While imaging and diffraction-based TEM methods are powerful tools for MOF structure determination, a key limitation is the requirement for very thin samples. For example, the previous MicroED study on ZIF-8 made use of a crystal that was approximately 200 nm in diameter to produce the high-resolution structure, where ZIF-8 crystals that were larger (400 -800 nm) produced lower quality data . This constraint on crystal thickness can be particularly problematic for the cases where crystals are too thick for electron diffraction data collection, yet still too small for X-ray crystallography.