A unique feature of disordered materials is the ability to sustain a continuous distribution of particle-level plasmonic resonance frequencies. Though the nanoparticle ensemble may display just a single plasmonic resonance frequency, this is not necessarily the frequency at which each individual nanoparticle dissipates the most energy or has the maximum local near-field enhancement -i.e., a particle's individual "resonance frequency." Because every nanoparticle finds itself in a unique, disordered local environment, there is a continuous distribution of individual particle resonance frequencies ω res . Experimentally, this distribution can be quantified for a monolayer of nanocrystals using scanning transmission electron microscopy coupled with electron energy loss spectroscopy (STEM-EELS) and infrared scattering-type scanning near-field optical microscopy (IR s-SNOM) to create a spatial map of the near-field enhancement over a range of frequencies. However, such measurements are low-throughput, image only a small portion of the material, are restricted by sample compatibility, and cannot be used for three-dimensional bulk structures. On the other hand, local information is readily obtained in simulations, and MPM has been recently used to compute these particle resonant frequency distributions. Figure ,b shows simulation snapshots of a nanoparticle gel and a superlattice with defects. Each particle is colored by its individual resonant frequency (relative to the resonant frequency of the particle ensemble). 17,27