XRD was used for analysing the phase purity of the synthesized electrode composites and the structural changes within the active material occurring during galvanostatic cycling. The measurements were recorded on a Rigaku Smart Lab diffractometer in Bragg-Brentano geometry with Cu Kα radiation with a Hypix-300 detector using the detector's XRF reduction mode. All the samples were sealed inside the Ar-filled glovebox in the low-background air-tight sample holders. Data were generally recorded in the angular range between 10 ° and 80 ° 2θ for a total measurement time of 4 hrs 18 min with a step size of 0.0050 ° and a divergence slit of 0.3 °. The data were analysed using the Rietveld method with the program TOPAS. The instrumental intensity distribution was determined using a reference scan of LaB6.