Powder X-ray Diffraction: Concentrated indium phosphide quantum dot solutions were drop-cast onto a silicon wafer from anhydrous tetrahydrofuran. Measurements were performed on a Bruker D2 Phaser instrument and samples were irradiated with copper K-𝛼 X-rays with a wavelength of 1.5418 Å. Spectra were collected at angles between 10° and 70° 2𝜃 under 𝜑 angular rotation of 70°/s, and points were taken every 0.03° 2𝜃 and measurements were averaged for 2.0 s at each point. Spectra were baselined using a rubber-band baseline construction.