To prove the hypothesis that the implementation of stressed zones by ion implantation can also deflect dendrites we applied electrical current well above reported critical current densities to a thinned sample with Li metal on both sites until the voltage reached device limitations, as a result of reduced contact area from lithium stripping. The corresponding current-voltage curve is shown in Figure . Figure shows the setup used during this kind of short circuit testing, where the sample is contacted with lithium in two places, carefully applied only on the side, to avoid circumventing the implanted layer and the zone of compressive stress. It is evident from Figure that dendrites deflect after the implanted region, similar to mechanically induced cracks. The deflection zone is somewhat past the stress maximum, determined at 850 nm, and the crack begins to kink at around 700 nm and is fully deflected at 1.5 µm. Where the indented sample fractures at the zone of compressive stress, the growing dendrite has to snake its way through an increasing stress field, which can differ locally from the averaged values determined via XRD. Similarly, the bulk KIC value can differ from KIC value at lower length scales. With this it is entirely plausible for the crack to be fully deflected after the stress maximum, which is in agreement with Fincher et al, where it was shown that once the crack starts to kink and constant stress remains, it will eventually be turned by 90°.