In addition to this overarching trend, a few additional features become apparent upon closer examination of ∆h X-Te . First, elements from groups 13 and 14 in periods 2 to 4 relax notable lover than those from groups 15-17. This implies a stronger in-plane character of the X-Mo bonding in the latter case, aligning with the flat orientation of bonds, which is often assumed by elements from this group in structures with trigonal symmetry, such as graphene, silicene, germanene, and hexagonal boron nitride (h-BN). Conversely, atoms from groups 15 to 17 in periods 2 to 4 are situated significantly higher within the layer, indicating a preference for a more out-of-plane character in the X-Mo bonding interaction. Interestingly, this trend deviates in periods 5 and 6. While group 13 atoms consistently maintain lower values than the rest, atoms from group 14 relax notably higher than the others. Moreover, the noticeable decrease in the in-plane nature of X-Mo interactions for higher-period elements in groups 13 and 14 (shown in Figure ) corresponds with the reduction in their binding energy (as illustrated in Figure ). This decline in the strength of X-Mo interaction is in contrast to the elements in groups 15-17, which, unlike the former, exhibit a greater inclination towards adopting a more out-of-plane form of bonding. The effects observed within the same periods strongly indicate the substantial influence of the dopant's electronic configuration on the X-Mo interaction; however, the covalent radii of the dopants also play a role in influencing this interaction. Therefore, the interplay of these factors needs a careful analysis in order to understand the doping process.