To quantify the deviation of 𝛾 ̂(log 𝜏) from the exact 𝛾(log 𝜏), we utilized the following two errors : To assess the quality of the recovered DRTs, we employed synthetic experiments. We utilized well-defined models, such as the 1×ZARC, 2×ZARCs (separated, distant, and close), Gerischer, piecewise-constant, Havriliak-Negami, and fractal models (see Table of the Supplementary Information (SI) for the values of the circuit parameters). Frequencies were spaced logarithmically between 10 mHz and 1.0 MHz with 10 points per decade. These models were then corrupted with Gaussian noise (𝜎 𝑛 exp = 0.2 Ω) . 100 synthetic experiments were generated for each model.