The structural analysis of the pristine and the recycled materials was conducted using X-ray diffraction (XRD) with a SmartLab II instrument from Rigaku, Japan, employing Bragg-Brentano geometry and CuKα radiation. A HyPix 3000 detector operated in 1D mode was utilized. The diffraction patterns were obtained at room temperature with a 2° min -1 scanning rate within the 2θ range of 10-80°. Both pristine and recycled Li3InCl6 samples were measured inside air-tight sample holders to prevent sample hydration. Pristine and recycled electrode materials were measured on zero background single crystal silicon substrates. The structural characteristics were determined using the Rietveld method as implemented in TOPAS V6 from Bruker AXS, Germany.