XPS measurements were taken at the University of South Carolina's Center for Engineering and Computing, using a Kratos Axis Ultra DLD instrument equipped with a monochromated Al Kα source and hemispherical analyzer. On indium tin oxide substrates, the carbon 1s line was used as a binding energy reference and set to a value of 284.6 eV. On gold substrates, the gold Au4f7/2 peak was used as a binding energy reference and set to a value of 84.0 eV. Fitting of peaks was performed with the XPSPEAK4.1 software package.