To test if crack deflection occurs with the implantation of Ag ions, Nanoindentation was used to probe the implanted region on a larger single crystalline LLZTO sample. The resulting crack propagation was observed in a FIB SEM cut (see Figure ). Below the indentation imprint a crack runs parallel to the surface at a depth of 850 nm. This is as expected at the depth of the compressive stress zone, determined in the previous section. Notably absent are cracks connecting the indentation imprint and the fracture, which should be present if it is a radial fracture. Above the crack the amorphous region is again visible due to its differing contrast, additionally confirming the previous TEM and XRD results.