Microscopic imaging was performed on the scanning electron microscope (SEM) FEI Nova NanoSEM 450 microscope, USA, with an energy-dispersive X-ray analyzer (EDX) Octane Elect Plus, USA. Fouriertransform infrared (FTIR) spectroscopy measurements were performed using the reflection mode with a Vertex 80 v spectrophotometer of Bruker using the deuterated triglycine sulfate detector controlled by OPUS v. 6.5 software. Spectra were recorded with a 2 cm -1 resolution. For each spectrum, 1024 scans were acquired. Measurements were performed under decreased (6 hPa) pressure. The photographs attached in this publication were taken with Samsung Galaxy S22 mobile phone. X-ray photoelectron spectroscopy (XPS) measurements were carried out on a PHI 5000 VersaProbe (ULVACPHI) scanning ESCA microprobe by using monochromatic Al Kα radiation (hν = 1486.6 eV). Casa XPS software then evaluated the XPS data. Background was subtracted by using the Shirley method and peaks were fitted with (Gaussian-Lorentzian)-shaped profiles. The binding energy (BE) scale was referenced to the C 1s peak (BE = 284.6 eV).