The detector calibration was performed using a CeO 2 standard. Every 2D diffraction image was calibrated and azimuthally integrated to a 1D powder diffraction pattern with a 10 % trimmed mean filter using the pyFAI software package, nDTomo software and in-house developed scripts 58-60 . The integrated diffraction patterns were reshaped into sinograms and centered; the air scatter signal was subtracted from the data. For the conventional data analysis approach, the XRD-CT images (i.e. reconstructed data volume) were reconstructed using the FBP algorithm. A pseudo-voigt peak shape function was used for the refinements after the analysis of the CeO 2 pattern. Rietveld analysis was performed on the reconstructed diffraction patterns with the TOPAS software version 7 on a voxel by voxel basis. Rietveld analysis was first performed using the summed diffraction pattern of each XRD-CT dataset (i.e. to provide a good starting model) before running the voxel-by-voxel Rietveld analysis to provide the spatially-resolved physico-chemical information. The parameters refined were the scale factor, lattice parameter and crystallite size for each phase. A 2nd order Chebyshev polynomial was used to model the background as it was fairly flat in all reconstructed patterns. A workstation with an Intel Xeon W-2155 CPU, a NVidia Quadro RTX8000 GPU, and 128 GB of RAM was used to perform the ParallaxNet and full profile analysis on all datasets presented in the paper.