Diffraction patterns of IND and polymer and polymer/IND extrudates were obtained using an EMPYREAN X-Ray diffractometer (Malvern PANalytical, Espoo, Finland) equipped with a transmission measurement geometry at room temperature and a voltage of 45 kV. The samples were scanned between 5 ° and 40° 2θ with a step size of 0.013° 2θ and a step time of 49.47 s. The ground samples were placed between two slices of Kapton tape and mounted on a transmission sample holder. The diffractograms were evaluated using Origin software.