The false color orientation maps and pole figures are extracted from the respective phase images using the GT Fiber software , we also apply GIXD to measure the degree of alignment in the crystalline domains. GIXD measurement is conducted with the incident X-ray beam parallel (φ = 0º) and perpendicular (φ = 90º) to the coating direction, and dichroic ratio is calculated by RGIXD = I||/I⊥, where I|| and I⊥ are the intensity of edge-on π-π stacking peak (010) obtained at φ = 0º and φ = 90º, respectively (Figure ). The film RGXID reaches as high as 11.79 for film coated from CN, compared to DCB and CN films with much lower RGIXD values of 0.58 and 0.83, respectively (Figure ). Besides dichroic ratio, there is also differences in the FWHM of in-plane π-π stacking peak and out-ofplane lamellar stacking peak, as summarized in Figure . The FWHM of π (lamellar) stacking peak from CN film is 0.106 (0.048), which is smaller than 0.119 (0.050) of DCB film and 0.139 (0.061) of decane film, which we attribute to reduced paracrystalline disorder in CN film .