Phase contrast tomography exploits the phase shift produced when a highly coherent X-ray beam interacts with the sample. The use of a nano-sized beam and imaging at multiple sample-detector distances yields very high resolution images of sub-micro/micro-sized objects with excellent contrast. Following phase retrieval, the image intensities correspond approximately to the three-dimensional distribution of the object's electron density. Nano-CT has several advantages over conventional FIB-SEM imaging. Despite lower ultimate spatial resolution, nano-CT can sample many hundreds or thousands of particles at once, which is essential for statistical representativeness. Additionally, it does not suffer from the need to prepare milled samples and therefore is nondestructive However, beamtime at large scale facilities is typically required. The advent of 4 th generation synchrotrons 36 has simultaneously improved the spatial resolution and acquisition time for nano-tomography, closing these competitive gaps.