The magnetic properties for the MUV-1-F were investigated in order to examine the influence of the different functional groups in the magnetic ordering. As the functional groups are relatively far from the metal centers and the metal-ligand bridge, the electronic properties are not expected to be affected by the different functional groups compared to the reported MUV-1-X family (Fig. ). Fig. shows the thermal dependence of the magnetic susceptibility, exhibiting antiferromagnetic interactions, confirmed by a negative Curie-Weiss temperature (θ = -114 ± 3 K), and a sharp peak in  with a maximum at ca. 19 K, indicating the phase transition to a canted antiferromagnetic ordering. This magnetic scenario is confirmed by the temperature dependence of the ac magnetic susceptibility (Fig. ), where an out-of-plane ac signal is observed below 20 K. The dc data is fitted to the Lines model for a quadratic-layer antiferromagnet with S = 2 and H = -J ∑ 𝑆 𝑖 𝑆 𝑗 𝑖,𝑗 . The resulting parameters are J = -19 ± 1 cm -1 and g = 2.06 ± 0.3. The Neel temperature and exchange coupling are in the range of those obtained for the other members of the MUV-1-X family (X = Cl, H, Br, NH2, CH3 and F) , thus demonstrating that the magnetic properties are dominated by the metal center, their connectivity, and the coordination environment, being independent from the functional group, X. Finally, we investigated the exfoliation of the MUV-1-F using the micromechanical procedure to preserve the high quality of the crystals. Using the Scotch tape methodology, MUV-1-F was successfully exfoliated. The obtained flakes were deposited onto silicon substrates with 285 nm of thermally grown SiO2. As a result, a plethora of flakes with remarkable well-defined rectangular shapes (lateral dimensions > 1 µm) and different thicknesses (ranging from few layers, 5 nm, up to hundreds of layers) were obtained (Figure ). In addition, they were characterized by different microscopic techniques such as atomic force microscopy (Fig. ) and transmission electron microscopy (TEM), with the corresponding selected area diffraction pattern, showing crystalline atomically-thin layers with large lateral sizes (several µm). This is remarkable for 2D molecular compounds, whose lateral sizes are typically in the order of hundreds of nanometers and lack of a complete functionalization coverage. Raman measurements demonstrate the chemical nature compared with the bulk measurements (Fig. ) for thin-layers with different thicknesses. In the case of MUV-1-F, which is chemically more complex than inorganic materials, there is a higher number of vibrations. This factor prevents the high accuracy for detecting changes in the structure. However, we can unambiguously identify the presence of the ligand for all the thin-layers, although with a decrease of the signal intensity with the thickness up to a limit near to 29 nm, revealing that the exfoliated flakes correspond to the material.