In turn, we next report nanometer-resolved SED analyses of C31H64 crystals. Figure shows an SED dataset from C31H64 crystals prepared in the 'chains-flat' orientation to examine lamellar packing. Figure shows a low-angle ADF-STEM image (formed using an inner angle of 2.1 mrad and outer angle of 7.5 mrad; a visualization of the virtual detector is found in Figure ). Figure The ADF-STEM image exhibits significant variation in intensity, consistent within elongated rectangular regions in the image. To understand the origin of this image contrast, we extracted spatially resolved diffraction patterns from across a set of these regions (Figure ). These patterns show the same set of Bragg spots as in the average pattern (Figure ) but exhibit variation in the intensities of spots across the pattern. Figures and show further examples of similar observations in additional C31H64 crystals. We further confirmed this contrast variation emerges from diffraction intensity variation by constructing virtual ADF images across a series of ADF collection angles (Figure ). With increasing collection angle beyond the Bragg scattering in the zero order Laue zone the contrast deteriorates, indicating the contrast primarily emerges from variation in diffraction intensities.