Pulsed formation is used to accelerate the charging of the formation process, which is otherwise a time-consuming production step and is demonstrated to not highly affect cell quality. This was first shown on automatically assembled NMC (622) |graphite CR2032 coin cells. The results hint towards a difference in composition of pulsed and CC SEIs and a thinner SEI for pulsed formation, in agreement with literature . Quality estimation and comparison was done using determined values of ASI from HPPC tests, voltage decay values of self-discharge measurements as well as aging tests following the formation. Scaling-up the results to prismatic PHEV1 cells shows comparable results and quality in aging tests, using pulsed formation but bisect formation time.