In the perovskite semiconductor system, the performance metrics of band gap and stability are largely governed by the chemical composition of the material . However, since the 80 samples are synthesized using the high-throughput method described in Section 2.1, the exact composition of each unique deposit (the value of x) is not known a priori. Traditionally, X-ray photoelectron spectroscopy (XPS) is used to determine the chemical composition but XPS is a time-consuming process. Here, we extract the compositional information automatically and deterministically from the segmented image by mapping it with the synthesis conditions of the liquid deposition tool over space, as shown in Figure and in the following expression: