Recent developments in aberration-corrected electron optics, spectrometer and detector technologies enable to capture multimodal signals within a single experiment in a scanning / transmission electron microscope (S/TEM) down to the atomic level. These advancements have greatly expanded our understanding of the atomic constitution of materials, which is largely driven by the rich and multimodal data streams. Spectroscopic techniques such as energy dispersive X-ray (EDS) or electron energy-loss spectroscopy (EELS) can nowadays probe the local composition and electronic structure of complex materials at the atomic level. New scanning diffraction methods, termed 4D-STEM, capture 2D electron diffraction patterns in each probe position of the 2D raster grid and have facilitated to image light elements at atomic resolution, determine local structures and strain with sub-nanometer precision . Further, the spectroscopic and 4D-STEM techniques can be combined with tomographic approaches to obtain the 3D nature of materials. Advances in in situ probing capabilities and fast electron detectors make it possible to directly observe the dynamic evolution of materials under different external stimuli with high spatial and temporal resolution. The common theme of these techniques is that nowadays the experimental data is often represented as a three-or higher-dimensional data set as shown in Fig. (left) .