Most MicroED experiments using DEDs in counting mode have required severe restriction of incident electron beam flux on the crystal. This lowering of beam flux is often compensated for by extending integration and overall data collection times . The need for drastic flux reduction depends on the type of DED used, and its internal count rate. For example, new hybrid pixel detector (HPD) technologies have overcome these limitations to enable fast serial electron diffraction (SerialED) data collection . However, the advantage afforded by the speed and sensitivity of HPDs is at odds with their larger pixel size and limited sensor pixel density compared to monolithic active pixel sensors . In detectors such as the Apollo (Direct Electron), on-chip event-based thresholding and registration addresses the need for high-speed counting while reducing the burden of handling and processing large amounts of raw data . This implementation permits kilohertz-rate event-based electron counting (EBEC). The use of field programable gate arrays (FPGA) for downstream centroid detection further enables on-the-fly super-resolved event localization .