The interaction between the triplet excitons of the dopants and the polarons of the hosts represents a significant factor contributing to the stability of blue-emitting devices. Therefore, it is essential to monitor the stability of the polarons in the exciplex-forming host materials before and after deuteration. Electrical-aging measurements in single carrier devices were conducted under a constant current of 1.2 mA to assess the stability of single donor/acceptor and exciplex-forming hosts. When subjected to the same current density, both deuterated compounds and their corresponding exciplexes exhibited lower voltage throughout the entire test. In the devices based on single donor, the voltage increasement was observed to be 0.51 and 1.05 V for D-SiCzCz and SiCzCz, respectively (Supplementary Fig. ). In comparison, the corresponding increasement for D-SiTrzCz2 and SiTrzCz2 were significantly higher (0.95 and 2.28 V), manifesting that the relatively poor stability for the polarons in electron acceptors.