In order to elaborate our idea on the limit of applicability of the three SLM modeling methods and their difference, we re-examined their modeling performance on experimental results from published literature papers. Figure summarized the reported fitting parameters, coupling strength and energy offset, of the selected literature , which provided general overview of the range of the reported values. The data presented below are acquired from their originate papers whereby those in red are obtained by using Eq 1 and for those appear in blue only coupling was obtained by Eq 3 while energy offset was from transition voltage (TVS). From the graph the data accommodated below 10 meV under mild and low energy offsets are vulnerable to inaccuracy according to our discussion above, which indicated the application of Eq 3 is quite limited at low coupling and energy offset (energy barrier). We next try to redo the model fitting on the experimental results using the three methods (Eq 1 to 3) and compare the extracted parameters with the values from the original paper to check their performance and reliability.