The milled crystals were next analyzed in the cryo-TEM by MicroED. Initial electron diffraction patterns collected from the thinned lamella produced very high-resolution diffraction, with diffraction spots extending to beyond 0.6Å (Fig. ), indicating that the lamella did not experience significant FIB damage. Because of the beam sensitivity of these crystals, ultra-low doses were used, with the final exposure of only 0.64 e -/A 2 per data set. This represents a reduction of approximately 36% relative to the previous ZIF-8 study. The ability to both reduce dose and still obtain higher resolution data was largely due to the use of a more sensitive direct electron detector in this study. MicroED data sets were collected from the crystalline lamella, and ultimately data from a single crystal was used to determine the structure of ZIF-8 from a FIB-milled crystal to 0.59 Å (Fig. , Table ).