Following spin coating, each sample had two thickness readings completed on separate regions through ellipsometry (Rudolph Auto El II Ellipsometer) and results were analyzed through Rudolph software. In this way, we obtained six thickness readings from each solution concentration of each molecular weight. The ellipsometry wavelength was set to 633 nm and the angle of incidence was set to 70 degrees. The index of refraction of PS coatings was previously determined to be 1.589 and set on the ellipsometer to be that value. The spin coated samples were used to determine the relationship between the concentration of monodisperse polystyrene solutions and the thickness of spin coated samples. First, the six ellipsometry-determined thicknesses at each concentration and molecular weight were averaged.