We combine the photoemission surface sensitivity (electron mean free path of few nanometers) with the capability of S-XPEEM to discriminate surface and bulk information (for details see Supporting Information, section III). To this purpose, we measured energy stacks by recording full-field XPEEM images while tuning the X-rays energy across the Ti L2,3, O K and Fe L2,3 absorption edges, from 450 to 750 eV. Figure shows the results obtained for S1 and S2 samples. The RGB color-coded images (Figure for S2 and 3b for S1, respectively) are obtained using the singular value decomposition (SVD) method, applied after correcting the drift of the hyperspectral data, using the SVD implementation in the aXis2000 software. We identify three main spectral contributions, each one represented by an associated color in Figure : bulk one, recorded from the shadow region (Red), gold-plated Si substrate (Green), and surface contribution (Blue) (see also Figure for further details). The images shown in Figure and 3b are kept in their original orientation, related to the use of 20 µm and 10 µm fields of view, respectively. Indeed, in the XPEEM microscope column, the image is turned by the specific lens settings for each field of view, while the detection part is kept in fixed orientation. Thus, to orient the reader, the direction of the X-ray beam is materialized using the orange arrow. Surface and bulk (shadow) regions can be easily distinguished, marked as blue and red regions, respectively. The size of the Ti-doped hematite particles deposited on the gold-plated substrate was estimated from their shadow size: