ECM fit at different SOC EIS data was first transformed via DRT to obtain a guess of the number and type of features contained in the data in order to get an appropriate circuit model representation of the system. Once a suitable ECM was identified, ZARC contributions to the impedance spectra were algorithmically fitted to extract starting values and boundaries for an ECM fit that was performed on the raw data in the frequency domain. These steps were performed sequentially without user interaction or case-specific configuration, and are thereby suitable for large data sets.