Development in chips (substrates/supports) that allow for in-situ biasing, heating etc. of FIB lamella will also go into active PSC research. Developments in TEM (Transmission electron microscopy) could easily be transferred to the STXM environment as TEM is a technique that has similar constraints (if not more) to STXM. Recent developments in ptychography enhanced STXM, especially at lower energies , will further open doors for high spatial resolution studies that will not be limited by the zone plate optics. This technique can also use a defocused X-ray beam and hence has the potential of reducing the radiation-induced sample damage.