In Situ and CelloZIFPaper_Ex Situ were characterized using XPS analysis (Fig. ). The elemental survey for the materials verifies the presence of Zn, O, C, and N (Fig. ). The XPS analysis of O 2p for CelloZIFPaper_ In Situ shows peaks at a binding energy of 533.1 eV, 532.2 eV, and 531.4