This 1D "imaging" technique through XRR could be extended to a 2D visualization of the sample by using a much wider beam in the direction parallel to the sample. Then the information in the direction perpendicular to the incident beam direction would be recorded along the corresponding direction of the detector, which is presently not exploited. The technique opens the perspective for the development of XRR-based hyperspectral imaging (or microscopy) that would allow recording an XRR spectrum for every point on a microscopic 2D surface following the generation of a magnified 2D image, where each pixel correlates to a physical/chemical parameter at that point on the surface (e.g., materials type, number of layers, separation gap).