The morphologies of metallic Sb films and Sb2Se3 films were characterized using SEM (Zeiss Gemini 450). XRD (Rigaku SmartLab) with Cu Kα radiation (λ = 0.15406 nm) was employed to characterize the crystal structures of Sb metal and Sb2Se3 films. UV-Vis spectra were recorded on a Shimadzu UV-3600 spectrometer in an integrating sphere. The absorbance and reflectance spectra of the Sb2Se3 devices were determined, and the bandgaps of the photocathodes were calculated through the Kubelka-Munk function. XPS analysis was conducted using a physical electronics Quantum 2000 X-ray photoelectron spectrometer equipped with monochromatic Al Kα radiation, operating at 15 kV and 32.3 W. To ensure accurate measurements, the instrument's energy scale was calibrated using an Au reference sample. The analysis was performed under a vacuum level of 1×10 -6 Pa, with an electron takeoff angle of 45 degrees and a pass energy of 23.5 eV. Shirley background subtraction was employed with instrument-specific sensitivity factors. Core-level spectra were meticulously deconvoluted to discern contributions from multiple elements, utilizing a GL 30 asymmetric line shape. Notably, a ΔE of 9.34 eV for the Sb 3d doublet was applied for accurate deconvolution of the spectra. where J is the photocurrent density, P is the light intensity at each wavelength, λ is the wavelength of the monochromatic light.