Understanding the growth of crystalline materials requires observing the growth habit and grain orientations. Traditional absorption X-ray tomography provides orientation indirectly by facets seen in density contrast. Identifying crystalline phases and their orientations requires diffraction information, which is possible by additionally interrogating the Laue diffraction pattern during sample rotation, as embodied in X-ray diffraction contrast tomography (DCT). And diffraction contrast tomography can be accomplished even with a laboratory X-ray source (LabDCT) instead of one of the few synchrotron sources. While the DCT method has been used to map grain orientations (with resolutions around 50 µm) in Ti, AlCu, and Zn-Mg alloys, with synchrotron and conventional X-ray tube sources, those studies are on freestanding materials with simple structures.