We used a circular beam, approx. 100 µm in diameter, which was collimated by a series of pinholes. The beam profile was also measured to account for the instrumental effects on the diffraction parameters, and to take in account the beam divergence, the energy resolution and the detector pixel size. This was performed by scanning the beam vertically and horizontally across two perpendicular 0.1 mm tungsten wires. The diffraction peaks were separated from the scattering data by applying an Asymmetric Least Square Smoothing baseline correction method , and selected characteristic peaks were fitted with pseudo-Voigt functions convolved with the q-dependent Gaussian instrumental smearing function to extract information about their positions, broadening values and areas as a function of time.