[43] has lithographed FIB-ready biasing chips commercially available that could be very useful to the PSC community that intends to perform in-situ STXM measurements. It is indeed possible to analyze samples in powder form. This can be done by preparing the perovskite layer on a glass or Si substrate and then scratching the material off of the substrate and collecting it on a Si3N4 window or an appropriate TEM grid.