Perovskite composition engineering is also targeted at improving the stability of these pure or mixed materials under exposure to air, humidity, light, etc... Attention has not only been focused on the active layer but also on the electrode materials and the interfaces . At various stages of these studies a large number of characterization techniques have been employed. These include several laboratory as well as synchrotron-based techniques. Among these latter, hard and tender X-rays (>~3000eV) have been the tool of choice for researchers due to several reasons. First and foremost, hard X-ray scattering and diffraction techniques provide critical crystallographic information. Earlier studies of perovskite materials include those of Grinber et al. where they used synchrotron X-ray diffraction to follow the change in lattice parameters of Nickel doped [KNbO3]1 - x[BaNi1/2Nb1/2O3 - δ]x (KBNNO), a perovskite oxide for ferroelectric and photovoltaic applications . In a more recent study by Qin et al. GIWAXS (Grazing incidence wide angle X-ray scattering) was used to study the influence of organic (A site) ligands on the crystal growth of 2D perovskites where they found that using a branched organic molecule leads to a rather superior device performance due to better crystal orientation and improved film crystallinity. GISAXS (Grazing incidence small angle X-ray scattering) studies of the crystallization of MAPbI3 (methylammonium lead iodide), prepared using a 2-step deposition process showed that the crystalline orientation is affected by the deposition method used .