Characterizations: The structural analysis of the power sample (3X and 6X) was carried out using a PANalytical X'Pert diffractometer (XRD) with Cu-Kα incident radiation (λ = 0.15406 nm) in the scan range of 10° to 90° with a scan rate of 1° per min. UV-visible absorption spectra are recorded with a double beam spectrophotometer. Raman spectroscopy measurements were performed by WITec UHTS Raman Spectrometer (WITec, UHTS 300 VIS, Germany) at an excitation wavelength of 532 nm. Transmission electron microscopy (TEM-JEOL JEM 2200FS), was carried out to know the particle size in the diluted sample (24C and 200C). Zeta potential and particle size measured using Zeta analyzer and particle size analyzer (Model No: Horiba Scientific SZ-100).