Diffraction patterns of neat IND and polymer:IND extrudates and scaffolds were obtained using an EMPYREAN X-ray diffractometer (Malvern PANalytical, Espoo, Finland) equipped with a transmission measurement geometry at room temperature and voltage of 45 kV. Each sample was scanned between 5° and 40° 2θ with a step size of 0.013° 2θ and a step time of 49.47 s. The samples were grinded, placed between two slices of kapton tape and mounted on a transmission sample holder. The diffractograms were evaluated using Origin software.