The examination of crack formation, propagation, and reduction, whilst employing a commercially relevant pouch cell, signifies an advancement in the understanding of NMC811 fracture behaviour. Using our grey level analysis algorithm for fracture detection has introduced a high level of statistical robustness, validating the understanding of fracture behaviour previously divulged during high resolution, small field of view imaging, where here we have now quantified the fracturing in 7,000+ particles, orders of magnitude greater than previously seen. This approach has unveiled the existence of non-linear cracking phenomena with respect to increasing potential, and the existence of cracking at notably low voltage levels, exemplified by instances at 4.0 V and 4.1 V during charge, and a notable amount of cracking even during discharge to 3.8 V. We see that on average there is no significant increase in the cracking between 4.2 and 4.4 V; however, literature has routinely showed that charging to a higher cut off voltage will reduce the lifetime of the cell. Thus, we also suggest that the degradation incurred at voltages higher than 4.2 V is a direct result of electrochemical reactions with the electrolyte and oxygen loss, and not inherent to cracking itself (from increased changes in crystal lattice parameters with increased upper cut off voltages). If the observed increase in capacity fade at higher voltages was primarily due to cracking, we would see a significant difference in cracking between 4.2 V and 4.4 V, not seen in this work.