Electron diffraction is largely resistant to the effects of beam-induced motion that impact high resolution electron microscopy imaging . However, crystal motions such as rotation, bending, and warping can produce measurable changes in diffracted signal. Intentional rotation of a crystal, for instance, allows the efficient and sufficiently complete sampling of Bragg reflections in the reciprocal lattice, a prerequisite for structure determination . In electron diffraction measurements from 3D microcrystals, a target crystallite is continuously and unidirectionally rotated about a single axis during data collection. Methods that exercise this approach, with or without cryogenic preservation of the crystal, are often termed MicroED or 3DED . MicroED data treatment assumes that a crystal remains fixed on its substrate, even if it translates within the illuminating beam. If this assumption remains true, and the structure of a crystal is not significantly damaged by the incident beam, then diffracted signal can be predicted, integrated and reduced to a list of intensities suitable for structure determination .