Scanning electron microscopy was performed on a Zeiss EVO 15 SEM with an acceleration voltage of 15 kV. The samples were visualized using secondary electrons and backscattered electrons with an EDAX Elements detector. Elemental maps were obtained with a magnification of 826 X, a resolution of 128.9 eV and a dwell time of 276.6 sec. No additional coating was done on the samples due to the sufficient electronic conductivity of the electrodes.