 TOKYO, Dec. 03, 2022 GLOBE NEWSWIRE Leading semiconductor test equipment supplier Advantest Corporation TSE: 6857 today unveiled the E5620 Defect Review Scanning Electron Microscope DR-SEM, its newest mask SEM product for reviewing and classifying ultra-small defects on photomasks and mask blanks. With its high-accuracy, high-throughput defect review capability, the E5620 DR-SEM is expected to ... The post Correction: Advantest Unveils E5620 DR-SEM for Review and Classification of Ultra-... 