Synchrotron powder X-ray diffraction pattern was obtained on the diffractometer beamline (BL2-1) at the Stanford Synchrotron Radiation Lightsource (SSRL), SLAC National Accelerator Laboratory (λ = 0.729494 Å) at 300K, as previously described. The sample was held in evacuated and flame-sealed extruded fused silica capillaries with an outer diameter (OD) of 0.8 mm and inner diameter (ID) of 0.7 mm. The diffractometer beamline (BL2-1) detector employed was Pilatus 100K, calibrated and positioned 708.9 mm from the sample. Lanthanum Hexaboride (LaB 6 ) was used as calibration standards. Subsequently, the acquired X-ray diffraction data underwent analysis utilizing the Rietveld method implemented in TOPAS v6.