express the HO concentration versus depth profile as a diffusion/time equation.
  This latest advance, the novel secondary ion mass spectrometry–surface saturation (SIMS-SS), thus, involves modelling the hydrogen concentration profile of the surface versus depth, whereas the age determination is reached via equations describing the diffusion process, while topographical effects have been confirmed and monitored through atomic force microscopy.