A JEOL 6060LV scanning electron microscope equipped with an IXRF EDS Elemental Analysis System was used for micrographs and energy dispersive spectroscopy (EDS). A grain of Ni 4 V 3 O 10 was isolated within a sintered pellet using electron backscatter diffraction (EBSD) with a Thermo Scientific Scios2 Dual-Beam SEM/FIB and was cut from the bulk sample in an FEI Helios 600i Dual Beam SEM/FIB. Electron energy loss spectroscopy (STEM-EELS) was performed on the grain with an FEI Themis Z Advanced Probe Aberration Corrected Analytical TEM/STEM.