The redesigned, higher intensity Cs + ion source is a significant benefit of the NanoSIMS-HR. While the NanoSIMS 50 and 50L instruments had to meet the 50 nm lateral resolution specification, researchers have pushed to improve on this benchmark. Some researchers have reported better than 50 nm lateral resolution for the standard thermal Cs + ion source on NanoSIMS 50 series , but such performance would not be guaranteed by CAMECA. Others have sought to redesign the Cs + ion source to improve its intensity with some reported success , but no product is available yet for testing. Therefore, a reliable and commercially backed instrument that produces a 30 nm lateral resolution Cs + beam and overall higher Cs + current density is a significant advance for consumer access.