The field emission scanning electron microscopy (FE-SEM) images were performed with a JEOL JSM-7900F (JEOL Ltd.). The active material particle size distribution used for the simulations was obtained by adjusting the perimeters of the grains to circumferences through the analysis of SEM images with the ImageJ software. The histograms and lognormal probability density function of the distribution are displayed in the supporting information section, Figure . The cross-sections displayed in Figure and used for the size distributions were obtained through the cryofracturing of the electrodes immersed in liquid nitrogen.