measurements is much smaller than the number of device measurements, but here we show that structural information is available and representative. We expect that future data-driven studies that use OFET-db as a resource will benefit from representative storage of process history, as materials characteristics alone often provide insufficient information for fully understanding the experimental sensitivity of device performance. To that end, with our proposed process ontology we aim to enable the curation of experimental data with the associated process history of samples, with the future intention of providing advanced analyses based on process recipes. A preliminary demonstration of the ability necessary for a broader adoption of representative materials databases, which the work herein addresses for conjugated polymer processing in OFETs.