Scanning Electron Microscopy (SEM) was performed on a Tescan S8000. Pelletized powder and single crystal samples were attached to an adhesive carbon tape stuck on an aluminium SEM stub. To reduce charging effects, the samples were coated with a thin layer of carbon. Energy Dispersive X-ray Spectroscopy (EDX) and Wavelength Dispersive X-ray Spectroscopy (WDX) were performed on the same instrument using X-MaxN and Wave detectors from Oxford Instruments. WDX calibration, for the different elements, were obtained by measuring the WDX spectra of appropriate standards. Standard purity was confirmed using X-ray diffraction and electron microscopy. Quantification was performed using Aztec software.