In this work we have applied cryo-FIB milling to reduce ZIF-8 microcrystals, approximately 15 μm in size, to lamellae roughly 150 nm thick. This preparation step optimizes the crystals for MicroED data collection. Additionally, we incorporate an energy filter with a 5 eV width and employ a Falcon 4i direct electron detector in counting mode to improve data quality. Together these enhancements led to a resolution of 0.59 Å, an improvement from our previous 0.87 Å ZIF-8 structure and was achieved with an ultralow exposure of only 0.64 e -/A 2 . Importantly, this study verifies that cryo-FIB milling, previously instrumental in improving MicroED data quality for macromolecular crystals, can be applied effectively to MicroED analysis of non-biological, beam-sensitive materials without inducing significant damage. These advancements extend the applicability of these methods to a wider range of materials science challenges. We present methodological advancements in this work that further establish electron diffraction as a primary choice for high-resolution structure determination of beam-sensitive MOFs and ZIFs. This paves the way for broader applicability and sets a new benchmark for data collection protocols that open new avenues for materials otherwise limited by traditional methods.