the electron microscopy of the perovskite nanoplates was performed in a TEM-Titan Cubed Themis (FEI company) equipment. The images were acquired with 300 kV in High-Angular Annular Dark Field mode (HAADF-STEM). The samples were prepared in a holey carbon coated TEM copper grid. To prepare the samples, we dripped 3 µl of a 1 mg/mL of the perovskite nanoplates suspensions in hexane and allowed it to dry in the ambient. The grids were loaded into the equipment and remained under reduced pressure overnight. To remove the excess of organic compounds, a 20-minute beam shower was performed in a large area of the grid to avoid excessive beam damage.