Microscopy and energy-dispersive X-ray spectroscopy (EDS) images were captured using a scanning electron microscopy (Model: FEI Quanta 200 FEG, Make: Joel Co.). Raman Spectroscopy tests of the sample were performed using the InVia TM confocal Raman Microscopy. Transmission Electron Microscopy (Fei Themis Z G3) was performed by extracting a lamella from the sample using a ThermoFisher Helios 5 UC focused ion beam system (FIB), further applied for the analysis of the crystallographic structure and lattice spacing. X-ray photoelectron spectroscopy (XPS) studies were carried out utilizing a Scanning 5600 AES/XPS multi-technique system (PHI, USA).