Materials morphology and elemental analyses were conducted on cross-sections of SFO and LFO sintered on yttria-stabilized zirconia using Scanning Electron Microscopy and Energy Dispersive X-ray Dispersive Spectroscopy via a JEOL JSM-6010PLUS/LA Analytical Scanning Electron Microscope (coupled with a Dry SD Extra Detector and a Digital Pulse Processor 3) at an accelerating voltage of 15kV, a working distance of 10mm and a spot size of 65. Phase analyses were conducted using X-ray Diffraction via a Rigaku Ultima IV X-Ray Diffractometer with a Cu Kα radiation source with a wavelength of 1.54059Å, a step angle of 0.05° and dwell time of 1s.