The optical, transmittance, absorbance, and bandgap properties of the films were obtained using a Shimadzu UV-2450 UV-VIS spectrophotometer in a wavelength range of 250-800 nm. The UV-VIS spectrophotometer was operated in the reflectance mode in analyzing films deposited on glass substrates. Determination of band gap was determined using the Tauc plot formalism from data obtained by UV-Vis spectrophotometry based on the Tauc relation: (αhν) 1/y = β (hν -Eg) where α is the absorption coefficient (absorbance/film thickness), β is the band tailing parameter, h is the Planck's constant, ν is the frequency of incident light, Eg is the energy of the optical band gap and y is the power factor, which depends upon the nature of the transition (semi-conducting materials, y =0.5 for direct allowed transitions). Therefore: (αhν) 2 = β(hν -Eg).