Crystalline reaction products were characterized by XRD using a Phillips PW 1700 diffractometer equipped with an X'Celerator detector, in θ-2θ configuration. The X-rays corresponding to the Cupper Kα1 line (1.540562 Å) were produced with applied voltage and intensity of 40 kV and 40 mA respectively. Data were collected between 5 and 60°, with steps of 0.0170°.