X-Ray Diffraction. The diffraction data for 1-4 was collected on a four-circle Agilent SuperNova (Dual Source) single crystal X-ray diffractometer using a micro-focus CuKα X-ray beam (λ = 1.54184 Å) and an Atlas CCD plate detector (in case of 1 and 2) or a HyPix-Arc 100 hybrid pixel array detector (in case of 3 and 4). The sample temperatures were controlled with an Oxford Instruments cryojet. All data were processed using the CrysAlis Pro programme package from Rigaku Oxford Diffraction. The crystal structures were solved with the SHELXT programme, used within the Olex2 software suite, and refined by least squares on the basis of F 2 with the SHELXL programme using the ShelXle graphical user interface. All non-hydrogen atoms were refined anisotropically by the full-matrix least-squares method. Hydrogen atoms associated with carbon atoms were refined isotropically [Uiso(H) = 1.2Ueq(C)] in geometrically constrained positions. The Fo-Fc difference maps were in all cases used to identify disordered thiophen moieties. These disorders were modelled using the SAME similarity restraint command in SHELXL. The anisotropic parameters of the disordered thiophene groups were restrained or constrained using the SIMU or EADP commands in SHELXL. The crystallographic and refinement parameters of 1-4 are given in Table .