Powder X-ray diffraction measurements of samples as prepared were carried out on a PANalytical X'Pert Pro diffractometer in Bragg-Brentano geometry using Cu Kα1,2 radiation filtered with an BBHD mirror and an X'Celerator linear detector. Diffractograms were recorded in the Range of 20° to 80° and a stepsize of 0,02° was used. The diffractograms were evaluated using the PANalytical program suite HighScorePlus. A background correction was performed.