Room temperature powder X-ray diffraction (PXRD) data were collected with a STOE StadiP X-Ray diffractometer in transmission geometry between 2Θ = 5° and 30° for all samples, which were placed on flat surfaces. Cu-Kα1 radiation (λ = 1.541 Å) was used for the measurements together with a Mythen 1K detector. Temperature-dependent powder X-ray diffraction (T-PXRD) patterns were recorded using a Bragg-Brentano type diffractometer (X'PERT-Pro, PANalytical with Cu-Kα1 radiation (λ = 1.541 Å), equipped with a secondary monochromator to suppress fluorescence. The sample was placed on a flat surface in a flowing nitrogen atmosphere in an XRK chamber during the measurement.