Here, we focus on the data analysis method developed to study grey-level change in XCT images of particles due to degradation, and prove the statistical significance of this approach in the case of NMC811 secondary particle cracking. Presented here are two case studies used to demonstrate this method. Case study 1 looks at the degradation of an NMC811 cathode that was harvested from a commercial cell (LiFun Technologies, China). The sample was imaged ex-situ in both the pristine state and at the top of charge. The tomography was performed using a commercially available laboratory micro-CT microscope. Case study 2 looks at crack formation during the first charge/discharge cycle in NMC811 particles. The data set is operando and looks at a single region of interest (ROI) that degrades over time at multiple different SoC. In this case study, we demonstrate how 10,000+ particles can be automatically tracked through these SoC. In this case, the tomography was performed at the Diamond Light Source (DLS) synchrotron I13-2 beamline.