In this study, we quantitatively investigated the critical dose tolerance of ZIF-8 using the fading intensity of Bragg planes in diffraction space and verified with displacement of Bragg planes method. Measurement of the critical dose of {110} Bragg plane from both methods provides relatively close values. The critical dose measurement derived from the relative displacement of the Bragg plane can be used as a criterion, along with the relative intensity fading, to evaluate crystal stability under electron beam exposure. The measurement of the critical doses from relative intensity fading and relative displacement of different planes provides further information about the mechanism of loss of ZIF-8's crystallinity as a function of cumulated electron dose. The high index planes, such as {431} with a lower number of ZnN4 tetrahedra per unit cell, collapse twice as fast as {110} planes. The critical dose to break N-Zn bonds in one ZnN4 tetrahedra is consistent across Bragg planes at about 3.2 e -Å -2 , indicating simultaneous bond rupture throughout the crystal, confirming that the radiolysis damage mechanism will dominate in TEM imaging experiments as well as in other electron-beam processes such as EBL. The critical dose limit to resolve the 6MR gate or aperture during HRTEM imaging without introducing any lattice displacement is around 9 e -Å -2 . ZIF-8 seems to be a dose-rate-independent material. Once the cumulative dose exceeds a threshold value, ZIF-8 loses its crystallinity.