To evaluate the properties of prepared materials, various analytical methods were employed. The crystal structure and crystal phase of the materials were studied by X-ray diffraction technique (XRD, Cu = 1.54 Å, D8 Advance Bruker). High-resolution field-emission scanning electron microscope (HR FE-SEM, MERLIN, Carl Zeiss) and field-emission transmission electron microscopy (FE-TEM, JEM-2100F, JEOL) equipped with an energy dispersive spectrometer (EDS, Oxford Instruments) were used to analyze the particle size, surface morphology and elemental mapping of prepared materials. The nature of chemical states and elemental composition of the materials were studied by using an X-ray photoelectron spectroscopy (XPS). K-Alpha, Thermo Fisher).