Shishvan et al. proposed a framework based on previous nano-CT imaging conducted in this group, to explain these observations, identifying three distinct regimes during charging: 1) Low State of Charge (SoC): Minimal intergranular fracture occurs, though stress builds within the particle. 2) Comminution Event: Significant cracking occurs as strain energy exceeds the grain boundary energy, leading to fracture. 3) Strain Dissipation: Strain energy dissipates, causing a slight reduction in particle size due to primary particle shrinkage. This framework potentially explains the observed reduction in cracking as more secondary particles transition through regime 2 to regime 3. In regime 3, the overall particle volume slightly decreases, manifesting as an increase in pixel attenuation. During discharge, the full particle (Figure , circles) follows a similar trend as in Figure , with a small reduction in mean pixel intensity at 4.2 V DC, before progressively becoming less cracked and recovering to a mean pixel intensity similar to the pristine state. However, for the proportion of the particle without phase contrast enhancement, recovery appears to be complete at 4.2 V DC (see Figure ), followed by progressive damage as the cell discharges to 3.8 V DC. This may be due to the large volume increase within primary crystallites, especially in the c-lattice vector, during the initial 20% of discharge down to 4.2 V. As strain energy dissipates during charge, discharge behaviour is not simply the inverse of charging. Instead, the secondary particle acts more like individual primary particles, reflecting crystallographic changes. Once the lattice planes are lithiated below 4.2 V, the c-lattice contracts slightly, inducing cracking in the particles between 4.2 V and 3.8 V. When fully relithiated, the particle reaches a homogeneous lithiation state, similar to the pristine condition, with limited cracking and increased pixel intensity.