X-ray diffraction (XRD) was used to characterize the phase behavior of composition libraries. It was performed on a Bruker DISCOVER D8 diffractometer with Cu Kα radiation from a Bruker IµS source. Diffraction images were collected using a two-dimensional VÅNTEC-500 detector and integrated into one-dimensional patterns using DIFFRAC.SUITE EVA software. Using ICDD phases as prototypes, the phase constitution as well as the lattice parameters of each phase were determined via a novel XRD analysis tool, CrystalShift. The results are summarized in Table .