Electron beam-induced crystal reorientation could, in part, account for the comparably poor data quality observed in MicroED data collected from small molecule crystals compared to their larger counterparts by X-ray diffraction. Reorientations of 1-2 degrees can be incorrectly interpreted by data reduction software as increased crystal mosaicity, which does not appropriately correct for the deviation in all reflection positions. Instead, the errors resulting from beam-induced reorientations can be partially accounted for by refinements to crystal orientation performed on small batches of images in the dataset. However, the degree to which these batches can be reduced is limited. If too few reflections are considered during each refinement, additional errors may be incurred in data reduction. Further, if reorientations are sufficiently dramatic, as those we witnessed for room temperature Zn(II)-methionine crystals and select crystals of biotin and Cu(II)serine, data reduction statistics may suffer even if these refinements are implemented. As such, we envision the ideal approach for addressing these effects to be integration of serial crystallography indexing routines, such as those performed by nXDS, as a post-refinement correction implemented following traditional rotation crystallography indexing of a MicroED tilt series.