Structural analysis of the SiNPs and carbon matrix is displayed in Figure . To investigate the structural characteristics of the SiNPs after the lasing process, selected-area electron diffraction (SAED) was conducted and is displayed in Figure . The SAED pattern displays lattice plane spacing values corresponding to the (111) and (220) planes of pristine silicon, indicating the retention of the crystalline nature of the SiNPs throughout the lasing process . Moreover, high-resolution transmission electron microscopy (HRTEM) imaging, depicted in Figure , of the SiNPs encased in a carbon shell illustrates the crystal lattice spacing, which could be attributed to the (111) plane, with the conductive carbon shell depicted to be mostly amorphous.