A nanoparticle size analyzer (Horiba SZ-100, Kyoto, Japan) was used to determine the particle size of the synthesized photocatalysts. The specific surface area was analyzed using a Brunauer-Emmett-Teller (BET) surface area analyzer (BELSORP Max, Microtrac, Japan). Scanning electron micros-copy (SEM, JEOL JSM-6380LA, Peabody, Massachusetts, USA) using secondary electron detection mode with X500 and X1000 magnifications and transmission electron microscopy (TEM, Jeol JEM 2100, Peabody, Massachusetts, USA) were used to characterize the morphology of the prepared catalysts. X-ray diffraction (XRD, Rigaku Ultima-IV diffractometer, Rigaku, Tokyo, Japan) was carried out with Cu Kα (λ ¼ 0.15418 nm) in the range of 2θ ¼ 20-65 with an increment of 0.02 . Raman analysis was carried out using a Raman spectrophotometer (BRUKER-RFS27 FT-Raman spectrophotometer, Billerica, Massachusetts, USA) to determine the structural phase and crystallinity. Identification of Ti (2p), O (1s), B (1s), and Ce (3d) peaks was carried out by X-ray photoelectron spectroscopy (XPS, Omicron ESCAþ, Chanhassen, Minnesota, USA), with Al Kα monochromator as an X-ray source. Diffuse reflectance spectroscopy (DRS, UV Vis NIR Spectrophotometer: Agilent Cary 5000, Santa Clara, California, USA) was used to determine the bandgap energy values. UV-Visible spectrophotometer (GBC CINTRA 103, Hampshire, USA) was used to analyze the absorbance values of CIP-and NOR-treated samples at λmax ¼ 280 nm. The standard calibration graphs for both the model pollutants are given in the previous study.Photoluminescence analysis was carried out using a FluoroMax-4 spectrometer (Horiba, New Jersey, USA) at an excitation wavelength of 325 nm.