When compared to our previous report on ZIF-8 from unmilled nanocrystals , data quality enhancements in this study are primarily attributable to a synergistic amalgamation of technologies: the transition from CetaD to Falcon 4i direct electron detectors, the integration of ion beam milling, and the incorporation of a 5 eV energy filter. These collective improvements have sharpened both crystallographic statistics and resolution, establishing a new benchmark for MOF data collection. Looking ahead, further advances in MicroED technology promise to extend its capabilities. The use of Cold FEG (Field Emission Gun) could enhance electron beam coherency . The advent of faster or more sensitive electron detectors would refine data acquisition . Innovations like plasma focused ion beam milling and lower milling energies could yield samples with even less surface damage, thereby opening the door for improved data quality and new structures . Additionally, the potential to selectively analyze different regions of the milled MOF lamella opens exciting avenues. This could allow for the study of the