While the MXene lines discussed above have a width of 21 µm, the influence of the line width on electrical properties under compressive strain was studied by comparing with lines with a width of 40 µm. With 40 µm lines, a change of 1.5% in resistance after 1000 cycles of compressive strain was measured (Figure ). This value for the 40 µm lines is ~7.5 times lower than for lines with a width of 21 µm (11.3%). Furthermore, the 40 µm lines show a change of resistance within a single bending cycle of -0.8% under compressive strain, which is around 5 times lower than the single cycle change in resistance for 21 µm lines (-4.0%) (Figure ). Moreover, patterns with a line width of 40 µm showed a very low hysteresis of 0.01% from start to end of the measurement. This shows that narrower lines exhibit greater sensitivity to applied strain, while broader lines have greater robustness and cycle stability.