Defining the required information to capture is facilitated by published reporting standards for experimental OFET device data. An overview of the major materials and process stages involved in depositing the semiconducting polymer layer, and a non-exhaustive set of their related parameters/attributes is presented in Figure ! Reference source not found.. A device recipe considers the starting materials -a polymer and a device substrate -and tracks these two inputs as they are transformed through a series of process steps and ultimately integrated into the output: an OFET on which a device measurement is made. Important parameters and nuances to evaluate device performance include materials characteristics, solution processing, substrate treatment, and the instrument parameters and models used to extract device metrics.