Powder XRD measurements were performed on ground crystals to examine the presence of impurity phases as well as to determine the crystal structure and lattice parameters. XRD patterns were recorded with a Rigaku SmartLab in Bragg-Brentano geometry with a Cu-Kα source (λ = 1.5406 Å) at 40 kV and 30 mA and a HyPix-3000 detector. For powdered samples, the measurement range of 10° to 80° was used, with a step size of 0.005° and a fixed divergent slit of 0.3°. Rietveld analysis was performed with TOPAS V6 software . The instrumental intensity distribution of the XRD instrument was determined empirically from a fundamental parameter set using a reference scan of LaB6 (NIST 660a). Microstructural parameters such as crystallite size and strain were refined to adjust the sample-dependent broadening of the reflections.