Quantification of defects within each particle was achieved using our grey level analysis algorithm, 26 similar to that described in previous work, 27 with adaptations to the original method for faster computation and deeper understanding of the particles' behaviour. Details can be found in the methods and SI, with the full algorithm methodology presented in Jones et al. Particles were individually labelled (see Figure ) which facilitated the quantification of particle properties. These unique particle labels are also translated throughout all 12 X-ray CT datasets, such that particles have consistent labels through all scans, and therefore also throughout the electrochemical history. The mean pixel intensity for all particles in the area analysed was calculated and it is evident that there is a non-linear increase in damage as voltage is increased (See Figure ).