We sought to determine whether a CL adjustment would improve EBEC data. We calculated the mean loss of electrons for a given rate of measured counts in e -/pix/s (Figure ) and systematically added these counts to every pixel that measured between 10 and 260 e -/s in diffraction frames. Electron counts were deduced from raw, gain-corrected intensity values as previously described, assuming a conversion factor of 16 counts per electron, and normalizing for the integration time per frame; where frames were typically recorded at a rate of 2 Hz or 0.3 Hz. In this scheme, a pixel with a measured count of 10 e -/s received < 0.2 additional e -/s, while ~25 e -/s were added to pixels with a measured count of 100 e -/s (Supplementary Figure ). These values are conservative, given that real CL percentages are likely higher in experimental data, as indicated by Nakane et al . This addition of electron counts was systematically performed for each of the 8192x8192 pixels in all 100 raw, superresolution diffraction images of an EBEC MicroED dataset. The counts-adjusted images were once again saved in MRC format for subsequent processing (Supplementary Script 3). CL-adjusted diffraction movies were converted into individual SMV frames as previously described, and used for subsequent data reduction in XDS.