X-ray diffraction (XRD) patterns were carried out on a Miniflex 600 X-ray diffractometer from Rigaku, Japan, using X-rays to characterize the powder of the catalyst samples. The X-ray source for the test was generated by excitation of Ka by a Cu target at a wavelength of 0.154 nm. Scanning electron microscopy (SEM) analysis was carried out on a GIMINER 300 microscope (Carl Zeiss, Germany) with an accelerating voltage of 3 kV. The samples were deposited on a silicon substrate and surface sprayed with gold prior to characterization. Transmission electron microscopy (TEM) characterization was performed on FEI Talos F200x (Thermo Fisher Scientific, USA) with an acceleration voltage of 120 kV. Super-X spectroscopy was also done to evaluate the structure and geometry of catalyst. The catalysts were dispersed by ethanol ultrasonic wave and prepared on the ultra-thin copper grid.