Data were collected using a Talos F200C side-entry transmission electron microscope (Thermo-Fisher Scientific) operating at 200 keV. The microscope optics were configured to deliver a low flux parallel beam on the sample and to collect selected area electron diffraction. Specifically, we used an extractor voltage of 4150 V, a gun lens of 4, spot sizes in the range of 9-11, and a C2 aperture of 70 µm. For each configuration, a near-parallel beam was achieved by adjusting the C2 lens current to a value of ~44.8 % at spot size 11, and ~45.8 % at spot size 9, yielding a focused beam at the back focal plane of the objective lens; that plane was assumed to be coplanar with the objective aperture.