To compare the clusters revealed by CLIM to the film's microstructure, we imaged the same areas using an SEM. The overlays of the SEM images and CLIM maps demonstrate striking similarities between the clusters and the grains in the MAPI-POR and MAPI-LG samples (m In these cases, 10 cluster boundaries generally coincide with the grain boundaries. To the best of our knowledge, this is the first time that such comprehensive structural information is obtained for semiconductor films through fluorescence microscopy, making CLIM a highly valuable tool for imaging semiconductor systems.