Scanning Electronic Micrographs were recorded in a Hitachi S-4800. Optical images were obtained with a NIKON Eclipse LV-100 Optical microscope and AFM images were performed with a Nanoscope IVa Multimode Scanning Probe Microscope (Bruker, Karlsruhe, Germany) in tapping mode. Several mechanical exfoliated flakes were transferred onto a grid with a membrane of amorphous SiN (50 nm thick) using a dry and deterministic method (that involves the use of a micromanipulator and PDMS/PPC polymers, as reported in ref. ). This has been possible thanks to the robustness of MUV-1-F, which has allowed a mechanical exfoliation and transfer into silicon nitride membranes for TEM study. TEM images and diffraction patterns were acquired with a JEOL JEM-2100F with a field emission gun operating at 200 kV.