Powder X-ray diffraction measurements (PXRD). Data were collected on a Bruker D8 DAVINCI diffractometer equipped with a position sensitive LynxEye detector with Bragg-Brentano parafocusing geometry. Cu Kα1 (λ = 1.5406 Å) radiation was used through a 0.012 mm Ni filter. The samples were compacted into 5 mm disks on a low background silicon substrate and rotated during data collection in the 2θ range of 2-50° at ambient temperature.