Analysis of the decays with fitted exponential lifetimes 50 verifies these trends, with kRISC being higher when more Br atoms are introduced within the emitter (Table ). Two different methods were compared for the decay analysis to explore if the enhanced aggregation (leading to complex decays) affects the calculated rate constants, and the results are broadly similar (Table ). To assess the performance of the emitters in a device-compatible host (and at device-relevant concentrations), time-resolved measurements were also performed on 1 wt% mCP films.