The Raman spectrum shown in Figure provides further evidence that the silicon was not oxidized during the lasing process and its crystallinity was retained, with the spectrum depicting typical values of crystalline elemental silicon . The absence of any silicon-carbon peaks also confirm the physical encapsulation of the particles as opposed to chemical bonding. These results, in conjunction with the EDS analyses, confirm the retention of crystalline elemental silicon throughout the lasing process. Preservation of the structural properties of the electrochemically active material is crucial during the lasing process, as it suggests that despite the intense conditions and rapid kinetics involved in transforming the carbon precursor, the silicon remained unaffected.