Powder X-ray diffraction (PXRD) data were collected to determine phase purity, unit cell parameters and for preliminary structure refinement. PXRD patterns (10 to 90° 2θ) were collected on a Panalytical Empyrean diffractometer equipped with a Pixcel 2D detector (Cu Kα radiation). The GSAS-II suite of programs was used for structure refinement FT-IR Spectroscopy measurements were performed using a Bruker Alpha II FTIR-Spectrometer with the platinum ATR attachment.