Figure shows the XRD peak of only (111) Au NPs for two different triturations (3X and 6X). For higher trituration (i.e., 6X), we observe a higher angle shift with a line broadening as compared to 3X trituration. The shift of the XRD pattern reveals the presence of strain (~4%) in the materials. The origin of the strain is due to the mechanical grinding during trituration. Here, we have used the Debye Scherrer equation for calculating the crystalline size of the samples .