Our tests on the newly redesigned CAMECA NanoSIMS, called the NanoSIMS-HR, demonstrate that features of the new instrument substantially improve imaging, depth profiling, detection limits and automated performance while maintaining secondary ion mass spectrometer performances, such as mass resolution, transmission, and isotope analyses presented here. The redesigned higher intensity thermal Cs + ion source is central to the improved performance, but other upgrades such as high-voltage control, an encoded sample stage, a higher resolution optical system, an automated sample exchange system, and new electronics further contribute to improved performance. The ion optics, secondary ion mass spectrometer and multicollection detector system are unchanged.