In Figure (a), the ZARC elements of a direct ECM fit obtained with random parameter starting values and without parameter constraints, transformed into the DRT domain, is compared with the obtained DRT. In this particular example, the ZARC element shown in yellow represents two DRT modes, while the cyan ZARC element forms a negative contribution in the DRT that corrects for a discrepancy of low frequency impedances and their fit with a Warburg element, which is not shown since an analytic representation in the DRT domain does not exist. Although the direct ECM fit without constraints is rather heavy-handed, some typical problems faced when fitting an ECM directly to EIS data can be identified. Dominant, asymmetric features tend to get fitted by multiple components at the expense of less prominent features. Furthermore, deviations of a mode from the shape of a fitting function may get compensated with unphysical or unrealistic features, such as the negative ZARC element that implies an inductive contribution as a correction for the Warburg element. ECM fit using DRT data Fitting the intermediate frequency range directly in the DRT domain using Equation is shown in Figure (b). It shows that three ZARC elements do offer a good description of the sample behavior above 1 Hz. Since the equation used to fit ZARC elements in the DRT domain is symmetric in log space, asymmetric modes in the distribution cannot be accurately reproduced. Nonetheless, the distinguishable features in the DRT could be individually fitted with this simple ECM.