Next, we examine the no-interphase model, which represents the substrate effect. Interphases with various thicknesses were then introduced to test the effect of the artificial interphase on the mechanical properties. Finally, we predict the interphase thickness based on non-dimensional analysis and discuss the lower limit of interphase thickness prediction. In the next step, we calculated the perpendicular distance between a line fitted to the I/S boundary and each pixel, which was then defined as the distance from the substrate. Finally, we determined a 1D modulus-distance profile by plotting all the individual pixels for each image. The rightmost column of the 2D modulus map is designated as the far-field, which is at least 500 nm away from the boundary between I and M. We collected more than 3 modulus maps for every combination of sample and probe.