The phase identifications were carried by comparison with available d-spacing group and peaks from the Joint Committee on Powder Diffraction Standard. The morphologies of the synthesized samples were then examined using the Scanning Electron Microscope (SEM) Phenom Prox, manufactured by Phenom World Eindhoven, Netherlands. About 0.05 mg of each sample shall be sprinkled onto carbon adhesives tape and sputter-coated with Carbon for 5 min. The microscope was operated with electron high tension at 5 kV for imaging. The Scanning Electron Microscopy (SEM) equipped with energy dispersive spectroscopy (EDS) shall be further used to determine the elemental composition of the synthesized nanoparticles and nanocomposites.