The Scanning Electron Microscope (SEM) micrographs of graphene were obtained with ZEISS EVO 60 Scanning Electron Microscope with an Oxford EDS detector. The phase and lattice characterization of the bio-exfoliated graphene sheets was carried out using powder X-Ray Diffraction (XRD) with monochromatic nickel filtered Cu Kα radiation in the 2θ range of 20 to 80˚. The optical spectra of the prepared samples were recorded using a UV-1800 spectrophotometer, Shimadzu, Japan. The High Resolution-Transmission Electron Microscopy (HR-TEM) images were produced using JEOL 2200FS electron microscope. The Fourier Transform Infrared (FTIR) analysis of graphene was carried out using Bruker spectrometer through the range of 4000 to 400 cm -1 . The Raman spectra of graphene sheets were acquired with an excitation wavelength of 532 nm (Witec UHTS 300). X-ray photoelectron spectroscopy (XPS) measurements were performed with Thermoscientific spectrophotometer (NEXSA) with a micro focused monochromatic Al-Kα source (1486.6 eV).