Fluorescence-mode x-ray absorption near edge structure (XANES) and extended x-ray absorption fine structure (EXAFS) measurements were performed at the Inner Shell Spectroscopy (ISS) beamline at the National Synchrotron Light Source II (NSLS-II). XANES and EXAFS measurements were collected on specimens at the Ni K-edge (8.333 keV). Spectra were recorded using a four-element silicon drift detector (SDD) and a total fluorescence yield detector (PIPS diode). Data were collected to a photoelectron wave number (k) value of 14 Å-1 . For energy calibration, a Ni face-centered-cubic (fcc) reference foil was measured in transmission mode. Background subtraction, spectra alignment, and normalization of the XANES and EXAFS data were performed with ATHENA and Larch . Dedicated Python scripts were developed to visualize the processed data and perform quantitative concentration analysis of the XAS spectra.