For nanocalorimetry and thermoelectric/Hall effect characterization, CuP 2+x films were deposited on previously described microfabricated chips designed for calorimetry and in-plane thermoelectric characterization 37 of thin-film samples. In both types of chips, CuP 2+x was deposited on a free-standing Si 3 N 4 membrane. Due to the fragility of the membrane, thinner CuP 2+x films (90 nm-120 nm) were employed for these studies.