X-ray fluorescence (XRF) was used to determine the spatial map of composition, which detects all elements except oxygen. It was performed on an EDAX Orbis Micro-XRF system with an x-ray beam approximately 2 mm in diameter. The Mn K, Sb L, Sn L, Ti K, and Co K XRF peak intensities were extracted from the Orbis software and converted to normalized compositions using the sensitivity factor for each element calibrated by commercial XRF calibration standards (Micromatter). Note that due to 10 nm Ti adhesion layer on the Si wafer, Ti metal concentration in the Mn-Sb-Ti-O and Mn-Sb-Sn-Ti-O thin film libraries may be 2-5 at.% higher than the actual value. Since the uncertainty in correcting these values would be as large as the corrections themselves, and since this systematic, small composition shift does not impact the conclusions of the work, we report the compositions without a correction for the Ti adhesion layer.