Crystallinity was measured in both θ-2θ X-ray diffraction (XRD) and grazing incidence XRD (GIXRD) geometries using a PANalytical EMPYREAN MRD diffractometer with a Cu X-ray tube, wavelength 1.54 Å operating at 45 kV and 40 mA and using the mirror and parallel plate collimator, on incident and diffracted beam optics respectively. X-ray photoelectron spectroscopy (XPS) was used for surface analyses comprising elemental compositions and chemical bonding. The spectrometer was a Kratos AXIS Ultra DLD, equipped with an Ar sputtering source and employing monochromatic Al Kα x-ray radiation with 150 W power (anode current = 10 mA and anode voltage = 15 kV). To remove the surface oxide and other surface contaminants, which is a result from air exposure and to do a depth profile, sputter etching with a beam energy of 0.5 keV was used. Survey scans for qualitative analysis were carried out in the range 1200 eV to -5 eV, with a 1 eV step size and a dwell time of 300 ms.