Scanning electron micrographs were acquired with a Zeiss Supra VP55 (Zeiss, Germany) at 1.5 kV, with 10 µm aperture size, in high vacuum mode, and using the Everhard-Thornley detector (ETD). Specimens were applied onto a SEM sample holder by dropcasting a dilute suspension of the supraparticles in ethanol. Solid composite materials were mounted on a SEM sample holder using silver glue (Acheson Silver DAG 1415 M).