HRTEM and scanning TEM (STEM) observations were carried out on a JEOL JEM-ARM300F instrument equipped with a cold field emission electron gun and a spherical aberration (Cs) corrector at an acceleration voltage of 80 kV, under 1 × 10 -5 Pa in the specimen column. We analyzed strain of the exfoliated hBN layers based on the HRTEM images using the Peak Pairs Analysis (PPA) software package for Gatan Digital Micrograph. In order to calculate the interlayer electrostatic potential, we performed quantum chemical calculations using density functional theory (DFT) methods implemented in the Gaussian 16 suite of programs. In this work, hydrogen terminated clusters with various sizes and two different edges (zigzag and armchair) were used to model the local structure of twisted hBN bilayers with different twist angles.