To further probe the unit cell structural models for C31H64 and C30H61OH, we carried out atomic force microscopy (AFM) on each single-component crystal. AFM allows the measurement of surface forces such as adhesion by measuring the force between the tip attached to the cantilever and the said surface. Figure presents height and adhesion images obtained for C31H64 and C30H61OH crystals. Terracing, defined by plateaus with equal height steps, can be seen in both samples. These AFM images of C31H64 crystals also confirmed that crystals formed in the 'down-chain' orientation exhibited well-defined facets with facet angles of ~109° (Figure ), consistent with BF-TEM images. The regular terracing in the C31H64 sample, enabled the construction of a height histogram (Figure ), from which the height between steps was determined to be 4.0 ± 0.1 nm. From the crystal structure, the half-cell distance is c/2 = 4.1 nm, including interlamellar space, and the carbon-to-carbon distance is C31 -C1 = 3.8 nm, not including terminal protons. The AFM step height is therefore consistent with the molecular chain length extended in the expected linear conformation for C31H64.