Several recent advances have expanded the applicability of MicroED. These include updated sample preparation methodologies, such as focused ion beam milling , pressure-assisted sample deposition and use of microarray robotics . Likewise, software developments have improved the likelihood of determining challenging beam-sensitive samples and, in some cases, informing on their chiral nature , complementing electron nanobeam and serial diffraction approaches that improve greater throughput, and extract crystallographic information from minuscule collections of molecules . Some of these new developments have specifically leveraged new commercial or experimental direct electron detectors (DED), illuminating the promise of these types of sensors for diffraction.