A Wyko NT1100 Profilometer was utilized for mapping the surface roughness of the printed substrates. The system was calibrated with a modulation threshold of 3%, at vertical scanning interferometry (VSI) mode. The parameters set were at 368 X 240mm window size for imaging all 9 squares, with 0.00 mm sampling. Images were taken at 5X objective, and X/Y profile graphs as well as 3-D projections were acquired.