UV-vis spectra were recorded using a Cary 5000 UV-Vis-NIR spectrophotometer from Agilent Technologies. As samples, the 2H-MoS2 nanosheet coated FTO windows, previously employed for EMAS measurements, were used. The same samples were also used for SEM measurements that were performed using a Hitachi SU 8030. Information about the height of the 2H-MoS2 nanosheet films on FTO glass and on Pt-IDE substrates was obtained using a Bruker Dektak XT-A stylus profilometer measuring over the edge of the film coating over a distance 1000 µm using a tipforce of 1 mg. For identifying the layer thickness and the lateral size of the 2H-MoS2 nanosheets, the colloidal solution was dropcast onto a carbon-coated copper grid (Quantifoil) and measured by TEM with a Tecnai G2 F20 TMP microscope (FEI) with an acceleration voltage of 200 kV.