Trasatti method 1 was used to find the contribution of minimum double layer capacitance (from outer surface) and diffusion-controlled capacitance (from inner-surface). The cyclic voltammograms were collected in the range of scan rates from 1 to 5 mV.s - 1 and capacitance values were calculated at each scan rate using C = Q/(∆V × m), where Q is the total charge stored during charging, ∆V is the potential window, and m is the average mass of active material. A plot of capacitance versus the reciprocal of the square root of scanrate gives a linear relation C = Rv -0.5 + Cdl, where v represents the scan rate, R is the slope, and CDL represent the minimum double layer capacitance. The CDL values were calculated from the y-intercept of the above equation (Figure (a) and Table ). . The results for GS-AC are not shown because negative values of CDL for GS-AC (column 2 in Table ) refers to completely diffusion dominated charge storage and make the quantification of CDL and CDiffusion from Trasatti method inapplicable in the range of 1 to 5 mV.s -1 . Table Linear relations obtained from the graphs of scan rates and capacitance for different electrodes (column 2 and column 3) and corresponding CDL, CDiffusion, and CT values.