Additionally, an AFM characterization was undertaken to investigate the surface topographies, with a scan rate of 0.8 Hz in a scanning area of 2.6 µm by 2.6 µm scanned at 512 lines/1 s. AFM was specifically utilized to examine the topography of the electrode surface after sensor modification step. Significantly, the images allowed for the acquisition of the root mean square (RMS) roughness value, a parameter closely associated with surface properties. Fig. shows a typical 3-dimensional AFM images of the scanned areas of the electrode surfaces and their corresponding cropped top surfaces. Fig. shows the image of the bare Au electrode surface with an observed thickness of 0.16 µm and RMS roughness of 66.95 nm (Table ), whereas Fig. exhibits the Pt-B modified electrode surface depicting a much larger thickness of 0.50 µm and a higher RMS roughness (200.5 nm). AFM images of the Pt-B/o-PD/β-CD and Pt-B/o-PD/β-CD/GOx surface modified electrodes are displayed in Fig. and. In case of those modified electrodes, higher thickness (0.54 µm) and RMS roughness (207.1 nm) were noticeable in GOx modified electrodes, which clearly confirms the successful immobilization of GOx on the electrode surface. Moreover, the AFM images of o-PD concentrations along with the RMS roughness values were presented in Fig. . Overall, the morphological and chemical composition analyses conducted using SEM, EDX and AFM are in good concordance and affirm the eminent electrode surface's modification for each experimental step validating the viability of the sensor.