The output SMV stacks from the still crystal diffraction series were indexed using nXDS with the known unit cell parameters and space group of each crystal enforced, and orientation matrix elements were recorded from reflection files generated during peak integration (INTEGRATE.HKL). A script was written to resolve ambiguities in orientation between settings deemed equally likely for a given frame by nXDS, taking advantage of the knowledge that each frame arose from successive exposures of the same crystal to arrive at a self-consistent set of orientations for each frame. This was done by considering the earliest determined orientation to be ground truth, and then iteratively changing the orientation determined for each subsequent frame to the symmetry-equivalent orientation nearest the previous one. Following this correction, if the difference in any orientation matrix component from the corresponding component in both the previous and next frame (i.e. a x in frame 2 versus the a x components in frame 1 and frame 3 of an image series) by greater than twice the standard deviation of all measured orientation matrix components of that index from that dataset, that frame was considered likely misindexed and discarded from further analysis. Following this, transformation matrices relating each orientation to the first frame's orientation were calculated, which were subsequently converted to rotation axes and angles on a 3D coordinate plane describing the transformation experienced by the crystal's orientation.