X-ray diffraction (XRD) was carried out using a PANalytical X'PertPRO X-ray diffractometer (Cu Kα1 radiation) using step size, current, and tension voltage of 0.05°, 40 mA, and 45 kV, respectively. Fourier-transform infrared attenuated total reflection (FTIR-ATR) spectroscopy was performed using a Perkin Elmer Spectrum 2000 FT-IR spectrometer. The particle size and morphology of the formed liquid phases during the in-situ synthesis were characterized using transmission electron microscopy (TEM, JEM 2100, JEOL, Japan, accelerating voltage 200 kV).