The data shown in Figure for the 5 mN contact force displays some deviation from the linear trend at low values of failure diameter. This makes intuitive sense from a defect density perspective, as the defects generated by the high contact force cluster around the probe, yielding non-uniform defect densities resulting in deviations from the Weibull model. Such clustering is more clearly observed in the electrochemical data and the linear scale histogram of failure diameters shown in Figures and.