X-ray diffraction (XRD) measurements (θ/2θ) were performed using a Rigaku Smartlab xray diffractometer with a Cu Kα source operating at 40 kV and 150 mA. XRD patterns were collected over the range of 5° to 60° 2θ. A channel-cut Ge (220) double-bounce monochromator was used on the copper source side to strip the Kα2 and Kβ X-ray lines. Measurements were done at room temperature and under ambient conditions. Single crystals were laid flat on the sample XRD holder so that diffraction patterns were acquired from the larger area surfaces.