The resulting frozen polymer solution is then quickly transferred to a Linkam stage at -120 °C under vacuum. The Linkam stage temperature is then slowly increased at a rate of 0.5 °C/min to -80 °C (far below the melting point of chlorobenzene solvent mp = -45 °C) followed by 6-8 hours of constant monitoring with cross polarized microscopy to ensure sublimation of all solvent. The sample is then imaged using AFM (Asylum Research Cypher) with tapping mode, SEM (JEOL JSM-7000F) at 15 kV voltage, and TEM (Hitachi H9500). TEM based electron diffraction measurements were also conducted to determine π-π stacking in the freeze-dried samples. Electron diffraction was taken by a Gatan US1000 CCD camera equipped on a 300kV Hitachi H9500 environmental TEM with guarded ring LaB6 cathode. Filament current was set automatically at 3.5 uA to reduce beam damage during operation. Patterns were taken at 3s exposure time each and six images were summed to produce the final image. Beam block and astigmatism were removed and monitored upon azimuthal integration for the intensity line profile. The length scale was calibrated with an Au nanoparticle sample and 4.08 Å was used as its lattice constant.