x-and y-dimensions and perfectly matched absorbing layers at the layer-normal zboundaries. The voxel size of the simulations was 10 nm. A unique simulation was performed for each wavelength and structure because the dielectric constants of each material vary with wavelength. The wavelength-dependent refractive index (n(λ)) and extinction coefficient (k(λ)) for the simulated materials were extracted from measurements compiled in an online database for GaAs, polystyrene, silicon, quartz, and TiO2. Simulations were performed on a desktop computer, with each taking roughly 2-4 hours depending on the diameter of the structured nanosphere. Planar simulations were performed with a 100 nm x 100 nm unit cell in the x-y dimensions and otherwise identical simulation parameters.