Simulated X-ray diffraction patterns of three carbon allotropes ('glitter', 'neoglitter' and diamond) are shown in Fig. . The observed differences of diffraction lines intensities of 'glitter' and 'neoglitter' are likely related to the different topologies of these two structures identified by TopCryst analysis program respectively as "tfi" and "tfa" in RCSR (Reticular Chemistry Structure Resource) nomenclature.