The chemical phase of the deposited coatings was investigated by an x-ray diffractometer operating at a voltage of 45 kV and a current of 40 mA. The x-ray with a characteristic wavelength of 1.54 Å generated from a Cu target was used to probe the samples at θ/2θ geometry with 2θ scanning from 20° to 140°. A nickel filter was placed in front of the detector during the measurement to remove the undesired Cu-kβ radiation. The resulting diffractograms were compared with the Powder Diffraction File (PDF) cards for identifying the chemical phases in the coatings. Scanning electron microscope (SEM) was utilized to investigate the surface morphology and cross sections of the samples.