CLIM emerges as a versatile imaging method that offers both structural and functional insights, enabling a comprehensive picture of structure-function relationship in semiconductor films and corresponding devices in operation. This method leverages correlated PL fluctuations to elucidate 5 morphology and photophysical processes and is material-independent, suitable for various luminescent systems. CLIM is effective even for weakly fluctuating signals, requiring luminescence fluctuations just twice the standard deviation of the noise. (refer to Supporting Note IV) Structural and functional mapping 10 CLIM reveals structural details comparable to SEM but also provide functional insight, visualizing independent or collective fluctuations, that may not always align with structural boundaries. Thus, CLIM can serve as a standalone tool to reveal structural and functional cues which proves particularly useful for multi-layered solar cell and LED devices in which high resolution methods cannot penetrate. Further analysis of CLIM outputs, such as silhouette maps, unveils communication between grains, likely indicating inter-grain lateral charge carrier diffusion in materials like perovskites. Analyzing cluster correlations and plotting distance dependenceyield insights into correlation extent and charge diffusion. (see supporting Note XI).