In the absence of reliable experimental probes, our best current tool for validating these theoretical models is molecular dynamics (MD) simulation. In this manuscript, we highlight the ability of MD simulation to provide molecular-scale insight into the properties of interfacial electric field profiles. We also show how MD simulation can be utilized to test the reliability of standard theoretical models. To accomplish this, rather than excerpting from an array of different simulation studies in the literature, we present previously unpublished results from an unremarkable yet illustrative model system. This model is similar to those appearing throughout the literature. By utilizing this model we hope to provide generalizable physical insight while maintaining consistency and clarity across the various sections.