The tips for APT analysis were prepared from a lamella that was lifted out from the Ti coated Specimen, flipped upside-down and welded to flat Si posts inside the FIB. In this way, the Ti surface coating acts as a buffer between the specimen and the carbon-containing welding material, and the apex of each tip could be formed at a controlled distance from the original surface. The tips were formed using annular Ga ion milling, finishing with 2 kV for the final sharpening.