We note that, while the lower voltage cutoff is identical across all cells, the depth of discharge (DoD), defined by Coulomb counting, varies slightly from cell to cell because of differences in overpotentials induced by the dynamic profiles. Figure shows that such DoD variations (reaching up to 10% at C/2) have no impact on EFCs for fast-cycled cells (C/2). While slow-cycled cells (C/10 or C/5) show a dependency on DoD, slow-cycled cells with similar DoD (within a 4% DOD window) also exhibit spreads in EFC in line with those of Figure . This confirms that the variability is mainly induced by differences in the dynamicity of the discharge profiles.