Surface roughness analysis was performed using a Bruker ContourX-500 3D Optical Profilometer equipped with dual color LED illumination (white light and 532 nm green light), automated objective turret with 2.5×, 5×, 10×, 20×, and 50× objective apertures, and additional internal 0.5-2× zoom lens (for a maximum of 100×). Surface roughness measurements were acquired via phase shift interferometry using the 532 nm illumination source in order to achieve sub-angstrom resolution. Measurements were typically acquired with the 20× objective and 1× internal zoom lens (xy pixel size of ~345 nm). 1×1 mm area maps were constructed by stitching 12 separate images together with ~20% overlap with neighboring images. Phase shift interferometry data was analyzed via Vision64 software (Version 5.51). Root mean squared (RMS) surface roughness (Sq) is defined as the RMS of the ordinate height values within the sampled area. 2D surface roughness maps were corrected for tilt, exported, and replotted in Origin.