Ptychography allows accessing improved resolution compared to conventional STXM, through ptychographic reconstruction of series of X-rays scattering images originating from overlapping regions on the sample. This is, to the best of our knowledge, the first report of spectro-ptychography at Ti L2,3 absorption edge, enabled by the use of an sCMOS camera equipped with sensor providing high efficiency at low energies. Further details about the ptychography implementation used here are given in the Methods section. All absorption edges (Ti L2,3, N K, O K, Fe L2,3) were measured using STXM (i.e. using a photomultiplier tube detector) to identify first spectral features of interest on both S1 and S2 samples. It is possible thus to focus on specific spectral range to perform spectro-ptychography measurements, a timeconsuming approach both for acquisition and reconstruction. Thus, Ti L2,3 edge was found most adapted for the correlative description detailed in the following. Indeed, it presents outstanding spectral features related to the chemical nature of the pseudo-brookite from the surface region, probed also by S-XPEEM.