In contrast, the spatial PL heterogeneity observed in the averaged PL image (Figure ) does not always align with the clusters. An overlay of the cluster contours and the PL image reveals that a bright PL spot can be shared among several clusters (Supporting Note VI). Unlike the correlation map, the silhouette map across the same measurement area displays significant heterogeneity. The silhouette metric typically ranges from 0.1 to 0.8 among clusters with lower values at the cluster boundaries. Since the contrast provided by CLIM is derived from the PL intensity fluctuation, the CLIM maps present a visualization of the microscale heterogeneity in the optoelectronic properties of the sample. By measuring SEM on the same region, we can correlate this visualization with the 5 microstructure of the sample.