PII-2T Film Fabrication: PII-2T films were printed onto OTS-treated Si substrates using a blade-coating method reported in our previous publications . An OTS-treated Si substrate was used as a blade. The coating speed was set to 0.5 mm/s for all the films printed in this work. Freeze-drying of solution samples: 2 µL of solutions were sandwiched between 2 glass slides coated with poly (sodium 4-styrenesulfonate) as sacrificial layers for subsequent film transfer to TEM grids or SEM substrates. The sandwiched samples were first heated to desired temperature on a heating hotplate, then were quickly submerged and frozen in a liquid mixture of 63% propane and 37% ethane followed by transfer into liquid nitrogen. The two glass slides were separated while submerged in liquid nitrogen and were then transferred into a nitrogen environment in a Linkam stage chamber (LTS 420) wherein the temperature was set to -120 °C. Then the temperature was raised to 50 °C lower than the melting point of the solvent used. For instance, the chamber was held at -80 °C if a solution dissolved in decane (m.p. = -30 °C) was used. Then the vacuum was applied in the chamber for about 8 hours to sublimate the solvent while preventing solution melting. UV-Vis Spectroscopy: UV-Vis absorption spectra of PII-2T solutions were recorded at various temperature using Agilent Cary 60 UV-Vis spectrophotometer. The vibrionic peak positions were determined by performing multipeak fitting. Polarized UV-Vis absorption spectra were collected by polarizing incident light with a broadband thin film polarizer. Optical Microscopy: The solutions were sandwiched into two microscope glass slides to be observed under the optical microscope (Eclipse Ci-POL, Nikon). The lyotropic LC phase in DCB solutions and the birefringence of PII-2T films were observed using cross-polarized microscopy. Small Angle X-ray Scattering: Solution SAXS measurement was performed at beamline 12-ID-E of Advanced Photon Source at Argonne National Laboratory. The scattering profiles were collected with an incident X-ray beam having an energy of 13.3 keV and a sample-to-detector distance of 3622.78 mm. Polymer scattering data were corrected for background scattering