X-ray diffraction patterns of furan-based polymeric films were collected using an Empyrean PANalytical X-ray diffractometer using Cu K (λ = 0.154 nm) as the radiation source. In the 2θ range 10-60 with a step size of 0.026. The crystallinity index (Xc') was computed from the XRD profiles from the ratio between the crystalline peaks area (Ac) and the area of total peaks (crystalline and amorphous) (At). The degree of crystallinity (Xc') was calculated from the XRD profiles by the ratio between the crystalline peaks area (Ac) and diffraction area of all peaks (crystalline and amorphous) (At) using the equation (1).