We utilized a Raman spectroscopy-based method described by Paton et al. to determine the average stacking of our graphene films. By measuring the intensity ratios of the 2D band peak and its low-energy shoulder for both graphene and graphite samples, we calculated a metric M of 0.681. Applying the empirical formula, 𝑁 ! ≈ 10 "#.%&'(#.&)' ! * , we estimated the average degree of stacking in our graphene films to be six layers. Since this average includes occasional unexfoliated graphite flakes, this number of layers is likely significantly smaller away from the flakes. SEM imaging, shown in Figure , depicts a graphite flake partly exfoliated, revealing a stepped structure characteristic of incompletely separated graphene layers. These step-like features correspond to the edges of graphene sheets, illustrating a progressive delamination process analogous to the fanning out of cards in a deck. TEM images, shown in Figures and, show an aggregated graphene particle approximately five layers thick. This sample was prepared by pulling a TEM grid through a film of overlapping graphene sheets at a waterheptane interface. The zoomed-in image in Figure provides an approximation of the graphene layer thickness. Moiré patterns indicate the sheets have shifted relative to one another. The average number of layers counted in the TEM image closely agreed with Raman and UV-Vis results.