SAXS and WAXS: SAXS measurements were performed using a Xenocs Xeuss 2.0. For the measurements, X-rays were generated at 50 kV/0.6 Ma at a beam wavelength of 1.542 Å (Cu Kα radiation) and sample-to-detector distances of 1200 mm and 72 mm, respectively, for SAXS and WAXS. The scattered beam was recorded on a CCD detector with a pixel resolution of 172 × 172 µm. The scattering patterns of APCN films (~1.5 x 1.5 cm 2 ) were recorded over 30 min of exposure time at room temperature. 2D patterns were azimuthally integrated to obtain the scattering intensity as a function of the scattering vector, q, where q = 4π sin(θ)/λ. 2θ is the scattering angle. The azimuthal integration was obtained using Foxtrot 3.4.9.