XRD data were collected in a step-scan mode at room temperature using a Rigaku SmartLab SE diffractometer operated at 40 kV (Cu Kα radiation, 10-80° 2θ range, step width 0.01°). The XRD spectra were analyzed using X'Pert HighScore Plus v2.2e software. The International Centre for Diffraction Data (ICDD) PDF-2 Release 2009 database was used for crystalline phase identification. The HP-NCs dispersed in Sol. 1, 2, and toluene were dried in a vacuum oven at 50ºC for 4 hours before XRD measurement.