Anisotropic line broadening asymmetry is evident in the XRPD pattern. This is a sign of the presence of planar defects, which causes profiles of Bragg reflections to broaden and shift differently depending on hkl selection rules . This pattern characteristic has been commonly observed in minerals such as expandable clay minerals, graphitic carbon, boron nitride, and MoS2 . Peak profiles affected by planar faults may also be convoluted by other line broadening effects such as small crystallite size , in the stacking direction in particular.