Particle morphology can be determined via imaging using microscopy such as optical light microscopy (OM) or digital microscopy. However, the maximum magnification power of OM is 1000x due to the low resolving power of visible light. Thus, other techniques such as electron microscopy (transmission electron microscopy (TEM) and scanning electron microscopy (SEM)) are widely used for the characterization of small particles such as nanoparticles . The particle morphology can be determined via a physical probe using scanning probe microscopy (SPM, e.g., atomic force microscopy (AFM), STM, scanning tunneling microscopy (STM), and scanning probe electrochemistry (SPE)).