PXRD data were collected using a PANalytical X'Pert Pro diffractometer equipped with monochromated Cu Kα 1 radiation (λ = 1.5406 Å). The tube voltage and current were 40 kV and 40 mA, respectively. Scans were performed from 2 • to 60 • on a zero background silicon crystal plate. Peak fitting, Pawley and Rietveld refinement were performed using Topas Academic v6.