operating at an accelerating voltage of 80 kV. For TEM sample preparation, powders were ground using a mortar. Then, the carbon-coated Formvar film of a copper TEM grid was carefully rubbed on the fine powders. The surface chemistry of the MoS2-based materials was analyzed in powder form by X-ray photoelectron spectroscopy (XPS). The powder XPS was conducted in a SPECS UHV system (FOCUS 500 equipped with monochromatic X-ray source,