Small angle X-ray diffraction was performed using a Bruker D8 Discover equipped with a temperature controlled, bored graphite rod furnace, custom built at the University of York. The radiation used was copper Kα (λ = 0.154056 nm) from a 1 μS microfocus source. Diffraction patterns were recorded on a 2048x2048 pixel Bruker VANTEC 500 area detector set at a distance of 121 mm from the sample, allowing simultaneous collection of small angle and wide angle scattering data. Samples were filled into 0.9 mm OD glass capillary tubes and placed into the graphite rod furnace. Alignment of the sample was achieved with a pair of 1T magnets, with the field perpendicular to the incident X-ray beam. Diffraction patterns were collected as a function of temperature (controlled to a precision of +/-0.1 °C). Two dimensional diffraction patterns were radially averaged (0.05 ° step size) to give one dimensional profiles of scattered intensity as a function of two theta. D-spacings were obtained by fitting the radially averaged data with a Gaussian, Lorentzian or Voigt function, as appropriate.