Solution X-ray Diffraction: Indium phosphide quantum dot solutions were dried of anhydrous tetrahydrofuran in an argon glovebox and resuspended to a concentration of approximately 0.5 mM in anhydrous toluene. These solutions were loaded into 1 mm inner diameter/1.1 mm outer diameter polyimide tubes that were sealed with tapered plastic plugs and mounted on top of the silicon wafer using Scotch tape to adhere the ends of the tube to the wafer holder. Measurements were performed on a Bruker D2 Phaser instrument and samples were irradiated with copper K-𝛼 X-rays with a wavelength of 1.5418 Å. The air-scatter screen above the wafer was set to 1 mm, which allowed it to sit directly on top of the parallel polyimide capillary. Spectra were collected at angles between 5° and 70° 2𝜃, and points were taken every 0.03° 2𝜃 and measurements were averaged for 36.0 s at each point. Spectra were baselined using a rubber-band baseline construction.