Root mean squared (RMS) surface roughness analysis was performed using a Bruker ContourX-500 3D Optical Profilometer equipped with dual color LED illumination (white light and 532 nm green light), automated objective turret with 2.5×, 5×, 10×, 20×, and 50× objective apertures, and additional internal 0.5-2× zoom lens (for a maximum of 100×). RMS surface roughness measurements were acquired via phase shift interferometry using the 532 nm illumination source in order to achieve sub-angstrom resolution. Measurements were acquired with the 10× objective and 1× internal zoom lens (xy pixel size of ~790 nm). 1×1 mm area maps were constructed by stitching 6 separate images together with ~20% overlap with neighboring images.