In situ and ex situ Raman spectra were recorded with a Renishaw Raman spectrometer using a 5 mW 633 nm excitation laser and 1800 mm -1 grating. Before each set of measurements, detector calibration was conducted by measuring an internal Si wafer (521 cm -1 ). A laser line focus module was utilized to obtain spectra by spreading out the laser intensity with approximately 20x lower laser intensity per area. Spectra were collected in the range of 100-1800 cm -1 with an exposure time of 5 min for each acquisition. The laser power was 5 mW. An immersion objective (numerical aperture of 0.8) was used with a custom gas diffusion electrode for maximum signal intensity. These spectra analyzed and processed using WiRE 4.4 and OriginPro 2022 software. The spectra were baseline-substrated using the polynomial feature of eight order, and cosmic rays were removed.