The CuO NPs were characterized by X-ray diffraction (XRD) (Rigaku MiniFlex600 Diffractometer) with Cu Kα radiation (λ = 1.5418 Å), and with nickel filter in secondary optics, power of 40 kV, current of 30 mA and 1° divergence slit. 2 was scanned from 5º to 50º, with a step of 0.02°.The Scherrer equation was used to calculate the crystallite size from XRD patterns according to Equation 1 : 𝐷 = 𝐾𝜆 𝛽 𝑐𝑜𝑠 𝜃 where D is the crystallite size, K is the Scherrer constant (0.9), 𝜆 is the wavelength of the X-rays used (0.154 nm), 𝛽 is the full or full width at half maximum (𝐹𝑊𝐻𝑀, radians), and 𝜃 is the peak position (radians) .