The lamella depicted in Figure was thinned and subjected to additional characterization using transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM). Bright-field STEM imaging displayed in Figure shows a contrast of spherical nanoparticles encapsulated within the porous network, with the corresponding energydispersive X-ray spectroscopy (EDS) mapping prominently displaying the homogeneous distribution of carbon and silicon throughout the structure. TEM bright-field imaging of SiNPs encapsulated within the carbon matrix is depicted in Figure , showing the carbon shell surrounding the nanoparticles. High-angle annular dark-field STEM (HAADAF-STEM) imaging at a higher magnification of the same area is depicted in Figure . Essentially, the TEM/STEM imaging and corresponding EDS analysis reveals that the SiNPs are uniformly dispersed and encapsulated within the porous conductive carbon network. The EDS spectrum and mass percentages displayed in supplementary figure show a silicon content of approximately 46% in the anode with a 5:4 ratio of silicon to carbon.