The peakshape of the histogram is asymmetrical, with a complex distribution that does not correspond to the typical Gaussian/Lorentzian lineshapes usually considered in X-ray diffraction (Fig. ). The peak width of this histogram is known as microstrain (∆d/d, 4.2 × 10 -4 ), and is a useful parameter in evaluating the defectiveness of NMC. Microstrain is normally considered a bulk parameter, but by using SXDM, it can be mapped across the particle by fitting the peak width of the diffraction pattern for each pixel (Fig. ). This parameter offers a direct bridge between single particle measurements and more routine, accessible powder X-ray diffraction.