The chemical structure was evaluated using an Alpha Bruker FT-IR spectrometer with an ATR attachment (Bruker Optik, Ettlingen, Germany) in the wavenumber range 400-4000 cm -1 with an accuracy of 2 cm -1 . 32 scans were made for each of the tested materials and Ultra high-resolution scanning electron microscopy (UHR SEM, SU82020, Hitachi, Tokyo, Japan) was used to examine the blend morphology. The specimens were fractured in liquid nitrogen, and the fracture surface was examined. All the specimens were coated with a thin 10 nm chromium layer prior to SEM analysis, in order to avoid electrostatic charging. Micrographs were taken in high-vacuum mode, at an acceleration voltage of 15-20 kV.