Vertically stacked twisted layers of two-dimensional (2D) materials provide a fruitful ground for the exploration of unique and novel quantum phenomena in van der Waals (vdW) material systems. Stacking of 2D vdW materials with a small twist angle θ (θ<~10°) and/or a slight lattice mismatch results in the reconstructed moiré superlattices (MSLs), accompanied by the enhanced interlayer coupling. These reconstructed MSLs especially with magic twist angles around θ≈1.1º can host flat electronic bands to form highly correlated phases, even showing superconductivity. For large twist angles (θ>~15°), on the other hand, it is believed that atomic reconstruction hardly occurs, meaning that a rigid lattice model is a reasonable representation of the actual system. The resulting MSLs are, in general, incommensurate except for a few twist angles at, e.g., 13.2° and 21.8º for twisted hexagonal bilayers. Although the interlayer coupling is supposed to be suppressed in these incommensurate MSLs, it has recently been revealed that this is not necessarily the case for 30°-twisted vdW bilayers, forming quasicrystalline patterns with a 12fold rotational symmetry. In these quasicrystalline layers, two twisted layers are coupled via Umklapp electronelectron scattering, which results in rich electronic structures, such as mirrored Dirac cones in graphene quasicrystals and mini-gaps near the valence band maximum in tungsten diselenide quasicrystals. Thus, incommensurate MSLs and related moiré potentials have attracted increasing attention, offering an interesting experimental platform to explore moiré physics beyond the small twist-angle regime. However, atomic-scale visualization of moiré potential is quite challenging. At present, scanning tunneling microscopy/spectroscopy (STM/STS) is one possible technique available for that purpose. Here we use an aberration-corrected high-resolution transmission electron microscopy (HRTEM) technique as a tool to explore the moiré potential in the commensurate and in-commensurate MSLs. Although HRTEM has been often employed to obtain atomic resolution imaging of 2D materials and related MSLs, we show that this technique is also applicable for imaging the moiré potentials, which are constructed from the diffraction spots due to moiré patterns. The present results demonstrate that electron microscopy has an ability in imaging and analyzing the moiré potential in MSLs, and they inspire us to apply it to exploring the interlayer potential of various MSLs with high resolution.