SEM micrographs were processed to extract dot positions and areas of single layer phase using Gwyddion image analysis software. The background of the micrographs was removed using median scan line alignment followed by polynomial background removal and revolve arc for the single layer and dot micrographs respectively. A Gaussian filter was then used to reduce high frequency noise. The layer and dots were then marked by a brightness threshold found using Otzu's method. The ratio of single layer area was then averaged over 8 SEM micrographs for each set of conditions studied to get the final area percent of the single layer phase. The dot positions were used to compute the various metrics of the BCP dot arrays. The raw SEM micrographs for all SVA conditions, used to determine dot positions are shown in Figure .