Empyrean Powder X-ray Diffractometer equipped with a Cu Kα radiation source (λ = 1.5405 Å) and a PIXcel 1D detector. Transmission electron microscopy (TEM) analyses were performed on a FEI Tecnai 12 operating at an acceleration voltage of 120 kV. Atomic force microscopy (AFM) images were collected using a Cypher ES AFM operated in tapping mode. X-ray photoelectron spectroscopy (XPS) data were collected on a Kratos Axis UltraDLD equipped with a hemispherical electron energy analyser. Spectra were excited using monochromatic Al Kα X-rays (1486.69 eV) with the X-ray source operating at 150 W. Scanning electron microscopy (SEM) imaging was performed on a FEI Quanta 200 F with a SiLi (Lithium drifted) EDS detector and a Philips XL30S FEG equipped with a Gattan Alto 2500 cryo unit.