To visualize and quantify the uniformity of the spin coated thin films, an atomic force microscope (Digital Nanoscope III AFM) was used on samples of 10mg/mL 30K mW PS, 20mg/mL 1080K mW PS, and 30mg/mL 2000K mW PS. The samples chosen for imaging are representative of the lower, middle, and upper range of the thicknesses generated through the initial set of spin coated samples.