Laser flash analysis (LFA) was used to characterize the anisotropic thermal diffusivity of the films, as it is commonly used to measure high thermal conductive thin film materials. Free standing samples were pre-cut into a circular shape with diameter ~ 24.6 mm before loading into the standard through-plane and customized in-plane sample holders for Netzsch LFA 467. The measurements were performed with the Netzsch LFA 467 system using a standard model, which is a modified version of Cape & Lehman model considering both radial and axial heat losses. In addition, the inplane model for the calculation of diffusivities takes into consideration our sample's anisotropic nature. Whereby, the back surface of the sample is heated by a xenon (higher power) with predefined pulse width (Figure ). The temperature rise signal T(t) is monitored on the top surface with the help of an IR detector (typically InSb or MCT). The thermal diffusivity of the sample is given by: 𝜆 = 0.1388 𝑑 2 𝑡 1/2