Bulk morphology and composition of the deposited films were analyzed using scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS). Cross-sections were prepared using a combined focused ion beam (FIB) and scanning electron microscope (SEM) (Crossbeam 1540 EsD, Zeiss) instrument. Prior to sectioning, a thin layer of Pt was deposited to protect the sample. Sections were first made with a Ga ion beam energy of 30 kV and a current of 1 nA with finer polishing using 200 pA and 50 pA. EDS mapping was performed with a GeminiSEM (Zeiss) fitted with an EDS detector (Oxford Instruments). The microscope was operated using an acceleration voltage of 10 kV and the sample was tilted to an angle of 45 ᵒ to the electron beam, to be able for the electron beam to 'see'