Understanding the role and the origins of cracking has become important to help develop preventative measures and prolong lifetime. Studies have attempted to show the propagation of cracks within secondary particles, most commonly utilising destructive focused ion beam scanning electron microscopy (FIB-SEM) methods or tracking of single particles mounted on a steel pin. Whilst these experiments provide good evidence for electrochemically induced cracking, the nature of the cracks presented has little relevance to commercial electrode environments. The use of FIB-SEM provides high resolution images of the cracks within the particle core, but, due to the particle being cut in half any residual stresses that are inherit to a secondary particle due to synthesis may be released and thus wont contribute to the cracking phenomenon that may be observed in a whole secondary particle. In addition, a single particle on a pin will not experience any of the external influences from being embedded in the complex electrode matrix, and the directional lithium flux experienced as a function of electrode thicknesses.