The electrical resistance of LIGs was measured using a four-point probe equipped with a Keithley 2400, UK. Scanning electron microscopy (SEM) studies were performed using a Quanta 250 FEG microscope (ThermoFisher Scientific) equipped with a Schottky field emission gun, operating at an accelerating voltage of 30 kV after magnetron sputtering of a 5 nm gold layer. X-ray photoelectron spectroscopy (XPS) analyses were carried out using a K-Alpha spectrometer (ThermoFisher Scientific), operating an AlKα X-ray gun with a 250 µm spot diameter. The pass energy was set to 20 eV for the high-resolution spectra. The low-energy electron and Ar + ions flow was used for charge compensation with a final peak calibration and peak deconvolution using Avantage v5.9921 software, provided by the manufacturer. Raman measurements were performed using Xplora (HORIBA, France). The contact angle was measured with a DSA100 goniometer (Kruss, Germany), at room temperature, with 2 µL drops of water applied. The contact angle was recorded with a CCD camera and the average value of the wetting angle was determined using ADVANCE software, with the Young-Laplace method. Each measurement was repeated 20 times.