X-ray Computed Tomography (XCT) has been used extensively to study NMC secondary particles . When studying the cracks that form at the particle scale during cycling, nano-resolution XCT (nano-CT) can be utilised . In previous work from our group, Parks et al. showed that electrochemical cracking occurs at high State-of-Charge (SoC), above c-lattice collapse , even during the first charge/discharge cycle. This work showed that cracking was most intense at the centre of NMC811 particles with smaller cracks advancing radially outwards from the centre. This demonstrated the capability of nano-CT to directly observe different cracking mechanisms in NMC secondary particles. This is shown in figure .e,f where we have reproduced nano-CT slices of pristine and 4.5V SoC NMC particles from Parks et al.