Compounds formed from ligand exchange with oxygen-incorporated ligands (eea and boa) exhibit PXRD patterns in agreement with those of simulated models. The predicted interlayer distance (dmodel) of ZnSe(eea) deviates only 2.5% from the experimental dexp, and a deviation of 4.3% is found between these parameters for ZnSe(boa). TGA and CHN analysis show a high LEY (ca. 95%) for these two materials.