The 2θ/ω diffractograms were recorded in a PANAlytical X'Pert Pro diffractometer with a Bragg-Brentano HD and 1/2° slit as primary optics and X'celerator detector with a 5 mm anti scatter slit on the secondary side. The azimuthal scans (ɸ-scans) were recorded in a Phillips X'Pert MPD diffractometer with crossed slits (2 × 2 mm 2 ) and 1/2° slit as primary optics and proportional detector (PW1711/96) equipped with parallel plate collimator on the secondary side. Same instrumentation is used to obtain XRD ω-scan (rocking curve) on the crystalline samples. These scans give a measure of the crystal quality of the deposited films. Full width half maximum calculated using PANalytical Data viewer software version 1.3b.