Coincidence loss presents a major challenge for electron counting since it reduces the linearity of the sensor response and decreases the effective dynamic range achievable by that sensor. In diffraction measurements, the undercounting of coincident electrons decreases signal at bright reflections, leading to inaccurate integration of intensities. While single-particle imaging experiments can rely on a relatively constant illumination profile on the detector for estimates of coincidence, one cannot readily determine the anticipated degree of non-zero coincidence at a given Bragg reflection by simply knowing the incident flux on the crystal being diffracted. This makes it imperative to anticipate the degree of CL expected at any given pixel under any possible electron flux at that pixel.