Upgraded item 2: The HV boards and electronics were redesigned to allow the primary ion source and sample to be changed to enable low-impact energy analyses. The range of operation is from the standard 16 keV impact energy to 2 keV. Upgraded item 3: The analysis chamber sample stage has been upgraded to include a position encoder from Horiba Scientific. This sample stage enables sample navigation over a 50 x 50 mm 2 sample holder, as well as between SIMS analysis, optical imaging and primary ion beam measurement positions, requiring up to 100 mm in movement. To increase point reproducibility, the stage is equipped with an encoded plate used as a coordinate reference. An optical microscope equipped with a camera monitors the encoded plate to determine the absolute coordinates of the sample holder.