In addition to peak locations, the width and sharpness of the peaks are also critical for identifying morphologies in block copolymers. Typically, disordered samples exhibit a single broad and low-intensity peak, whereas ordered block copolymers often display multiple wellresolved and sharp reflections. However, there are instances, such as in HEX, BCC, and σ phases, where a single peak might emerge due to overlapping peaks or being close to the order-disorder boundary. To address these challenges, we include in our model the width of the first primary scattering peak and its sharpness, measured by the second derivative of the peak.