Powder X-ray diffraction (PXRD, XRD) measurements from the precipitated powders were performed on a D8 Bruker Diffractometer equipped with a LYNXEYE XE-T detector. The diffraction data were collected with Cu-Kα-radiation (1.5406 Å, 40 kV and 40 mA) from 5-60° using a step size 0.015° (2Θ) and a scanning time of 0.5 s per step. All samples were prepared on silicon specimen holders, to minimize the instrumental background, which was especially important for the amorphous phases.