Initially, the electrodes were inspected using optical microscopy. In low magnification the electrodes look very nice and regular, but at higher magnification cracks and irregularities are seen, especially for the smaller electrodes (Fig ). Measuring the width of the electrodes show that the narrower electrodes are significantly wider (39±3.5 µm) than the nominal width (25 µm). To make sure that there was no electrical connection between the individual electrodes and other parts of the ITO-plate, a negative potential of -1.5V (vs. Ag/AgCl) was applied to ITO working electrode for a duration of 60 seconds. This results in the reduction of ITO layer. A significant change in the appearance of electrodes was observed, indicating disintegration of the electroactive area to metallic indium and tin as the electrode lost its transparency and appeared darker . The reduced area is confined to the electrode and shows that there are no electrical connections with other parts of ITO. The electrodes were also studied using SEM and EDX. The width of the electrodes were measured for SEM images at several positions along the length of each electrode on a plate. In the figure SI 3 we see that the widths of the electrodes, as measured by SEM, is larger than the nominal widths. In the EDX measurements we concentrated on the elements indium and silicon. When the electrodes are cut EDX data clearly show that the ITO is removed along the cut.