In addition, we used TEM to confirm that the layered Sc2C phase is dominant. While from XRD there is a small amount of cubic Sc2C (14.5%) compared to layered Sc2C (85.5%), the refinement has some error because the layered and cubic patterns are similar. In electron diffraction, the most common spatial frequency corresponds to a d-spacing of 2.3 Å, which we assign to either {104} in the layered structure or {101} in the cubic structure. This ambiguity motivated us to find distinct peaks for the layered phase. To identify the phase of these domains, we sought to acquire diffraction patterns containing the {117} reflection of the layered phase, which is expected at 5.501 nm -1 , for which there are no reflections in the cubic phase. In Figure , we observe diffraction spots at 5.479 nm -1 , which can only be assigned to the layered phase. Simulations of the cubic structure with varied arrangements of carbon also failed to show a diffraction peak at 5.501 nm -1 . Importantly, the prevalence of {117} in diffraction patterns increases upon annealing, in agreement with XRD. In addition, XRD and TEM lattice spacings agree within 0.6%. This data confirms the experimental structure from XRD and corroborates the Rietveld refinement result.