Diffraction data using 300 KV electrons was acquired at a Tecnai F30 TEM equipped with a TVIPS TemCam XF416 CMOS detector, outputting diffraction movies in TVIPS file format. As on the Talos F200C microscope, crystals were first located using overfocused diffraction mode settings and then illuminated for data acquisition with a parallel beam in microprobe diffraction mode with a 100 micron selected area aperture. Movies on stationary crystals were acquired using either 0.25, 1, or 2 second exposures on the TVIPS camera.