where d is the diameter of the crystallites, λ is the X-ray wavelength, K is a Scherrer constant, θ is the angle of Bragg diffraction, and β is the corrected full width at half maximum and the instrumental broadening (FWHM) or IB, which is in radians . The size and shape of the particles were examined using Transmission Electron Microscopy (TEM, JEM-1011, JEOL).