For X-Ray diffraction, all samples were measured on a Rigaku SmartLab Diffractometer. A Hypix-3000 detector and a Cu-Kα tube without a monochromator were used. The patterns were recorded in a 2θ range of 10-80 ° at a scan rate of 1.5 °/min. Measurements were carried out in argon atmosphere using airtight sample holders. All patterns were analyzed via the Rietveld method with Bruker TOPAS software. The data corresponding to these measurements are discussed in more detail in chapter 3.1.