Atomic force microscopy was conducted on bulk cured polymer specimens utilizing the heated mold. These specimens were embedded in a clear epoxy resin and polished to achieve a smooth surface. Imaging was performed in intermittent (tapping) mode at a scan rate of 0.7 Hz, using an AC160TS cantilever with a spring constant of 26 N m -1 , and a tip radius of 7 nm. The phase images were compared with topography images to verify that the observed features were not artifacts of surface unevenness.