For O-GEIS, the resistive heating is not a significant factor limiting the data accuracy or maximum achievable current density. For S3E-CP measurements, the effect of heat generation within each current pulse is already inherently accounted for by the pseudo-steady-state extrapolation methodology . However, when collecting a S3E-CP dataset, the resistive heating will affect each consecutive pulse unless the rest time between pulses is sufficient for full relaxation. The resistive heating is less severe for S3E-CP, for which the measurement time is inversely proportional to current, than for LA-GEIS, for which the measurement time is constant.