Single-crystal X-ray crystallography (SCXRD) provides detailed structural information from the solid state. Although the vast majority of small molecule crystal structures are determined by SCXRD, the technique is limited by crystal size and quality requirements, and as a result, SCXRD is unfeasible for phase analysis. Instead, powder X-ray diffraction (PXRD) is commonly used during various stages of solid form screening to identify and characterise new forms. However, peak overlapping resulting from the three-dimensional diffraction data being compressed into one dimension can limit phase identification, especially when the sample contains phases with similar unit cell parameters, large unit cell parameters or low symmetry space groups . Additionally, minor phases present in very low amounts may not be detected.