Vertically stacked twisted layers of two-dimensional (2D) materials provide a fruitful ground for the exploration of unique and novel quantum phenomena in van der Waals (vdW) material systems. Stacking of 2D vdW materials with a small twist angle θ (θ<~10°) and/or a slight lattice mismatch results in the reconstructed moiré superlattices (MSLs), accompanied by the enhanced interlayer coupling. These reconstructed MSLs especially with magic twist angles around θ≈1.1º can host flat electronic bands to form highly correlated phases, even showing superconductivity. In the small angle regime, the commensuration cell lattice constant can be equal to the moiré periodicity D, which is given by 𝐷 = 𝑎 2 sin 𝜃 2 (1), where a is the lattice constant of the constituent layer. For large twist angles (θ>~15°), on the other hand, the commensuration cell lattice constant is generally much greater than D. However, there exist a few special twist angles at, e.g., 13.2° and 21.8º for twisted hexagonal bilayers, where the "commensuration periodicityˮ is equal to D. Thus, from the view point of MSLs, any large twist angles except for the above special twist angles can be regarded as incommensurate twist angles. In the large angle regime, it is believed that atomic reconstruction hardly occurs, meaning that a rigid lattice model is a reasonable representation of the actual system. Although the interlayer coupling is supposed to be suppressed in these incommensurate MSLs, it has recently been revealed that this is not necessarily the case for 30°twisted vdW bilayers, forming quasicrystalline patterns with a 12-fold rotational symmetry. In these quasicrystalline layers, two twisted layers are coupled via Umklapp electronelectron scattering, which results in rich electronic structures, such as mirrored Dirac cones in graphene quasicrystals and mini-gaps near the valence band maximum in tungsten diselenide quasicrystals. Thus, incommensurate MSLs and related moiré potentials have attracted increasing attention, offering an interesting experimental platform to explore moiré physics beyond the small twist-angle regime. However, atomic-scale visualization of moiré potential is highly technically demanding. At present, scanning tunneling microscopy/spectroscopy (STM/STS) is one possible technique available for that purpose. Here we use an aberration-corrected high-resolution transmission electron microscopy (HRTEM) technique as a tool to explore the moiré potential in atomic scale. Although HRTEM has been often employed to obtain atomic resolution imaging of 2D materials and related MSLs, we show that this technique is also applicable for imaging the moiré potentials, which are reconstructed from the moiré diffraction spots in Fourier space. In previous works, the diffraction spots due to moiré potential have not been explicitly observed by HRTEM because of the general presence of hydrocarbon contaminants which are often trapped during the assembly of 2D stacked materials. These contaminants yield a severe background noise in Fourier space, obscuring weak moiré diffraction spots. Furthermore, any interlayer contaminants will modify the interlayer distance, leading to a fluctuation of moiré potential. In this work, we overcome the problem by developing a specially designed chemical exfoliation method to obtain atomically clean MSLs, which are ideal for the investigation of the moiré structure and the related potential by HRTEM technique.