X-ray: X-ray diffraction data was collected on a BRUKER D8 Venture CMOS area detector (Photon 100) diffractometer with Cu Kα radiation. Single crystals were coated with perfluoroether oil and mounted on a 0.2 mm Micromount. The structures were solved with the ShelXT 1 structure solution program using intrinsic phasing and refined with the ShelXL 2 refinement package using least squares on weighted F2 values for all reflections using OLEX2.