Powder X-ray diffraction (PXRD) measurements were conducted using a Cu Kα radiation source and a Lynxeye XE-T position-sensitive detector on a Bruker D8 Discover diffractometer to verify phase purity. Before measurement, the samples were placed on a "zero diffraction" Si wafer. Crystallite sizes were determined by examining the peak broadening in the PXRD patterns. As the Bragg reflections broadened beyond the resolution of the instrument, the Lorentzian linewidth was used to estimate the crystalline coherence length using Rietveld refinement in TOPAS v6.