However, there is no good way to relate values of ψ6 to the possibility of a fluctuational defect, outside of choosing an arbitrary cut-off. Conversely, since 𝑅 " is a measure of actual distance, we can define a fluctuational defect when 𝑅 " > 𝑟 ( /𝐿 ( × 100, where 𝑟 ( is the effective diameter of the BCP dots. From SEM data we estimate the average dot size to be ~8 nm (see Figure ), which is an overestimation due to charging effects and non-zero spot size of the electron beam.