EIS data of thin-film LNMO were validated using linear Kramers-Kronig (lin-KK) test through the open-source Python package impedance.py . EIS data of NCA were validated using the default error analysis of the ORP-EIS technique . EIS data of thin-film LNMO at frequencies higher than 2 kHz, and EIS data of NCA at frequencies higher than 1 kHz were omitted for EECM modeling due to the potential instrumentation artifacts in the v high-frequency impedance response . The EECM analysis was performed using the in-house developed Python code, based on an open-source Python package lmfit . This code employs non-linear least-squares regression of the circuit model to the impedance data, following the Levenberg-Marquardt optimization algorithm. The uncertainties of the best-fit parameters are estimated by inverting the Hessian matrix.