The NanoSIMS 50 series capabilities translate to high mass specificity and sensitivity for the analysis of small features and have enabled discoveries in fields as diverse as cosmochemistry, geology, soil science, structural biology, biomedical research, microbial ecology, and material science . Inspired by these successes, the scientific and analytical communities have sought improvements to the NanoSIMS 50 series to further improve spatial resolution, analytical performance and throughput. 50 nanometer lateral resolution has been a featured aspect of the NanoSIMS instruments. NanoSIMS instruments use a normal-incidence primary ion beam with a 16 keV impact energy to sputter the sample to generate secondary ions for analysis . At this energy, the primary ion beam can be finely focused for scanning secondary ion imaging. However, to achieve 50 nm lateral resolution, the primary current must be reduced by ~10x over typical operating conditions for biological samples (Mayali et al. 2023) increasing the analysis time proportionally. Primary ion source intensity ("brightness") is a factor controlling in the relationship between primary ion beam spot size and current , and multiple efforts have been made to increase both the positive cesium ion source-used to enhance the yield of negative secondary ions , and the negative oxygen ion source-used to enhance the yield of positive secondary ions . Increased ion source brightness would improve the lateral resolution of NanoSIMS instruments, allowing smaller features-from viruses to presolar grains-to be resolved.