Here, we present DRT inversion of EIS data of commercial Li-ion button cells using uniform penalty regularization with weighted data . To obtain a noise estimation that is necessary for data weighting, a statistical data analysis of multiple EIS measurement repetitions at identical SOC is compared with an estimate of measurement uncertainty based on Gaussian process regression (GPR) using a single data set. Residuals of these fits are assessed for systematic features. For data interpretation, DRT spectra are then used for the parametrization of ECM fits, particularly for the choice of the number of ZARC elements, and to obtain starting values and constraints for their fit. Finally, results are compared with ZARC elements that were fitted directly to the DRT.