The sample was thermally equilibrated at 300 K and was heated using a 5 K/min ramp rate. X-ray diffraction patterns were collected in 10 K steps. After reaching the desired temperature set-point, the sample was thermally equilibrated, and X-ray diffraction pattern was collected. The exposure time for each collected diffraction pattern was 60 s for the dark image plus 60 s for the real image. To obtain 2D plots for in situ synchrotron PXRD monitoring, data were processed in MATLAB.