By analyzing system response across varying frequencies, EIS provides insights into electrochemical mechanisms, device performance, and degradation pathways . However, the complexity of EIS data often presents a significant analytical challenge as interpreting intricate impedance spectra to extract physical parameters and identify underlying processes remains difficult. To address this, the distribution of relaxation times (DRT) method has emerged as an effective alternative to conventional equivalent circuit models . DRT decomposes the impedance response into a distribution of time constants, enabling the association of timescales with specific electrochemical processes without relying on a priori circuit assumptions. Mathematically, the DRT-based impedance, Z DRT (f ), at a given frequency, f , is expressed as