The prepared AgNPs were characterized by TEM (JEOL, JEM-2010, accelerating voltage 100 kV). The metal content of AgNPs and AgInk were estimated by thermogravimetric analysis using a thermal analysis system (Rigaku, Thermo plus Evo) from room temperature to 500 °C with a heating rate of 20 °C•min -1 under an air flow of 300 mL•min -1 . Sheet resistance of the sintered silver films were measured using a resistivity meter (Mitsubishi analytech, Loresta-GP). Measurements of I-V characteristics of the Schottky barrier diodes were performed using a Current/Voltage monitor (ADCMT, 6241A) and a manual prober (ESS Tech, SP-0-3Ls). Morphological observations and EDX analyses of the silver electrodes were performed by FE-SEM with an energy dispersive X-ray spectrometer (JEOL, JSM-7800F, voltage 5 kV, WD 10 mm). Images of atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) were taken by scanning probe microscopy (Shimadzu, SPM-9700HT). AFM and KPFM measurements were performed in the force modulation mode using a platinum silicide coated cantilever (NanoWorld AG, PtSi-FM, tip curvature <25 nm, spring constant 2.8 N•m -1 , resonant frequency 75 kHz) under ambient atmosphere.