The measured modulus for each of the I and M layers and the I/M ratio are summarized in Figure . We averaged the data from 6 modulus maps from the samples with sufficient thickness of I layer (i.e., λphase = 486, 1168 nm). The reference data were obtained from DMA measurements on rectangular bar samples, by using WLF time-temperature superposition to determine the modulus at the same temperature and frequency used in the AFM measurements.