Figure shows a schematic representation of this concept. A mixture of two materials with different absorption coefficients (µ1 and µ2) is presented as would be observed upon ideal STXM imaging. A sample with two phase separated components is observed as an intensity profile that combines the effect of absorption from the two materials irrespective of the order they appear in. Simultaneous surface sensitive measurements, for example with the help of electron detection using a channeltron can provide additional information that can disentangle surface and bulk sensitive chemistry . Further data analysis, such as SVD, will provide thickness profiles of the individual components.