The primary limitation of LSCF6428 occurs when it is used with the commonly used electrolyte because it reacts with YSZ and negatively impacts cell performance with time. This reduces the flexibility of this promising cathode material, and thus it has primarily been used with the CGO electrolyte, with which it, fortunately, does not react . However, because of the common use of the YSZ electrolyte, several attempts have been made to make LSCF6428 workable with YSZ. A common approach to tackle deleterious reactivity has been to incorporate the ceria barrier layer between the electrolyte and cathode . This has also helped in improving the relatively higher ASR that pure LSCF affords, 0.3 Ωcm 2 at 700 °C53 , which is well above the target value of 0.15 Ωcm 2 . Dusastre et al. reduced the ASR of pure LSCF by making composites of LSCF with CGO, reporting an ASR of 0.16 Ωcm 2 at 700 °C, almost halving the polarisation resistance . Wang and Mogensen reduced it further to the remarkable value of 0.026 Ωcm 2 at 700 °C with CGO and 0.12 Ωcm 2 at 700 °C with YSZ electrolyte coated with a thin layer of CGO . But because of the complexity associated with the use of composites as cathodes, there is the possibility of a reaction between CGO and YSZ to form the less ionic conducting phase, (Ce, Zr, Gd, Y)O2- and it has been reported that such phases are formed and are responsible for reducing the cell performance. Above all, the main problem with the promising LSCF cathode materials is their degradation with time during cell operation. This problem chiefly manifests itself in strontium segregation and chromium poisoning. Both of these problems drastically reduce cell performance. When in operation, Sr selectively segregates towards the cell surface to form a SrO layer at the cathode surface, which effectively stops the ORR from occurring at the air/cathode interface . The chromium poisoning problem emanates from the necessity of using interconnects to connect the individual cells in series to generate the required amounts of power for practical purposes. The commonly used material for interconnects contains chromium, and it vaporises during cell operation. The harmful impact of chromium vapours comes from its deposition on cathode materials, thereby degrading their performance with time .