To set up spatially resolved, SED measurements of the native state in these beam sensitive molecular crystals, we first established their critical fluences, CF. The CF is defined as the characteristic rate of exponential decay of a signal on exposure to ionizing radiation, such as high energy electron beams. CF values determined from SAED at 300 kV were 6 e -/Å 2 for C31H64 and for C30H61OH (Table ) in line with those previously reported values for paraffin crystals. Figure shows an example of Bragg spot intensity decay following an exponential form. CF values determined from SED were 15.1 e -/Å 2 for C31H64 and 10.9 e -/Å 2 for C30H61OH (Table ), likely underestimated as the probe size (3 nm) was smaller than the pixel size (> 3.8nm). The effect of exposure in SED also depends on the distribution of intensity within the probe. We also observed mass loss, recorded as lost intensity within the exposed region in ADF-STEM imaging (Figure ), and we therefore further determined CF values for virtual ADF-STEM images (Figure ) as ~220-250 e -/Å 2 for C31H64 and for C30H61OH (Table ). Mass loss has been observed previously in systems where radiolysis results in volatile products. The CF for mass loss, observed here as an order of magnitude greater than for diffraction intensity decay, is consistent with prior work and ascribed to a damage mechanism where disruption of crystalline packing precedes volatilization of molecular fragments arising from radical reactions under the beam. Cumulatively, we confirm low-dose SED measurements at ~10 e -/Å 2 retrieve high quality diffraction signals from C31H64 and for C30H61OH crystals.