Powder XRD was performed on an Ultima IV multipurpose diffractometer (Rigaku) with a 285 mm goniometer radius or on an AXS diffractometer (Discover 8, Bruker, Madison, WI) i h C K radia ion ( = 1.5406 ). The AXS diffrac ome er as eq ipped i h a odimensional general-area diffraction detection system (GADDs) using a Vantec-500 detector with a sample detector distance of 22 cm. To protect the lithiated materials from air and moisture, double-sided adhesive Kapton tape with a round cutout was laminated onto a glass slide. The powder was added into the compartment left by the cutout and then covered with a polypropylene foil, all while handling the powder under an inert Ar atmosphere. A photo of the resulting window is included as Figure .