SXDM was used to map the interlayer d-spacing of NMC-622 particles ex situ. Details regarding the microscope and data analysis have been published elsewhere. Briefly, a nanofocused X-ray beam is rastered across the sample of isolated particles dispersed on a substrate. The diffraction signal from the 003 NMC reflection at each pixel is measured with high angular resolution. A rocking curve is performed, collecting a stack of images while rotating the aligned microcrystal through the Bragg reflection. The 2D real-space images plus the 3D reciprocal space maps for each pixel produce a 5 dimensional dataset. The peak position of the diffraction is fitted for each pixel, from which crystallographic structural parameters can be extracted (Fig. ).