Understanding crystal growth phenomena at these interfaces is, therefore, essential for controlling glass-ceramics' properties. However, the atomic structure and function of the interfaces in the sub-nanometer region remain poorly understood. cluding interface and crystalline morphology. Experimental techniques such as X-ray diffraction (XRD), transmission electron microscopy (TEM), and solid-state nuclear magnetic resonance (NMR) have been employed to quantify crystallinity and the structure of the host glass. Although analyzing crystalline particles and local structures within glass phases is effective, these techniques are limited with respect to both spatial resolution in the sub-nanometer range and temporal resolution, making it challenging to observe atomic structures during crystal growth.