XPS analysis corroborates Raman spectroscopy data, allowing us to conclude the importance of lasing power on LIG surface chemistry. For the P12% sample, the graphitized carbon share is 2% higher than P13%. At the same time, the higher lasing power contributes to surface oxidation, as XPS reveals that the share of C-O and C=O moieties increases from approx. 26 at.% (when considering both C 1s and O 1s contributions) to 28.5 at.%. This is assisted by a slightly decreased share of C-C in pentagonal rings for the P13% sample, suggesting more effective breaking of the imide bonds, often appearing under elevated heat . XPS analysis for the Kapton® foil and peak deconvolution details are presented in the SI file, Fig. and Table , respectively.