For the investigations of surface topography, an NX10 Park Atomic Force Microscope (AFM) was used, equipped with a non-contact probe (NCHR, NanoAndMore) with a resonance frequency of 300 kHz and a sub-10 nm tip radius. We acquired 512x512 pixel images on 10x10 µm 2 areas on the deposited films and we further used the images for the quantitative measurements.