text: Typically, an ultrashort pulsed laser is used in the terahertz pulse generation process. In the use of low-temperature grown GaAs as an antenna, the ultrashort pulse creates charge carriers that are accelerated to create the terahertz pulse. In the use of non-linear crystals as a source, a high-intensity ultrashort pulse produces THz radiation from the crystal. A single terahertz pulse can contain frequency components covering much of the terahertz range, often from 0.05 to 4 THz, though the use of an air plasma can yield frequency components up to 40 THz. After THz pulse generation, the pulse is directed by optical techniques, focused through a sample, then measured.
  THz-TDS requires generation of an ultrafast (thus, large bandwidth) terahertz pulse from an even faster femtosecond optical pulse, typically from a Ti-sapphire laser. That optical pulse is first split to provide a probe pulse whose path length is adjusted using an optical delay line. The probe pulse strobes the detector that is sensitive to the electric field of the resulting terahertz signal at the time of the optical probe pulse sent to it. By varying the path length traversed by the probe pulse, the test signal is thereby measured as a function of time—the same principle as a sampling oscilloscope (technically, the measurement obtains the convolution of the test signal and the time-domain response of the strobed detector). To obtain the resulting frequency domain response using the Fourier transform, the measurement must cover each point in time (delay-line offset) of the resulting test pulse. The response of a test sample can be calibrated by dividing its spectrum so obtained by the spectrum of the terahertz pulse obtained with the sample removed, for instance.