For morphological analysis of PM6, Y7, and their blend thin films by spin-coating onto silicon substrates, grazing incidence wide-angle x-ray scattering (GIWAXS) was utilized. Figure ) displays the two-dimensional scattering patterns of pristine Y7, PM6, and the PM6:Y7 blend. These patterns represent scattering throughout the thick- ness of the thin films, with their out-of-plane integration, as illustrated in Figure (2f), respectively. Notably, the pristine PM6 and Y7 films demonstrate distinct ππ stacking peaks in the out-of-plane (OOP) direction at 1.71 Å -1 and 1.77 Å -1 , with d -spacings of 3.67 Å and 3.53 Å. This indicated a predominant face-on orientation in both materials. Analysis showed that Y7 has a greater coherence length(CL) of 31.42 Å, in comparison to 25.34 Å for PM6, suggesting a relatively higher crystallinity in Y7. The PM6:Y7 blend also showed a face-on orientation, with a noticeable π -π stacking peak at 1.72 Å -1 and a coherence length (CL) of 27.32 Å. Having a well-defined morphology, especially with a high CL in the PM6:Y7 blend is crucial. It helps in organizing molecules in an orderly manner and separating the phases efficiently. These qualities boost dipole moments and enhance polarization, emphasizing the significance of optimizing morphological properties for better device performance 21 .