Consequently, although nH did not correlate with IDS,min, gmh, or gme, both nH and IG/I2D were closely correlated with VDP. As VDP is a key feature value in sensing applications, Raman Analysis across Multiple GFET Chips. To further confirm the versatility of Raman analysis in characterizing GFETs, we performed the same analysis on multiple chips. Given the substantial variation in properties of graphene obtained from different suppliers, we purchased monolayer CVD graphene films from four vendors. Vendor #1 used epitaxial Cu films on sapphire as growth substrates, whereas the others used Cu foils. Figure (a) shows ωG-ω2D plots from multiple GFET arrays. Despite using a consistent wet PMMA-assisted transfer process, the ωG-