Films were excited at λex = 450 nm and measured from 700 -850 nm. Powder X-Ray diffraction (XRD) was taken in a Bragg-Brentano configuration using a Rigaku SmartLab SE X-ray diffractometer with a D/tex 250 Ultra ID Si strip detector. Measurements were taken from 2θ = 10° to 50° with a Cu Kα (1.542 Å) X-ray source.