Besides irreversible resistance changes caused by AM or electrolyte degradation, there can also be reversible resistance changes, particularly due to changes in temperature. From the PEIS measurements of an LCO symmetric cell at different temperatures from 0 to 30 °C, the activation for the interfacial charger-transfer reaction was calculated from the Arrhenius equation to be 54.8 kJ mol -1 (Fig. ). At 25 °C, a 0.1°C or 1.0°C increase in temperature will therefore cause, respectively, a 0.7% or 7.0% decrease in the measured interfacial resistance. Consequently, very precise temperature control (± < 0.1°C) with an environmental chamber is required to ensure the accuracy and comparability of the measurements. More importantly, even very slight resistive heating, which can occur during high-current measurements, significantly affects the measured resistance. The otherwise stationary nature of LA-GEIS enables the use of very high current excitations, making it the most affected by resistive heating. Fig. shows the first PEIS spectra collected immediately after a single-point LA-GEIS measurement at 1Hz with different excitation currents, while Fig. shows the impedance versus time measured with PEIS every ~ 15 seconds afterwards. At an excitation of below 25 mA cm -2 , the resistive heating is negligible, while at 100 mA cm -2 , the measurement causes a 4% decrease in impedance. At very high current densities, and especially at low frequencies, the resistive heating becomes so severe that not even a single impedance point can be collected without temperature changes affecting the accuracy of the measurement . Ideally, the impedance change due to resistive heating should be limited to < 1%, which under these conditions limits the maximum excitation current to ~ 50 mA cm -2 .