Analysis of Raman spectra according to allows to assume, that defects in structure of Cu@SiO2-18 and Cu@SiO2-19 are the edge defects (Fig. ). Fig. . Raman spectra of Cu@SiO2-19 (a) and Cu@SiO2-18 (b) samples and evaluation of type of defects in Cu@SiO2-19 and Cu@SiO2-18 (c) (straight lines are drawn according to ).