The photoluminescence (PL) mapping of the sample surface was performed by a commercial Raman-AFM confocal microscope (Witec Alpha 300 RA+). The co-localized PL maps were obtained by sequential scanning of the surface by Atomic Force Microscope (AFM) and spectral imaging, followed by the pixel-to-pixel stitching of the images. The excitation laser wavelength of λ = 488 nm was used, and the emitted light from the perovskite layer was analyzed by fiber-coupled spectrophotometer. The measurements were performed at ambient laboratory conditions.