Scanning Electron Microscopy and EDS: Samples were suspended in ethanol, drop cast onto a silicon wafer, and mounted on an SEM stub using carbon tape. Samples were allowed to dry at room temperature. The samples were sputter-coated with 2 nm of platinum. Sample images were taken at 30 kV and a working distance of 10 mm or less on a Tescan Mira3 (Materials Characterization Facility, Carnegie Mellon University). Energy dispersive spectroscopy was performed at 10 kV, 3.2 nA current, and a working distance of 12 mm using a Thermofisher FEI Apreo equipped with APEX EDS (Nanoscale Fabrication and Characterization Facility, University of Pittsburgh).