Elemental composition was determined from energy dispersive X-ray spectroscopy (EDX) bulk analysis on a Hitachi TM3030 PLUS tabletop scanning electron microscope (SEM) equipped with an Xplore Compact 30 detector from Oxford instruments and operated at an acceleration of 15 kV. High-angle annular dark-field scanning-transmission electron micrographs (HAADF-STEM) and energy dispersive X-ray spectroscopy (EDX) elemental mapping were obtained on a Thermo Scientific Talos F200X (S)TEM microscope with an acceleration voltage of 200 kV with 10 a Super-X EDS system. Each sample was checked again after every measurement to exclude beam damage.