We therefore concluded that, if the crystals studied are beam sensitive and undergo modest beam-induced reorientations concurrently with MicroED collection, it is still advantageous to acquire a tilt series while delivering the lowest possible total fluence that affords measurement of the highest resolution reflections the sample can produce. However, if the crystals of interest undergo sufficiently dramatic beam-induced reorientations, or are sufficiently robust to beam damage, data acquired after an initial period of illumination might afford improved reduction statistics and more accurate structure solutions. Therefore, if confined to conventional MicroED data reduction strategies, even if implementing orientation refinements over batches of images as afforded by XDS, the period where the crystal is diffracting its best due to minimal total accumulated fluence might have to be sacrificed to evade the impact of beam-induced motion on the data. The crystallographer is currently left with little other option besides to collect tilt series with fast rotation and acquisition rates and accept that data reduction and structure quality are tarnished somewhat by unmodeled orientation changes.