The samples from our previous study were used for high-energy X-ray diffraction (HEXRD) measurements. Each of these samples was prepared using a levitation technique combined with CO 2 laser heating. These HEXRD data were collected at SPring-8 (BL04B2 beamline) using a two-axis diffractometer and four CdTe detectors and three Ge detectors. The powdered samples were filled into capillary tubes and placed in a vacuum chamber, and the measurements were performed at room temperature. To obtain the total structure factor S(Q), the diffraction data were corrected for absorption, background, and polarization, and they were normalized.