Experiment. We experimentally tested the effect of Cr absorption layer inclusion in a metasurface. MIM samples were made with 5 nm and 50 nm Cr adhesion layer thicknesses, as illustrated in the inset of Figure . In order to benchmark experimental finding against FDTD simulation results, other parameters of the fabricated samples were varied as well -thicknesses of SiO 2 insulator layers were 100, 150, 200 nm, disc diameters ranged from 600 to 4000 nm (with a 50 nm increment up to 2000 nm diameter, and 100 nm increment between 2000 nm and 4000 nm). The measured optical reflectance and thermal radiation emission spectra are shown in Figs. and for 5 nm and 50 nm Cr thickness cases, respectively. As predicted by FDTD simulations, the SiO 2 thickness alters the Au disc diameter value at which a near-perfect absorption condition is achieved. For a = 100 nm SiO 2 thickness, the mimimum reflection resonance was situated at ∼ 3.5 m; for 150 nm -∼ 4.5 m; and for 200 nm -∼ 6.5 m, respectively. For thinner 5 nm Cr layers, reflectance and radiation emission spectra closely mirror each other. However, the emittance was unable to exceed the 80% black body value, even when a metasurface exhibits near total reflectance suppression. This divergence between measured optical extinction and radiation emission is most apparent at higher wavelengths, likely due to lower optical absorbance of Au in that spectral region.