Single-crystal X-ray diffraction data were obtained at 20 °C using a Rigaku R-AXIS RAPID diffractometer equipped with a monochromatic Cu-Kα radiation source (λ =1.54187 Å). The crystal structures were solved using a direct method with SHELXT and refined with SHELXL on F 2 using the fullmatrix least-squares method. Calculations were performed using graphical interfaces, ShelXle and Olex2 .