Scanning Electron Microscopy (SEM NLNG) was employed to examine the Pl-Al/KNPs. The nanoparticles were dispersed on a suitable substrate. SEM apparatus parameters, such as accelerating voltage, working distance, and beam current, were adjusted for optimal imaging. The electron beam was precisely aligned with the sample, and SEM images were captured to visualize the morphology and surface characteristics of the Pl-Al/KNPs. Energy Dispersive X-ray (EDX NLNG) analysis followed SEM imaging. Results were correlated with SEM images to elucidate the elemental distribution on the surface of Pl-Al/KNPs .