High-quality fast EBEC data showed some degree of CL, but were sufficient for accurate ab initio structure determination by MicroED. Not surprisingly, the greatest dynamic range was observed under the highest beam fluence, granted by extended data collection times. Most importantly, however, accurate structures could be determined from fast rotation data with higher beam flux, where the measured electron counts were overall higher. Ultimately, optimizing the quality of diffraction movies involved balancing incident flux and speed of data collection to yield the greatest dynamic range in accurately measured intensities. Although considerable CL is expected for the pixels with measured counts approaching the effective count rate of the Apollo (~266 e -/pix/s), we also note that this assumed count rate depends on the uniform propensity for electrons to impact pixels on a sensor. A higher count rate could be possible if that likelihood were skewed. This would be the case, for example, where a train of electrons only impinges on a single pixel and never its neighbors, a condition that may be present at Bragg reflections.