Figure presents conventional TEM analysis of single-component C31H64 and C30H61OH crystals. The crystals were prepared following established procedures to produce crystals either with chains perpendicular to the support film (parallel to the electron beam), denoted the 'down-chain' orientation, or with chains parallel to the support film (perpendicular to the electron beam), denoted the 'chains-flat' orientation. Measurements were taken under 'lowdose' conditions to minimize beam damage to the samples, due to similar long chain alkanes undergoing significant damage at low electron fluence. Bright field (BF) TEM images show contrast arising primarily from diffraction, with darker regions reflecting greater diffraction.