SXDM and MCXD Synchrotron measurements were conducted at the ID01 beamline of the ESRF -The European Synchrotron. The X-ray wavelength was set to 1.24 Å (10 keV), with a beam size of 80 nm, and a flux of 10 9 ph/s. For the SXDM experiment the beam was focused down to 80 nm using a Fresnel zone plate, while for the MCXD experiment, the unfocused beam size was controlled by the opening of the slits. The diffraction data was collected by a bidimensional Maxipix detector (512 x 512 pixels) positioned at a distance of 1.6 m from the sample. Detailed descriptions of the beamline and SXDM mapping technique have been presented previously. 2D images of the reciprocal space were collected at each point of the real space map to determine the local variation of the Bragg reflection across the crystal. These maps were measured at different points of the rocking curve (20 angles with a step size of 0.02 • ) to produce a 5-dimensional dataset with each pixel of the 2D image corresponding to a 3D volume in a reciprocal space containing the Bragg reflection. One full 5D scan of a 8 × 12 µm 2 area took approximately 23 minutes. MCXD measurements were done after each SXDM scan by removing the focusing optics and cutting the beam size to 200×200 µm 2 with slits. 1.2 • rocking curve with 20 steps was also performed to cover a larger portion of the reciprocal space. After each set of scans, a detector realignment was performed to center it on the reflection. The obtained data can be accessed through ESRF Data Portal .