1 Max Planck Institute of Colloids and Interfaces, Potsdam, Germany Status X-ray scattering and diffraction pertain to a major set of techniques to characterize the structure of materials at the nanoscale. Small-angle x-ray scattering (SAXS), in particular, has been developed in the 1950s to resolve structures in the size range 1 -100 nanometers . Despite the development of electron microscopes some years later, it remained an important technique, mostly because x-rays are less strongly absorbed than electrons, which allows for in-operando experiments, studying the effect of physical stimuli, such as temperature, pH or humidity on material structure. A strong boost in the use of smallangle scattering came with the availability of synchrotron radiation that improved the time resolution of in-operando experiments, but also opened to possibility to transform SAXS into a multiscale imaging tool. In this approach, the general idea is that nanoscale information is extracted from analyzing the scattering patterns, while mapping of the specimens provides the information at the microscale (see Fig. ). The first attempts with SAXS-based imaging go back to the 1990s . This evolved until the development of SAXS tomography which yields six-dimensional data: three dimensions in real space through scanning and rotating the specimen (typically with micrometer resolution) , as well as three additional dimensions from the scattering patterns within each voxel (containing nanoscale information) .