Transmission electron microscopy (TEM) was conducted using a Talos F200i microscope (Thermo Fisher Scientific) operating at an accelerating voltage of 200 kV using Velox software. The high-angle annular dark-field (HAADF) imaging and the EDX analysis were performed in STEM mode using Dual Bruker XFlash 6-100 EDS Detectors. For TEM sample preparation, KSC power was dried at 80 °C in an oven overnight. Then, the carbon-coated Formvar film of a copper TEM grid was gently rubbed on the fine powders. An inVia confocal Raman microscope (RENISHAW) with a 532 nm laser as an excitation light source was used to collect Raman spectra. The samples were illuminated by focusing the laser light through a 50× objective (Carl Zeiss). The spectral range was set to 50-400 cm -1 with a spectrum acquisition time of 2 seconds. TGA measurements were performed with a NETZSCH TG 209F1 Libra. The sample material was loaded into an alumina crucible. The measurement range was from 30°C to 600°C at a rate of 10°C/min. X-ray photoelectron spectroscopy (XPS) measurements were carried out with a PHI 5800 MultiTechnique ESCA System. To avoid surface contamination, the samples were transferred after preparation in a glove box in an inert gas atmosphere to the sample load lock of the XPS system. The spectra were recorded using monochromatized Al Kα radiation (300 W, 15 kV) and pass energies at the analyzer of 93.9 and 29.35 eV for survey and detail spectra, respectively. Sample charging effects were relatively small; hence, neutralization was not necessary. All binding energies were calibrated to the C1s peak of adventitious carbon at 284.8 eV. The peak fit of the XPS results was done with CasaXPS, using Shirley-type backgrounds and Gaussian-Lorentzian peak shapes. For the peak fit of the Cl 2p, K 2p and Sn 3d peak doublets, the expected intensity ratios and spin-orbit splits were inserted.