The investigation of particle surface of pristine and recycled electrode materials was examined using X-ray photoelectron spectroscopy (XPS). XPS spectra were acquired using a SPECS PHOIBOS 150 spectrometer implemented at the DAISY-FUN cluster tool. It is equipped with an Al Kα X-ray source (monochromatic Focus 500 with XR50 M (SPECS), hv = 1486.74 eV).