For bright-field transmission electron microscopy (bright-field TEM, BFTEM), selected-area electron diffraction (SAED, selected area diameter 150 nm), and high-resolution TEM Experimental 4D-STEM datasets were acquired using the TEAM I instrument (NCEM/LBNL), a double aberration corrected Thermo Fisher Titan fitted with a Gatan Continuum energy filter and K3 direct electron detector (operated in electron counting mode, 4x binning). The energyfiltered diffraction patterns (15 eV slit width, central beam covered by 2.5 mrad beam stop) were acquired at an accelerating voltage of 300 kV in microprobe mode with a beam convergence semi-angle of 0.7 mrad (beam diameter approx. 2 nm, beam current 70 pA) and a covered spectrometer semi-angle of maximum 21 mrad. A shadow image of the sample (i.e., a strongly defocused image of the STEM probe) was recorded to align the rotation between scan field and recorded diffraction patterns. The datasets were evaluated employing the py4DSTEM software package. Details are provided in the supporting information. Fourier-transform infrared spectroscopy FT-IR spectroscopy was performed using a Nicolet iS 5 FT-IR-spectrometer in conjunction with an iD7 ATR unit from ThermoFisher Scientific. The LP-NC powder was scratched off the PET substrate and directly analyzed.