Datasets gathered from historical or literature sources are often imperfect. One of the most common drawbacks is incomplete reporting of values, or missing values. Our datasets face a similar challenge in that most of the processing and device fabrication features are missing data. As seen in Figure , the missing values are spread among a large percentage of the data points such that only 14% of datapoints ( ) have all of the features that were considered (i.e., excluding polymer molecular weights and charge carrier mobilities). While roughly half of the features are not missing many values (less than 4%), total solids concentration, spin coating speed, and thickness features (active layer, HTL, ETL) are missing significant amounts of data. The lack of active layer, HTL, and ETL thickness data is understandable given the difficulty of measuring thickness on the tens to hundreds of nanometers scale. However, not reporting total solids concentration (21% missing, 115 data points) and spin coating speed (52% missing, 292 data points) cannot be easily excused as these are fundamental and easily obtained experimental parameters when fabricating OPV devices.