Morphological analyses were conducted using scanning transmission electron microscopy ((S)TEM) and scanning electron microscopy (SEM). Specifically, TEM images were acquired with a Tecnai G2 F20 S-Twin instrument from ThermoFisher Scientific, operating at a maximum of 200 kV. SEM images and EDS data were obtained using an FEI Quanta FEG 450 ESEM, operating at an accelerating voltage of up to 100 kV. Nanoparticle tracking analysis (NTA) profiles were procured using a Malvern Panalytical. Nanosight NS300 is equipped with an sCMOS camera and a blue488 laser (3 times replica or more). Zeta potential profiles were acquired using a Malvern Zetasizer from Malvern Panalytical, averaging three or more replicates.