Hence, in this study, we provide insights into the mechanism of sequential loss in ZIF-8's crystallinity from pristine to amorphous state as a function of cumulated electron dose and compare the effects of TEM experiment parameters on the measured critical dose. We systematically explored how electron beam exposure under different experimental conditions impacts the crystallinity of ZIF-8. We quantified this by measuring the relative intensity fading and the relative displacement of ED Bragg planes as the function of cumulative electron dose. Bragg planes corresponding to low index planes such as {110}, {211}, {220} and {200}, as well as high index planes such as {400} and {431}, are used as indicators of the stability of structural features in ZIF-8 crystals (e.g. of ZnN4 tetrahedra). The critical doses for the Bragg planes were measured by a 37% intensity fading . Determining the critical electron dose limit for the {431} Bragg planes is essential, as this indicates the maximum electron beam exposure that keeps the pore structure intact .