Scanning electron microscopy (SEM) at 5 kV was applied to the powder samples on carbon tape using a Zeiss Crossbeam microscope. A Thermo Fisher/FEI Talos F200X transmission electron microscope (TEM) was utilized to perform bright-field TEM imaging (BFTEM), selected-area electron diffraction (SAED), as well as high-resolution TEM (HRTEM) imaging to prove sample quality and homogeneity, and to in detail characterize the sample morphology, crystal structure, and molecular spacer bilayer separation distance/spacing of the synthesized materials. The microscope, equipped with a high-brightness XFEG gun, was operated at 200 kV and column vacuum, beam current and imaging/capture times (frame integration) were optimized to keep beam damage of the samples at a minimum. The as-synthesized powder samples were dispersed onto TEM support grids (Plano S166-2). To separate the aggregated whiskers, small amounts of the aggregated powder were separated by gently grating two microscope glass slides against each other with the powder placed in between. The materials were dry transferred onto the TEM grids. Larger agglomerates were removed leaving clean scanty material suspended on the grid. Series of SAED patterns, as well as HRTEM images, were sequentially collected and integrated to minimize the applied beam-current density. To analyze the SAED patterns, JEMS software package (by P. Stadelmann, jems-swiss) was employed for pattern simulation and indexing. For precise determination of c-axis lattice constants, average radial intensity profiles were determined and the peak positions particularly of the (001) rings were extracted from the second-order derivative of the radial plot profiles.