Compound refractive lenses (CRLs) can be used to magnify the angular spread of the scattered beam. An example of imaging in XRR geometry with an X-ray beam focused on the sample with 1D CRLs demonstrated the possibility of distinguishing if the surface under the beam was covered or not with a gold film. However, due to the small refractive index of X-rays and the large number of CRLs needed, a long distance to the detector and a precise alignment of CRLs are required. Illumination of a flat sample by the narrow beam extended one centimeter in the direction perpendicular to the incidence plane ("pencil beam") and combined with the sample rotation around the normal to the sample surface provided surface tomography with a lateral resolution 1.6 mm on a planar gold pattern sputtered on the silicon wafer. Surface imaging can be achieved by scanning the sample under the microbeam at a fixed incident angle. The resolution of these methods is limited by the size of the beam. Fine scanning is time-consuming, and measurement at a single incident angle does not bring information about the structure in the direction normal to the surface. Here, we propose development of the XRR technique that takes advantage of the sample curvature to visualize the graphene flakes during their growth, and ultimately to analyze the interfacial copper-graphene structure as a function of the domain size. Recently, we demonstrated that the curvature of the surface can be exploited in a positive manner allowing to perform XRR structural investigation during the growth. The method of XRR curve reconstruction upon measurements on spherically or cylindrically curved surfaces with a curvature radius in the range from millimeters to meters was developed. A curved sample surface naturally spreads the specularly reflected beam. Moreover, a smaller curvature radius results in a larger spread and, hence, larger image magnification. This can be used for surface imaging and, in the case of partial coverage of the surface with patches, for simultaneous measurement of XRR curves of the bare substrate and the substrate covered with a patch as the intensity of a reflected elementary ray depends on the surface density profile below it.