X-ray powder diffraction (XRPD) was used to establish consistency between the individual particles studied with electron diffraction and the bulk powder sample. In-situ XRPD data previously collected from the Diamond Light Source Synchrotron Beamline I11 was reanalysed, now including fresh insights from our electron diffraction experiments to account for the new polytype (Form II) and stacking disorder. The presence of multiple phases and stacking faults within individual nanoparticles explains the difficulty in achieving successful structure solution solely through XRPD methods. This is compounded by difficulties in distinguishing between forms due to their structural similarity resulting in shared peaks.