X-ray diffraction of powder samples was carried out using a Bruker D8 Advance diffractometer (Cu Kα radiation, λ = 0.154 nm) in the range of 2°-60° with a step size of 0.025° 2θ at a dwell time of 2 s per angular step. XRD of casted electrodes was performed using a polished Sicrystal holder and was measured in the same 2θ region with a step size of 0.04° 2θ at a dwell time of 14 s per step.