VT-XRD analysis on IL@CuBTC composite was performed using a Rigaku Smartlab diffractometer with a Cu Kα X-ray source and a Hypix-3000 detector operating in 1D scanning mode. The voltage and current of the X-ray tube were set at 40 kV and 50 mA, respectively. Bragg-Brentano geometry was used with a 10 mm length-limiting slit as the incident section, a 2. was used during the analysis. For VT-XRD, the "constant up -down measurement" mode was set using a temperature control loop. Target temperature and heating rate were set to 300 ○ C and 10 ○ C min -1 , respectively. Diffraction patterns were collected in the 2θ range of 5 ○ -22 ○ with a step size of 0.02 ○ at a speed of 50 ○ min -1 .