PXRD patterns were collected in transmission mode on samples held on thin Mylar film in aluminum well plates on a Panalytical Empyrean diffractometer, equipped with a high throughput screening (HTS) XYZ stage, X-ray focusing mirror, and PIXcel detector, using Cu-Kα (λ = 1.541 Å) radiation. Diffraction patterns were measured over 2 range in 0.013° steps, for 15-60 minutes. For indexing, samples were loaded into borosilicate glass capillaries and PXRD patterns were recorded in transmission mode on a Panalytical Empyrean diffractometer, equipped with a sample spinner to improve powder averaging.