Microscopy: For cross-section observation and elemental analysis, a standard TEM-lamella preparation was done using a Focused Ion Beam (FIB) System Nova200 Nanolab (FEI-TermoFisher). The dual beam system operated using an acceleration voltage from 30 kV to 5 kV for progressive milling and the gas injection system that includes Pt, SiO2, and C for protectivelayer deposition. TEM and STEM imaging performed using a Cs-corrected JEOL Scanning- high-angle annular dark field (HAADF) detectors used for imaging. Chemical analysis (maps) acquired using Energy Dispersive Spectroscopy (EDS) Aztec X-MaxN, Oxford Instruments.