The direct beam (I0), beam following the sample (I1), and beam following the reference foil (I2) were simultaneously measured using three Ar-filled ion chambers in series. Spectrum normalization and alignment were performed using the Athena software package. In situ XRD In situ heating XRD measurements were conducted in the 2θ range of 16-58°with a step size of 0.0143°and step time of 78 seconds using an X-ray diffractometer (Empyrean, Malvern Panalytical) equipped with Cu Kα radiation (wavelength λ=1.5406 Å). A hightemperature oven chamber (Anton Paar HTK 1200N) was used to control the temperature and gas environment. A scanning 1D detector (Malvern Panalytical GaliPIX 3D ) was used.