Electron Paramagnetic Resonance Spectroscopy. Crystals of Polymorph I were grown via the slow evaporation method from DCM and EA described in the crystal fabrication above, were dried out and then placed in an EPR tube. The crystal sample was then measured on an EMXplus running the Xenon software with variable temperature (part no. E0000071) for in situ EPR measurements. The temperature was stepped by 25 °C up through the II-III phase transition. The Intensity at each temperature was then doubly integrated and plotted vs temperature. Electronic properties. For single crystal devices, large needle like crystals were grown from a 1 mg mL -1 solution of 1:1 mixture of dichloromethane and ethyl acetate. These crystals were pre-bent and attached to a glass substrate, using conductive PEDOT:PSS. Pre-bending allowed for the devices to be heated through the I-II transition without cracking or breaking the device. The device was measured in air using a Keysight B1500A semiconductor parameter analyzer. The current through the crystal was measured by contacting the PEDOT:PSS with 2 probes and current was obtained as a function of source-drain voltage.