where (hkl) is the growth plane considered, Im the normalized measured intensity (with the background intensity subtracted), I0 the intensity of a randomly oriented polycrystalline sample (taken from the PDF card) and n the number of planes that are considered. Here, plane (111), ( ), ( ), ( ), ( ) and (331) were used for the TC calculation; therefore, n was equal to 6. The surface morphology and cross-section of the samples were probed by a field emission SEM (ZEISS LEO1550) using an acceleration voltage of 3 kV at a working distance around 5 mm. The existence of pyrolytic carbon in the coatings were investigated by a Raman spectrometer where Ar laser with a wavelength of 532 nm and a power of 10 mW was employed to excite the chemical bonds.