The X-ray diffraction (XRD) pattern was recorded in the 2θ range 5-50º using a Rigaku SmartLab diffractometer with a Cu anode (Cu Kα radiation with 1.5418 Å wavelength) operated at 40 kV and 120 mA. The morphology of the samples was observed via Highresolution scanning electron microscopy (HR-SEM) using a Tescan MAIA3 instrument equipped with an energy dispersive spectrometer (EDS) detector and Thermo Fisher Scientific™ Talos™ F200X transmission electron microscope (TEM)). The FTIR-6800, Jasco, Japan, was used to perform Fourier transform infrared spectrometer (FTIR) measurements in the spectral region of 3500 to 400 cm -1 .