The observed dependencies of the ion and electron yields as a function of pump-probe delay time were fit as linear combinations of basis functions, describing pump-probe dynamical response using the MC 3 Fitting software . First, a global fitting was done, followed by the Monte-Carlo sampling of the parameters' uncertainties, as described in detail in Ref. 50. A simultaneous fitting was performed for the multiple channel data for the parent ions (from the high-resolution TOF-MS), momentumdisentangled fragment ion yields (from the ion VMI), and photoelectron yields (from the electron VMI). Fitting was done for 40 datasets of ion yield versus pump-probe delay time, which comprise momentum-resolved fragment ion yields of ions having 5 to 13 carbon atoms, the parent monocation, dication, and trication, dehydrogenated parent monocation, momentum-resolved dications of fragment ions having 5, 7, and 11 carbon atoms and electron yields corresponding to five photoelectron bands. Fitting multiple datasets together enabled an estimation of the overlapping time of the pump and probe pulses (t 0 ). Using this t 0 , five momentum-resolved fragment ions with more than one transient feature were also fitted, giving out 15 datasets.