Raman profiles also give us the defects distribution of the samples, revealing the defined hydrolysis imposed by the water-enhanced oxidation (see Section S2.2). However, SEM/EDX elemental mapping of C and O throughout the system clearly shows that these edge defects are associated to a defined oxidative hydrolysis process (Figure ). The maps obtained from Geh show a very defined C elemental distribution coinciding with the Geh aggregates. Moreover, the O elemental maps show very defined O concentration at the edges and rarefaction at the center of the flakes as a result of the mild and selective oxidation of this process. These results corroborate with the basal plane (Figure ) and edge (Figure ) localized elemental distribution obtained by HRTEM/EDX, and with the Raman maps for this system (Figure ).