FTIR characterization of the static and real-time spectra is conducted by iS50 (Thermo Scientific) equipped with a diffuse gold integrating sphere. The SEM images and EDX elements analysis of the deposited Cu nanoparticles are taken by a high-resolution field-emission scanning electron microscope (Apreo S by ThermoFisher Scientific). The XPS spectrum is obtained on the X-Ray Photoelectron Spectrometer (Kratos Analytical Axis Ultra). The infrared images are recorded using an IR camera (FLIR E60).