The software Match! (Crystal Impact) and the Crystallography Open Database (COD), as well as the Inorganic ICSD Crystal Structure Database (ICSD) were used for phase analysis. Rietveld analysis was performed using the software TOPAS 6 from Bruker, Germany, using a modified fundamental parameters approach with the instrumental broadening learned from a scan of a reference sample . Sample-related broadening was modeled by using Voigt functions with cos -1 (𝜃) and respectively tan(𝜃) angular dependence of broadening, to adjust for crystallite size and respectively microstrain effects on the reflection profile. The structural data of known phases was taken from the databases.