The Li6.4La3Zr1.4Ta0.6O12 sample was extracted from an Ar glovebox (10 min air exposure) and a 0.5 µm layer of Ti was deposited on the Ag-implanted surface using an AJA electron beam evaporator. This protects against moisture from the air and carbon-containing deposition layers. A lamella was produced and thinned using the standard focused ion beam (FIB) liftout method, with a FEI Helios G4 UX dual-beam instrument. The final thinning was done using 2 kV Ga ions. The lamella was moved to a JEOL 2100F transmission electron microscope (TEM) within 15 min air exposure.