XRD was used for analysing the composition of synthesized electrode composites and structural changes within the active material occurring during galvanostatic cycling at different states of charge. The measurements were recorded on a Rigaku Smart Lab diffractometer in Bragg-Brentano geometry with Cu Kα radiation and a Hypix-300 detector using the detector's X-ray fluorescence reduction mode. All the samples were sealed inside an Ar-filled glovebox in low-background air-tight sample holders. Data were generally recorded in the angular range between 2θ=10 ° and 80 °for a total measurement time of 4 hrs 18 min with a step size of 0.0050 ° and a divergence slit of 10 mm. The data were analysed using the Rietveld method with the programme TOPAS. The instrumental intensity distribution was determined using a reference scan of LaB6. The microstructural parameters such as crystallite size and strain broadening were refined to adjust the peak shapes. To minimize quantification errors, thermal parameters were set to be identical for all atoms of all phases.