Vis Spectroscopy , analysis of particle size distribution using dynamic light scattering (DLS) , and/or imaging methods such as Transmission Electron Microscopy (TEM) and AFM . UV Vis spectroscopy is limited by light scattering, interference from multiple absorbing species, opaque samples and particle concentration . Furthermore, UV wavelength selectors are not perfect, and a small amount of light from a wide wavelength range can still be transmitted, resulting in significant measurement errors. Similarly, for DLS, the scattering intensity depends on the 6 th power of diameter ( I d  ), large particles even in very small amount affect the measurement . TEM is an alternate technique for characterising growth-kinetics of metal nanoparticles, however it has limitations that it can't be used for in-situ measurement particularly at the interface of an aqueous salt and a soft solid.