Among the synchrotron techniques involved, except for some of the studies mentioned above, there are not many that have been used for imaging and spectroscopic analysis of these materials. A comprehensive review of imaging and mapping tools, including laboratory and synchrotron-based, for perovskite solar cells has been presented in . There are even fewer studies using soft X-ray characterization tools such as soft X-ray STXM (scanning transmission X-ray microscopy). They include investigation of SiN/NiOnc/PbI2 microaggregates by Lin et al. before and after MAI (Methylammonium iodide) treatment using O K-edge, wherein they observed the presence of PbO (lead oxide) upon redox reaction at the NiOnc/PbI2 interface. Li et al. presented the very first C K-edge XAS spectra of MAPbI3 while investigating the effects of pre-depositing Phenyl ethyl-ammonium iodide (PEAI)-doped lead iodide (PbI2) on the substrate before the evaporation of MAI.