Single crystal X-ray data sets were measured on a Rigaku MicroMax-007 HF rotating anode diffractometer (Mo-Kα radiation, l = 0.71073 Å, Kappa 4-circle goniometer, Rigaku Saturn724+ detector); at beamline 11.3.1, Advanced Light Source, Berkeley, USA, using silicon monochromated synchrotron radiation (λ = 0.7749 Å, PHOTON II CMOS detector); or at beamline I19, Diamond Light Source, Didcot, UK using silicon double crystal monochromated synchrotron radiation (λ = 0.6889 Å, Pilatus 2M detector). Rigaku frames were converted to Bruker compatible frames using the programme ECLIPSE. Absorption corrections, using the multi-scan method, were performed with the program SADABS. For synchrotron X-ray data, collected at Diamond Light Source (λ = 0.6889Å) data reduction and absorption corrections were performed with xia2. Structures were solved with SHELXD, SHELXT, or by direct methods using SHELXS, and refined by full-matrix least squares on |F| 2 by SHELXL, interfaced through the programme OLEX2. Unless stated, all non-H atoms were refined anisotropically, and unless stated H-atoms were fixed in geometrically estimated positions and refined using the riding model. Supplementary CIFs, that include structure factors, are available free of charge from the Cambridge Crystallographic Data Centre (CCDC) via www.ccdc.cam.ac.uk/data_request/cif.