Scanning Electron Microscopy. The printed assemblies were characterized by scanning electron microscopy (SEM) (Zeiss LEO Gemini 1550) operating at an acceleration voltage of 2kV. All samples characterized by SEM were coated with 5.5nm-carbon film via physical vapor deposition (PVD) to avoid the charging effects of the glass. In all cases, the comparison between assemblies were examined at the same laser power (14 mW) and time growth (10 s).