Ex-situ X-ray diffraction (XRD) patterns were collected with a Malvern PanAlytical Empyrean 3 diffractometer with a Cu Kα radiation source (λ = 1.5418 Å) and a PIXcel 3D detector in 1D mode operated in Bragg Brentano (-) geometry, using iCore and dCore optics with automatic slits set at 10 mm irradiated length and a collection time of 1h. In contrast, a Mo-source was used for in operando measurements due to its higher penetration, high intensity and compressed pattern which allow to measure all peak of interests in a static configuration. They were collected on a Malvern PanAlytical Empyrean 3 diffractometer with a Mo Kα radiation source (λ = 0.7093 Å) with focusing mirror optics and a GaliPIX 3D detector in static 1D mode with 30 s integration time, and an omega angle of 12,5°. Scanning electron microscope characterization was conducted on FEI Quanta 450 Environmental Scanning Electron Microscope (FE-ESEM). Transmission electron microscopy (TEM) images were obtained with a JEOL JEM-2100F FEG-TEM, operating on 200 kV.