X-ray diffraction measurements (XRD) were performed using a Philips X'pert PW3719 MPD diffractometer, Cu Kα radiation, 40 kV, 35 mA and 2θ range of 6 ˚ to 40 ˚. The m = 5 Aurivillius phase was indexed from calculated XRD patterns generated using VESTA and Crystal Diffract 7 software (Crystal Maker Software Ltd.) using data from García-Guaderrama et al. The m = 6 phase was indexed from calculated XRD patterns using data from Krzhizhanovskaya et al. Atomic Force Microscopy (AFM) and Piezo Force Microscopy (PFM) measurements and ferroelectric lithography experiments were performed using an MFP-3D TM Asylum Research instrument (see Supplementary Section SI2 for details).