Zn2(bim)4 film was deposited on graphene resting on a holey transmission electron microscopy (TEM) grid. Bright-field TEM image of the film revealed that the film is homogeneous and free from deposits of macroscopic crystals (Fig. ). Selected area electron diffraction (SAED) pattern from the film, obtained from micrometer-sized area, composed of sharp diffraction spots without any rings. They could be isolated in two sets (Fig. ). The first set (Fig. , red circles) displays a six-fold symmetry, representing a single grain of graphene, while the other set (white circles) exhibits a two-fold symmetry, representing a single grain of Zn2(bim)4 in a micrometer-area. Indexing of SAED patterns from Zn2(bim)4 confirms (002) zone axis (Fig. and Supplementary Note 2). The diffraction pattern assigns a and b lattice parameters as 1.62 and 1.60 nm, respectively, in close agreement with those from the simulated lattice (a = 1.61 nm, b = 1.61 nm, Supplementary Table ). This SAED pattern was obtained from every single location in the entire TEM grid indicating that the crystal growth was uniform. The lattice parameters of Zn2(bim)4 match with those of a graphene supercell (Fig. , Supplementary Fig. , and Supplementary Note 3), indicating a potential registry between graphene and Zn2(bim)4 film.