We fabricated strain-and contaminant-free hBN layers with different twist angles using the intercalation-based exfoliation technique and observed their HRTEM images. The FFT of the HRTEM images allowed us to recognize moiré diffraction spots, and their IFFT computations provided information about the interlayer moiré potential, as corroborated by the DFT calculations. Also, the DFT calculations highlight the importance of the local interlayer atomic overlap in establishing the moiré potentials both in the commensurate and incommensurate cases. The present results not only pave the way for observing the moiré potentials in twisted hBN layers, but they also expand the application of electron microscopy to visualizing the moiré potential in a variety of MSLs especially with large twist angles.