We further performed flicker noise analysis experiments for R6 at a solution concentration of 1 mM. Flicker noise analysis has been used in prior work to understand the nature of electronic coupling at metal-molecule interfaces. In this way, through-bond transport is distinguished from through-space transport based on the power-law exponent of 'noise power' (determined from power spectral density analysis of conductance fluctuations) versus average conductance. Intermolecular charge transport typically results in larger fluctuations in conductance, which corresponds to through-space distributions of flicker noise. Our results show that the noise power scales as G for the high G and G for the low G state, corresponding to through-bond coupling in molecular junctions (Supplementary Fig. ). Taken together, the combination of flicker noise analysis and control experiments indicates that the high G state arises from molecule-electrode linkages between SMe anchors at both termini.