The material obtained from the exfoliation steps was dried in vacuum overnight and grinded prior to its structural characterization. Infrared spectra were collected using an ALPHA II FTIR spectrometer (Bruker). XPS spectra were measured with a K-ALPHA Thermo Scientific equipment with an X-Ray source of Al Kα radiation (1486.6eV), monochromatized by a twin crystal monochromator. Thermogravimetric analyses were carried out with TGA 550 (TA Instruments) in high-resolution mode (Ramp: 20.0 °C/min from 25 °C to 700 °C) XRPD of the obtained material was measured at room temperature in an Empyrean PANalytical powder diffractometer using Cu K-α radiation (λ=1.5418 Å) and working on transmission mode. Raman spectra were collected with a Raman Emission Horiba-MTB Xplora Spectrometer with a 532 nm laser. Samples were prepared dropcasting suspensions on Si/SiO 2 substrates. Morphological characterization: For the morphological characterization, MnPS 3 suspensions were deposited onto Si/SiO 2 substrates, for this purpose, 10 μL of suspension was dropped onto spinning substrates at 50rps for 60s. The morphology and thickness of flakes thus obtained were measured in Peak-Force Tapping mode with a Bruker Dimension ICON AFM . Electrochemical characterization: LSV measurements were performed using a Gamry 1010 potentiostat with a three-electrode cell composed by Pt wire as counter electrode, Ag/AgCl as reference electrode and glassy carbon rotating electrode (Ø 3mm) as working electrode for the main measurements. Working electrodes were loaded with 10 μL of the target MnPS 3 suspensions and let dry. For additional measurements (represented in SI) a graphite rod was used as a counter electrode instead of Pt wire and LSV curves were recorded in the same way. H 2 SO 4 0.5 M was used as electrolyte in all cases and was purged with N 2 bubbling prior to measurements.