From the all-atom MD simulation generated data, we first obtain the average of each of the quantities nN-Cl, nN-Ow, nO-Cl , nCl-Ow , nN-N, nmon-mon in each of the seven bins in which the nanochannel half height has been divided into for each of the three conditions (E=0.1 V/nm, E=0.5 V/nm, and E=1.0 V/nm). The case corresponding to E=0.1 V/nm is referred to as the reference case, while those corresponding to E=0.5 V/nm and E=1.0 V/nm are referred to as the perturbed cases. We would like to compare each of these features nx-y (or more appropriately, the average of each of these features) in a given bin between the reference case and the perturbed case. For example, we would like to know how nN-Cl (or the average of nN-Cl) in bin k (k = 1, 2,…,7) changes as one changes the applied electric field from 0.1 V/nm to either 0.5 V/nm or 1.0 V/nm. In order to ensure that this change is well magnified, we employ a non-linear transformation to nN-Cl (or the average of nN-Cl) in bin k corresponding to the perturbed cases (i.e., the cases corresponding to E=0.5 V/nm and E=1.0 V/nm). At this point, we now have high-dimensional and well-separated datasets (one corresponding to the reference case, while others corresponding to two perturbed cases).