were undertaken using a Bruker Contour-GT white-light profilometer equipped with a 2.5x optical lens. The reported thickness of a given CMMC is based on the average thickness measured across each of the paired masked areas (Figure ; Red markings). All surface roughness (R a ) measurements were also obtained by WL profilometry, from a ~9 mm2 area of the coating located at the same position on each sample (Figure ; black markings).