To gather information characterizing the catalysts and reflecting the potentially relevant processes governing selective oxidation within our AI approach, we measured a wide range of bulk and surface properties of both fresh and activated catalyst samples. We used the following common characterization techniques: xray diffraction (XRD), N2 adsorption (ads.), x-ray fluorescence (XRF), laboratory x-ray photoelectron spectroscopy (lab-XPS), temperature-programmed reduction/oxidation (TPRO). Additionally, we measured properties of the activated catalyst samples under the reaction conditions (temperature and gasphase feed) by the advanced techniques near-ambient-pressure XPS (NAP-XPS) microwave cavity perturbation technique (MCPT). These advanced techniques, referred to as in situ (as opposed to the ex situ common techniques above), provide properties of the "working catalyst", which therefore take into account the catalyst dynamics. In particular, NAP-XPS, which provides surface properties, was carried out in three different feeds: dry, wet and C3-rich. These conditions are used to probe the influence of surface composition and its electronic properties, which depends on the feed due to catalyst dynamics, on reactivity. Regarding MCPT, it is a technique for contactless determination of the conductivity, free of electrode effects. 25 Finally, we note that microscopic as well as mesoscopic properties of the catalysts are included in our analysis, which can be related to phenomena at different length (and time) scales. For instance, the surface atomic composition (from lab-XPS and NAP-XPS) might characterize a molecular-level process whereas the pore volume (from N2 ads.) may be associated to the diffusion of reactants and products on the catalyst pores, a transport phenomenon occurring at a larger length scale. The characterization of these catalysts, also performed following standardized protocols (described in ref. 12) represents an unprecedented effort to acquire a consistent and detailed set of more than fourty catalyst bulk and surface properties. An overview of the measured properties is shown in Table (the full data set is available in ESI).