Electrical measurements were performed on a Signatone S-302 four-point probe, and all sheet resistance measurements were based on an average of at least ten different spots on the film. Scanning Electron Microscopy (SEM) images were captured using an FEI NovaSEM 450. X-ray diffraction (XRD) measurements were performed using a Bruker D2 Phaser Diffractometer. Raman was performed on a 514 nm laser excitation using the Renishaw system 2000. XPS was performed using a K-Alpha Thermo Fisher Scientific XPS instrument, and the spectra were deconvoluted using CasaXPS. UV-Vis spectra were collected using a Perkin Elmer Lambda 1050 instrument. Transmission electron microscopy (TEM) images were captured on a Tecnai 12 D1122 twin using a WAC CCD camera. The sample was mounted on a Quantifoil R 2/2 Copper 400 mesh grid.